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- complementary metal oxide semiconductors 50 Treffer
- logic gates 44 Treffer
- silicon 29 Treffer
- cmos integrated circuits 23 Treffer
- metal oxide semiconductor field-effect transistors 20 Treffer
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45 weitere Werte:
- mosfet 19 Treffer
- transistors 16 Treffer
- field-effect transistors 13 Treffer
- substrates 13 Treffer
- logic circuits 12 Treffer
- doping 11 Treffer
- finfets 11 Treffer
- performance evaluation 11 Treffer
- semiconductor device modeling 11 Treffer
- threshold voltage 11 Treffer
- capacitance 10 Treffer
- finfet 10 Treffer
- cmos technology 9 Treffer
- computer-aided design 8 Treffer
- electric potential 8 Treffer
- inductors 8 Treffer
- integrated circuit modeling 8 Treffer
- metals 8 Treffer
- resistance 8 Treffer
- conductivity 7 Treffer
- junctions 7 Treffer
- mathematical model 7 Treffer
- semiconductor process modeling 7 Treffer
- tunneling 7 Treffer
- computer simulation 6 Treffer
- electrostatic discharges 6 Treffer
- simulation 6 Treffer
- variability 6 Treffer
- capacitors 5 Treffer
- electrostatic discharge (esd) 5 Treffer
- integrated circuits 5 Treffer
- inverters 5 Treffer
- nanowires 5 Treffer
- radio frequency 5 Treffer
- solid modeling 5 Treffer
- stress 5 Treffer
- analytical models 4 Treffer
- annealing 4 Treffer
- avalanche diodes 4 Treffer
- bias temperature instability (bti) 4 Treffer
- cmos process 4 Treffer
- couplings 4 Treffer
- current density 4 Treffer
- electric capacity 4 Treffer
- electrodes 4 Treffer
95 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020), Heft 1, S. 224-229Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 63 (2016), Heft 1, S. 65-71Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-06-01), Heft 6, S. 2806-2814Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-06-01), Heft 6, S. 2873-2878Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-08-01), Heft 8, S. 3870-3875Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-05-01), Heft 5, S. 2167-2172Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 63 (2016-04-01), Heft 4, S. 1742-1748Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 62 (2015-12-01), Heft 12, S. 3957-3964Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020-09-01), Heft 9, S. 3504-3509Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 62 (2015-03-01), Heft 3, S. 934-939Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 66 (2019-11-01), Heft 11, S. 4546-4555Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 66 (2019-11-01), Heft 11, S. 4660-4665Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020-06-01), Heft 6, S. 2393-2399Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-03-01), Heft 3, S. 1045-1049Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 66 (2019-06-01), Heft 6, S. 2483-2488Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 65 (2018-11-01), Heft 11, S. 5151-5156Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-06-01), Heft 6, S. 2951-2956Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 65 (2018-06-01), Heft 6, S. 2422-2429Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), Heft 10, S. 3991-3997Online academicJournalZugriff: