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Weniger Treffer
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- caes-tdt: testable design and test 5 Treffer
- no fault found 3 Treffer
- ec grant agreement nr.: fp7/619871 2 Treffer
- intermittent fault 2 Treffer
- intermittent resistive faults 2 Treffer
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29 weitere Werte:
- post processing 2 Treffer
- above ic 1 Treffer
- cmos 1 Treffer
- cmos logic circuits 1 Treffer
- dependability 1 Treffer
- ec grant agreement nr.: fp7/215881 1 Treffer
- integrated optics 1 Treffer
- mems 1 Treffer
- micro-fabrication 1 Treffer
- microwave photonics 1 Treffer
- nano electronics 1 Treffer
- no faults found 1 Treffer
- optical beamforming 1 Treffer
- optical delay lines 1 Treffer
- pecvd 1 Treffer
- phased arrays 1 Treffer
- photodetectors 1 Treffer
- process integration 1 Treffer
- q-factor 1 Treffer
- quality factor 1 Treffer
- radiofrequency integrated circuits 1 Treffer
- reliability 1 Treffer
- resonators 1 Treffer
- sc-icf: integrated circuit fabrication 1 Treffer
- sion 1 Treffer
- thermal budget 1 Treffer
- tsv 1 Treffer
- tunable delay 1 Treffer
- waveguides 1 Treffer
Publikation
38 Treffer
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In: 2014 International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW'14), 2014-09-19, S. 1-6Online KonferenzZugriff:
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In: IEEE International Electron Devices Meeting 2004, 2005-04-25, S. 441-444Online KonferenzZugriff:
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In: IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2015, 2015-04-24, S. 211-216Online KonferenzZugriff:
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In: Proceedings of the 37th European Solid-State Circuits Conference, ESSCIRC 2011, 2011-09-12, S. 511-514Online KonferenzZugriff:
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In: Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects,, 2005-05-01, S. 167-170Online KonferenzZugriff:
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In: Proceedings of the 1996 IEEE International Symposium on Circuits and Systems, 1996-05-12, S. 223-226Online KonferenzZugriff:
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In: Proceeding of the 24th European Solid-State Circuits Conference, 1998-09-30, S. 272-275Online KonferenzZugriff:
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In: Proceedings International Symposium on Circuits and Systems (ISCAS '93), 1993-05-03, S. 962-965Online KonferenzZugriff:
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In: ISCAS-Conference, 1991-06-11, S. 2244-2247Online KonferenzZugriff:
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In: Proceedings of the IEEE International Symposium on Circuits and Systems, 1996-05-12, S. 179-182Online KonferenzZugriff:
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In: IEEE 2016 Euromicro Conference on Digital System Design (DSD), 2016-10-27, S. 703-707KonferenzZugriff:
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In: Solid-State Circuits Conference Digest of Technical Papers (ISSCC) 2010 IEEE International, 2010-02-07, S. 312-313Online KonferenzZugriff:
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In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2016-10-27, S. 87-90KonferenzZugriff:
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In: 2006 IEEE International Solid-State Circuits Conference ISSCC, 2006-02-07, S. 346-347Online KonferenzZugriff:
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In: Transducers '97, vol 1, 1997-06-17, S. 445-446Online KonferenzZugriff:
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In: ISCAS'90, 1990-05-01Online KonferenzZugriff:
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In: 2013 IEEE International Topical Meeting on Microwave Photonics (MWP), 2013-10-29, S. 41-44KonferenzZugriff:
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In: Proceedings of 2012 IEEE International Frequency Control Symposium (IFCS), 2012-07-25, S. 1-4KonferenzZugriff:
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In: IEEE Custom Integrated Circuit Conference 2000, 2000-05-24, S. 417-420KonferenzZugriff:
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In: Low-voltage/Low-power integrated circuits and systems; (1998) S. 242-271BuchZugriff: