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- atomic force microscopy 6 Treffer
- phase transitions 5 Treffer
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45 weitere Werte:
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- ferromagnetic materials 2 Treffer
- heterojunctions 2 Treffer
- indium compounds 2 Treffer
- indium phosphide 2 Treffer
- lattice parameters 2 Treffer
- microstructure 2 Treffer
- nanocrystals 2 Treffer
- perovskite 2 Treffer
- raman effect 2 Treffer
- sintering 2 Treffer
- spectrum analysis 2 Treffer
- testing 2 Treffer
- thin films 2 Treffer
- x-ray scattering 2 Treffer
- x-rays 2 Treffer
- antiferroelectric liquid crystals 1 Treffer
- antiferroelectric materials 1 Treffer
- antiferromagnetic materials 1 Treffer
- atmosphere 1 Treffer
- atmospheric pressure 1 Treffer
- atoms 1 Treffer
- biosensors 1 Treffer
- bismuth iron oxides -- dielectric properties 1 Treffer
- buckminsterfullerene 1 Treffer
- chemistry, analytic 1 Treffer
- complex ions 1 Treffer
- crystal structure 1 Treffer
- crystallization 1 Treffer
- crystallography 1 Treffer
- dielectric function 1 Treffer
- dielectric measurements 1 Treffer
- dielectric properties of perovskite 1 Treffer
- dielectrics 1 Treffer
- dislocations in crystals 1 Treffer
- effect of temperature on polymers 1 Treffer
- effect of temperature on silicon-on-insulator technology 1 Treffer
- electric fields 1 Treffer
Publikation
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37 Treffer
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In: Journal of Applied Physics, Jg. 109 (2011), Heft 1, S. 13514-1- (6S.)Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 66 (1989-07-15), S. 520-530Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 62 (1987-10-15), S. 3156-3160Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 117 (2015-06-07), Heft 21, S. 213915-1- (6S.)Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 116 (2014-07-07), Heft 1, S. 184701-1- (6S.)Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 115 (2014-05-14), Heft 18, S. 184701-1- (6S.)Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 115 (2014-02-28), Heft 8, S. 1-5Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 114 (2013-12-21), Heft 23, S. 234101-234107Online academicJournalZugriff:
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In: Applied Physics Letters, Jg. 98 (2011-02-28), Heft 9, S. 92508-1- (3S.)Online academicJournalZugriff:
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In: Applied Physics Letters, Jg. 73 (1998-08-17), Heft 7, S. 924-926Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 104 (2008-12-15), Heft 12, S. 124104-124104Online academicJournalZugriff:
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In: Applied Physics Letters, Jg. 111 (2017-10-16), Heft 16, S. 161602-1- (5S.)Online academicJournalZugriff:
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In: Review of Scientific Instruments, Jg. 89 (2018-10-01), Heft 10, S. N.PAG- (3S.)Online academicJournalZugriff:
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In: Applied Physics Letters, Jg. 108 (2016-06-20), Heft 25, S. 253104-1- (5S.)Online academicJournalZugriff:
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In: Applied Physics Letters, Jg. 106 (2015-03-23), Heft 12, S. 1-4Online academicJournalZugriff:
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In: Applied Physics Letters, Jg. 106 (2015-03-02), Heft 9, S. 1-4Online academicJournalZugriff:
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In: Applied Physics Letters, Jg. 103 (2013-11-04), Heft 19, S. 192910-192914Online academicJournalZugriff:
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In: Applied Physics Letters, Jg. 103 (2013-07-29), Heft 5, S. 51902-51906Online academicJournalZugriff:
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In: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films, Jg. 26 (2008-07-01), Heft 4, S. 587-591academicJournalZugriff:
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In: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures, Jg. 25 (2007-05-01), Heft 3, S. 999-1003academicJournalZugriff: