Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Schlagwort
- gate oxide 8 Treffer
- chemistry.chemical_compound 7 Treffer
- cmos 7 Treffer
- oxide 7 Treffer
- chemistry.chemical_element 5 Treffer
-
45 weitere Werte:
- electrical engineering 5 Treffer
- law 5 Treffer
- law.invention 5 Treffer
- leakage (electronics) 5 Treffer
- mosfet 5 Treffer
- transistor 5 Treffer
- plasma 4 Treffer
- silicon 3 Treffer
- analytical chemistry 2 Treffer
- electronic engineering 2 Treffer
- hardware_general 2 Treffer
- hardware_integratedcircuits 2 Treffer
- hardware_logicdesign 2 Treffer
- hardware_performanceandreliability 2 Treffer
- time-dependent gate oxide breakdown 2 Treffer
- and gate 1 Treffer
- boron 1 Treffer
- breakdown voltage 1 Treffer
- capacitance 1 Treffer
- cmos technology 1 Treffer
- computer science::emerging technologies 1 Treffer
- computer science::hardware architecture 1 Treffer
- condensed matter::mesoscopic systems and quantum hall effect 1 Treffer
- copper 1 Treffer
- dielectric 1 Treffer
- dielectric thin films 1 Treffer
- diffusion (business) 1 Treffer
- electron 1 Treffer
- electronic circuit 1 Treffer
- equivalent oxide thickness 1 Treffer
- fluorine 1 Treffer
- hot electron 1 Treffer
- ion implantation 1 Treffer
- ionizing radiation 1 Treffer
- metal gate 1 Treffer
- multiplexing 1 Treffer
- negative-bias temperature instability 1 Treffer
- nitriding 1 Treffer
- nitrogen 1 Treffer
- nmos logic 1 Treffer
- plasma applications 1 Treffer
- plasma parameters 1 Treffer
- plasma processing 1 Treffer
- pmos logic 1 Treffer
- radiation 1 Treffer
Publikation
- 1998 3rd international symposium on plasma process-induced damage (cat. no.98ex100) 3 Treffer
- 2000 5th international symposium on plasma process-induced damage (ieee cat. no.00th8479) 3 Treffer
- 2001 6th international symposium on plasma- and process-induced damage (ieee cat. no.01th8538) 2 Treffer
- 7th international symposium on plasma- and process-induced damage 1 Treffer
Sprache
10 Treffer
-
In: 7th International Symposium on Plasma- and Process-Induced Damage, 2003-06-25Online unknownZugriff:
-
In: 2001 6th International Symposium on Plasma- and Process-Induced Damage (IEEE Cat. No.01TH8538), 2002-11-13Online unknownZugriff:
-
In: 1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395), 2003-01-20Online unknownZugriff:
-
In: 1998 3rd International Symposium on Plasma Process-Induced Damage (Cat. No.98EX100), 2002-11-27Online unknownZugriff:
-
In: 2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479), 2002-11-07Online unknownZugriff:
-
In: 2001 6th International Symposium on Plasma- and Process-Induced Damage (IEEE Cat. No.01TH8538), 2002-11-13Online unknownZugriff:
-
In: 1998 3rd International Symposium on Plasma Process-Induced Damage (Cat. No.98EX100), 2002-11-27Online unknownZugriff:
-
In: 2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479), 2002-11-07Online unknownZugriff:
-
In: 1998 3rd International Symposium on Plasma Process-Induced Damage (Cat. No.98EX100), 2002-11-27Online unknownZugriff:
-
In: 2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479), 2002-11-07Online unknownZugriff: