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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- doping 3 Treffer
- materials science 3 Treffer
- microstructure 2 Treffer
- [phys.hist]physics [physics]/physics archives 1 Treffer
- acceptor 1 Treffer
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45 weitere Werte:
- addition lanthanide 1 Treffer
- addition ytterbium 1 Treffer
- analytical chemistry 1 Treffer
- as ga 1 Treffer
- atomic physics 1 Treffer
- autres semiconducteurs 1 Treffer
- binary compounds 1 Treffer
- business 1 Treffer
- business.industry 1 Treffer
- chromium 1 Treffer
- compose binaire 1 Treffer
- condensed matter physics 1 Treffer
- condensed matter: structure, mechanical and thermal properties 1 Treffer
- couche epitaxique 1 Treffer
- couche mince 1 Treffer
- cross-disciplinary physics: materials science; rheology 1 Treffer
- crystal defect interaction 1 Treffer
- deep levels 1 Treffer
- defauts et impuretes dans les cristaux; microstructure 1 Treffer
- defects and impurities in crystals; microstructure 1 Treffer
- domaines interdisciplinaires: science des materiaux; rheologie 1 Treffer
- dopage 1 Treffer
- dopage et implantation d'impuretes dans les composes iii-v et ii-vi 1 Treffer
- doping and impurity implantation in iii-v and ii-vi semiconductors 1 Treffer
- electrical measurement 1 Treffer
- electrical measurements 1 Treffer
- electronic structure 1 Treffer
- electronic, optical and magnetic materials 1 Treffer
- epitaxial layers 1 Treffer
- epitaxie phase liquide 1 Treffer
- epitaxy 1 Treffer
- espectrometria luminescencia 1 Treffer
- etat condense: structure, proprietes mecaniques et thermiques 1 Treffer
- etude experimentale 1 Treffer
- exact sciences and technology 1 Treffer
- excitation 1 Treffer
- experimental study 1 Treffer
- gaas 1 Treffer
- gallium arsenide 1 Treffer
- gallium arsenides 1 Treffer
- gallium arseniure 1 Treffer
- gettering 1 Treffer
- iii v semiconductors 1 Treffer
- iii-v semiconductors 1 Treffer
- impurity 1 Treffer
Verlag
Publikation
- 10th international conference on defects: recognition, imaging and physics in semiconductors - drip-x, batz-sur-mer, france, 29th september-2nd october, 2003 1 Treffer
- epj. applied physics (print) 1 Treffer
- issn: 0302-0738 1 Treffer
- journal de physique 1 Treffer
- the european physical journal applied physics 1 Treffer
Sprache
4 Treffer
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In: 10th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors - DRIP-X, Batz-sur-Mer, France, 29th September-2nd October, 2003, Jg. 27 (2004), Heft 1-3, S. 177-179KonferenzZugriff:
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In: The European Physical Journal Applied Physics, Jg. 27 (2004-07-01), S. 177-179Online unknownZugriff:
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In: ISSN: 0302-0738, 1982Online academicJournalZugriff:
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In: Journal de Physique, Jg. 43 (1982), S. 815-825Online unknownZugriff: