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Weniger Treffer
Gefunden in
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Schlagwort
- circuits electroniques 19 Treffer
- electronic circuits 19 Treffer
- complementary mos technology 16 Treffer
- technologie mos complementaire 16 Treffer
- tecnologia mos complementario 16 Treffer
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45 weitere Werte:
- evaluacion prestacion 11 Treffer
- evaluation performance 11 Treffer
- performance evaluation 11 Treffer
- silicon on insulator technology 11 Treffer
- technologie silicium sur isolant 11 Treffer
- tecnologia silicio sobre aislante 11 Treffer
- transistors 11 Treffer
- circuits numeriques 10 Treffer
- digital circuits 10 Treffer
- circuit integre 7 Treffer
- circuito integrado 7 Treffer
- integrated circuit 7 Treffer
- capa empobrecimiento 5 Treffer
- capacitor 5 Treffer
- circuits integres par fonction (dont memoires et processeurs) 5 Treffer
- condensador 5 Treffer
- condensateur 5 Treffer
- couche appauvrissement 5 Treffer
- depletion layer 5 Treffer
- integrated circuits by function (including memories and processors) 5 Treffer
- alliage semiconducteur 4 Treffer
- capacitance 4 Treffer
- capacitancia 4 Treffer
- capacite electrique 4 Treffer
- circuit integre cmos 4 Treffer
- circuit logique 4 Treffer
- circuit logique cmos 4 Treffer
- circuito logico 4 Treffer
- circuits optiques et optoelectroniques 4 Treffer
- cmos integrated circuits 4 Treffer
- cmos logic circuits 4 Treffer
- fabricacion microelectrica 4 Treffer
- fabrication microelectronique 4 Treffer
- fabrication microelectronique (technologie des materiaux et des surfaces) 4 Treffer
- insulation technology 4 Treffer
- logic circuit 4 Treffer
- microelectronic fabrication 4 Treffer
- microelectronic fabrication (materials and surfaces technology) 4 Treffer
- mosfet 4 Treffer
- optical and optoelectronic circuits 4 Treffer
- oscilador anillo 4 Treffer
- oscillateur anneau 4 Treffer
- oscillateurs, resonateurs, synthetiseurs 4 Treffer
- oscillators, resonators, synthetizers 4 Treffer
- ring oscillator 4 Treffer
Publikation
- proceedings - electrochemical society 23 Treffer
- silicon-on-insulator technology and devices xi (paris, 28 april - 2 may 2003) 5 Treffer
- ulsi process integration iii (paris, 28 april - 2 may 2003) 4 Treffer
- dielectrics for nanosystems : materials science, processing, reliability, and manufacturing (honolulu hi, 3-8 october 2004) 3 Treffer
- advanced short-time thermal processing for si-based cmos devices (paris, 27 april - 2 may 2003) 2 Treffer
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8 weitere Werte:
- ulsi process integration iv (quebec pq, 16-20 may 2005) 2 Treffer
- advanced gate stack, source/drain and channel engineering for si-based cmos : naw materials, processes, and equipment (quebec pq, 16-18 may 2005) 1 Treffer
- advanced short-time thermal processing for si-based cmos devices ii (san antonio tx, 10-12 may 2004) 1 Treffer
- low temperature electronics and low temperaturee cofired ceramic based electronic devices (orlando fl, 12-16 october 2003) 1 Treffer
- microelectronics technology and devices sbmicro 2004 (porto de galinhas beach, 2004) 1 Treffer
- semiconductor wafer bonding viii : science, technology, and applications (quebec pq, 15-20 may 2005) 1 Treffer
- silicon nitride and silicon dioxide thin insulating films vii (paris, 28 april - 2 may 2003) 1 Treffer
- silicon-on-insulator technology and devices xii (quebec pq, 15-20 may 2005) 1 Treffer
Sprache
23 Treffer
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In: Advanced short-time thermal processing for Si-based CMOS devices (Paris, 27 April - 2 May 2003), 2003, S. 207-216KonferenzZugriff:
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In: Dielectrics for nanosystems : materials science, processing, reliability, and manufacturing (Honolulu HI, 3-8 October 2004), 2004, S. 292-311KonferenzZugriff:
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In: Low temperature electronics and low temperaturee cofired ceramic based electronic devices (Orlando FL, 12-16 October 2003), 2003, S. 44-49KonferenzZugriff:
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Novel dielectric structures for optical performance enhancement in deep sub-micron CMOS image sensorIn: Dielectrics for nanosystems : materials science, processing, reliability, and manufacturing (Honolulu HI, 3-8 October 2004), 2004, S. 135-150KonferenzZugriff:
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In: Silicon-on-insulator technology and devices XI (Paris, 28 April - 2 May 2003), 2003, S. 349-354KonferenzZugriff:
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In: ULSI process integration III (Paris, 28 April - 2 May 2003), 2003, S. 493-502KonferenzZugriff:
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In: Silicon-on-insulator technology and devices XI (Paris, 28 April - 2 May 2003), 2003, S. 149-158KonferenzZugriff:
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In: Microelectronics technology and devices SBMICRO 2004 (Porto de Galinhas Beach, 2004), 2004, S. 101-106KonferenzZugriff:
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In: Advanced short-time thermal processing for Si-based CMOS devices II (San Antonio TX, 10-12 May 2004), 2004, S. 383-395KonferenzZugriff:
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In: Dielectrics for nanosystems : materials science, processing, reliability, and manufacturing (Honolulu HI, 3-8 October 2004), 2004, S. 60-64KonferenzZugriff:
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In: ULSI process integration IV (Quebec PQ, 16-20 May 2005), 2005, S. 81-96KonferenzZugriff:
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In: Silicon-on-insulator technology and devices XI (Paris, 28 April - 2 May 2003), 2003, S. 209-214KonferenzZugriff:
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In: ULSI process integration IV (Quebec PQ, 16-20 May 2005), 2005, S. 193-205KonferenzZugriff:
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In: ULSI process integration III (Paris, 28 April - 2 May 2003), 2003, S. 183-193KonferenzZugriff:
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In: Semiconductor wafer bonding VIII : science, technology, and applications (Quebec PQ, 15-20 May 2005), 2005, S. 184-193KonferenzZugriff:
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In: Silicon-on-insulator technology and devices XI (Paris, 28 April - 2 May 2003), 2003, S. 243-248KonferenzZugriff:
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In: Silicon-on-insulator technology and devices XI (Paris, 28 April - 2 May 2003), 2003, S. 159-174KonferenzZugriff:
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In: ULSI process integration III (Paris, 28 April - 2 May 2003), 2003, S. 518-533KonferenzZugriff:
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In: Advanced gate stack, source/drain and channel engineering for Si-based CMOS : naw materials, processes, 2005, S. 171-178KonferenzZugriff:
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In: Silicon-on-insulator technology and devices XII (Quebec PQ, 15-20 May 2005), 2005, S. 75-80KonferenzZugriff: