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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- applied sciences 774 Treffer
- sciences appliquees 774 Treffer
- electronique des semiconducteurs. microelectronique. optoelectronique. dispositifs a l'etat solide 704 Treffer
- semiconductor electronics. microelectronics. optoelectronics. solid state devices 704 Treffer
- complementary mos technology 633 Treffer
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45 weitere Werte:
- technologie mos complementaire 633 Treffer
- tecnologia mos complementario 629 Treffer
- integrated circuits 604 Treffer
- circuits integres 602 Treffer
- conception. technologies. analyse fonctionnement. essais 572 Treffer
- design. technologies. operation analysis. testing 572 Treffer
- circuits electriques, optiques et optoelectroniques 303 Treffer
- electric, optical and optoelectronic circuits 303 Treffer
- circuit properties 284 Treffer
- proprietes des circuits 284 Treffer
- circuits electroniques 271 Treffer
- electronic circuits 271 Treffer
- transistors 249 Treffer
- integrated circuit 218 Treffer
- circuit integre 215 Treffer
- circuito integrado 208 Treffer
- evaluation performance 204 Treffer
- performance evaluation 204 Treffer
- evaluacion prestacion 202 Treffer
- physics 152 Treffer
- physique 152 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 128 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 128 Treffer
- reliability 125 Treffer
- fiabilite 124 Treffer
- fiabilidad 119 Treffer
- mosfet 107 Treffer
- silicon 107 Treffer
- electronique faible puissance 105 Treffer
- low-power electronics 105 Treffer
- transistor mosfet 104 Treffer
- silicium 103 Treffer
- circuit integre cmos 94 Treffer
- cmos integrated circuits 94 Treffer
- silicio 90 Treffer
- circuit design 88 Treffer
- circuits numeriques 87 Treffer
- conception circuit 87 Treffer
- digital circuits 87 Treffer
- cmos 83 Treffer
- circuits integres par fonction (dont memoires et processeurs) 82 Treffer
- diseno circuito 82 Treffer
- integrated circuits by function (including memories and processors) 82 Treffer
- condensed state physics 79 Treffer
- physique de l'etat condense 79 Treffer
Publikation
- microelectronics and reliability 245 Treffer
- microelectronics journal 170 Treffer
- solid-state electronics 85 Treffer
- integration (amsterdam) 67 Treffer
- microelectronic engineering 59 Treffer
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45 weitere Werte:
- biosensors & bioelectronics 32 Treffer
- organic electronics (print) 20 Treffer
- reliability of electron devices, failure physics and analysis 14 Treffer
- amf/rf[ams/rf] cmos circuit design for wireless transceivers 11 Treffer
- materials science & engineering. b, solid-state materials for advanced technology 11 Treffer
- journal of parallel and distributed computing (print) 10 Treffer
- insulating films on semiconductors 2013 9 Treffer
- neural networks 9 Treffer
- reliability physics of advanced electron devices 9 Treffer
- 17th european symposium on reliability of electron devices, failure physics and analysis (esref 2006), wuppertal, germany, 3-6 october 2006 8 Treffer
- cryogenics (guildford) 8 Treffer
- physica. e, low-dimentional systems and nanostructures 8 Treffer
- 14th workshop on dielectrics in microelectronics (wodim 2006) 7 Treffer
- 16th european symposium on reliability of electron devices, failure physics and analysis (esref 2005), arcachon, france, october 10-14, 2005 7 Treffer
- journal of non-crystalline solids 7 Treffer
- computing with future nanotechnology 6 Treffer
- journal of crystal growth 6 Treffer
- micro/nano devices and systems 2013: an open thematic journal issue 6 Treffer
- optics and lasers in engineering 6 Treffer
- selected extended papers from ulis 2012 conference 6 Treffer
- selected papers from the essderc 2011 conference 6 Treffer
- 2009 international electron devices and materials symposium (iedms) 5 Treffer
- materials chemistry and physics 5 Treffer
- materials science in semiconductor processing 5 Treffer
- optics communications 5 Treffer
- solid state electronics 5 Treffer
- 1997 symposium on electrical overstress/electrostatic discharge (eos/esd) 4 Treffer
- comptes rendus de l'academie des sciences. serie iv, physique, astrophysique 4 Treffer
- comptes rendus. physique 4 Treffer
- dielectrics in microelectronics (wodim 2004) 4 Treffer
- european materials research society (e-mrs) 2001, spring meeting, symposium d: second international conference on silicon epitaxy and heterostructures, strasbourg, france, june 4-8th 2001 4 Treffer
- fuzzy sets and systems 4 Treffer
- journal of magnetism and magnetic materials 4 Treffer
- micro and nano engineering 4 Treffer
- papers selected from the ultimate integration on silicon conference 2009, ulis 2009 4 Treffer
- thin solid films 4 Treffer
- advances in submicron mos devices and technology 3 Treffer
- computers and electronics in agriculture 3 Treffer
- infrared physics & technology 3 Treffer
- neurocomputing (amsterdam) 3 Treffer
- neuromorphic engineering: from neural systels to brain-like engineered systems 3 Treffer
- nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment 3 Treffer
- optics and laser technology 3 Treffer
- materials & design 1 Treffer
- nanoelectronics: physics, materials and devices 1 Treffer
Sprache
Geographischer Bezug
865 Treffer
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 54 (2014), Heft 1, S. 90-99academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 4, S. 510-531academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 1, S. 48-61academicJournalZugriff:
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-state electronics, Jg. 91 (2014), S. 81-86academicJournalZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!BuchZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 155-158academicJournalZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 89-94academicJournalZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 178-182academicJournalZugriff:
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In: Solid-state electronics, Jg. 98 (2014), S. 26-31academicJournalZugriff:
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In: Solid-state electronics, Jg. 91 (2014), S. 91-99academicJournalZugriff:
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In: Solid-state electronics, Jg. 95 (2014), S. 28-31academicJournalZugriff:
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In: Solid-state electronics, Jg. 62 (2011), Heft 1, S. 115-122academicJournalZugriff:
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In: 14TH Workshop on dielectrics in microelectronics (WoDiM 2006), Jg. 47 (2007), Heft 4-5, S. 739-742KonferenzZugriff:
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In: SiO2, advanced dielectrics and related devices, Mondelo, Palermo, Italy, June 25-28, 2006, Jg. 353 (2007), Heft 5-7, S. 639-644KonferenzZugriff:
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In: Microelectronics and reliability, Jg. 46 (2006), Heft 5-6, S. 702-712KonferenzZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 127-130academicJournalZugriff:
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In: Solid-state electronics, Jg. 91 (2014), S. 137-146academicJournalZugriff:
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In: Biosensors & bioelectronics, Jg. 52 (2014), S. 384-390academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 3, S. 349-355academicJournalZugriff: