Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary metal oxide semiconductors 71 Treffer
- transistors 30 Treffer
- electric capacity 19 Treffer
- successive approximation analog-to-digital converters 18 Treffer
- voltage references 18 Treffer
-
45 weitere Werte:
- power resources 17 Treffer
- cmos 14 Treffer
- comparator circuits 14 Treffer
- operational amplifiers 14 Treffer
- taiwan semiconductor manufacturing co. ltd. 14 Treffer
- threshold voltage 14 Treffer
- low power 12 Treffer
- high voltages 11 Treffer
- bandwidths 9 Treffer
- electrostatic discharges 9 Treffer
- flipped voltage follower 9 Treffer
- low voltage systems 8 Treffer
- noise 8 Treffer
- voltage-controlled oscillators 8 Treffer
- capacitors 7 Treffer
- silicon-controlled rectifiers 7 Treffer
- stray currents 7 Treffer
- analog-to-digital converters 6 Treffer
- electric transients 6 Treffer
- frequency compensation 6 Treffer
- low noise amplifiers 6 Treffer
- low-dropout regulator (ldo) 6 Treffer
- metal oxide semiconductor field-effect transistors 6 Treffer
- on-chip charge pumps 6 Treffer
- current mode 5 Treffer
- fast transient response 5 Treffer
- level shifter 5 Treffer
- power transistors 5 Treffer
- reliability 5 Treffer
- thermal noise 5 Treffer
- adc 4 Treffer
- analog circuits 4 Treffer
- bulk-driven 4 Treffer
- charge pump 4 Treffer
- cmos image sensors 4 Treffer
- cmos technology 4 Treffer
- conveying machinery 4 Treffer
- design protection 4 Treffer
- digital calibration 4 Treffer
- digital electronics 4 Treffer
- dynamic comparator 4 Treffer
- electric inductance 4 Treffer
- esd 4 Treffer
- feedforward neural networks 4 Treffer
- flip chip technology 4 Treffer
Publikation
Sprache
159 Treffer
-
In: Microelectronics Journal, Jg. 145 (2024-03-01), S. N.PAGacademicJournalZugriff:
-
In: Integration: The VLSI Journal, Jg. 88 (2023), S. 278-285academicJournalZugriff:
-
In: Microelectronics Journal, Jg. 148 (2024-06-01), S. N.PAGacademicJournalZugriff:
-
In: Materials Science in Semiconductor Processing, Jg. 169 (2024), S. N.PAGacademicJournalZugriff:
-
In: Microelectronics Journal, Jg. 144 (2024-02-01), S. N.PAGacademicJournalZugriff:
-
In: Integration: The VLSI Journal, Jg. 87 (2022-11-01), S. 74-81academicJournalZugriff:
-
In: Microelectronics Journal, Jg. 147 (2024-05-01), S. N.PAGacademicJournalZugriff:
-
In: Integration: The VLSI Journal, Jg. 97 (2024-07-01), S. N.PAGacademicJournalZugriff:
-
In: Integration: The VLSI Journal, Jg. 95 (2024-03-01), S. N.PAGacademicJournalZugriff:
-
In: Microelectronics Journal, Jg. 147 (2024-05-01), S. N.PAGacademicJournalZugriff:
-
In: AEU: International Journal of Electronics & Communications, Jg. 173 (2024), S. N.PAGOnline academicJournal
-
In: AEU: International Journal of Electronics & Communications, Jg. 161 (2023-03-01), S. N.PAGOnline academicJournal
-
In: AEU: International Journal of Electronics & Communications, Jg. 170 (2023-10-01), S. N.PAGOnline academicJournal
-
In: Solid-State Electronics, Jg. 216 (2024-06-01), S. N.PAGacademicJournalZugriff:
-
In: AEU: International Journal of Electronics & Communications, Jg. 156 (2022-11-01), S. N.PAGOnline academicJournal
-
In: AEU: International Journal of Electronics & Communications, Jg. 155 (2022-10-01), S. N.PAGOnline academicJournal
-
In: Solid-State Electronics, Jg. 191 (2022-05-01), S. N.PAGacademicJournalZugriff:
-
CMOS inverter performance degradation and its correlation with BTI, HCI and OFF state MOSFETs aging.In: Solid-State Electronics, Jg. 191 (2022-05-01), S. N.PAGacademicJournalZugriff:
-
In: Solid-State Electronics, Jg. 184 (2021-10-01), S. N.PAGacademicJournalZugriff:
-
In: Biosensors & Bioelectronics, Jg. 257 (2024-08-01), S. N.PAGacademicJournalZugriff: