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In: Microelectronics Reliability, Jg. 117 (2021-02-01), S. 114036-114036Online unknownZugriff:
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In: Microelectronics Journal, Jg. 59 (2017), S. 40-46Online unknownZugriff:
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In: Microelectronics Journal, Jg. 70 (2017-12-01), S. 89-96Online unknownZugriff:
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In: Microelectronics Journal, Jg. 68 (2017-10-01), S. 44-54Online unknownZugriff: