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Weniger Treffer
Gefunden in
Schlagwort
- business 138 Treffer
- business.industry 138 Treffer
- cmos 120 Treffer
- transistor 112 Treffer
- condensed matter physics 104 Treffer
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45 weitere Werte:
- electrical and electronic engineering 95 Treffer
- electronic, optical and magnetic materials 94 Treffer
- optoelectronics 88 Treffer
- materials science 86 Treffer
- hardware_integratedcircuits 77 Treffer
- hardware_performanceandreliability 73 Treffer
- electrical engineering 58 Treffer
- surfaces, coatings and films 56 Treffer
- materials chemistry 51 Treffer
- hardware_logicdesign 49 Treffer
- integrated circuit 45 Treffer
- engineering 41 Treffer
- electronic engineering 40 Treffer
- atomic and molecular physics, and optics 38 Treffer
- field-effect transistor 30 Treffer
- silicon on insulator 29 Treffer
- hardware_general 27 Treffer
- chemistry 20 Treffer
- general engineering 20 Treffer
- nanotechnology 20 Treffer
- threshold voltage 20 Treffer
- instrumentation 19 Treffer
- 02 engineering and technology 15 Treffer
- electronic circuit 15 Treffer
- general materials science 15 Treffer
- physics 15 Treffer
- safety, risk, reliability and quality 15 Treffer
- 01 natural sciences 14 Treffer
- computer science::hardware architecture 14 Treffer
- metals and alloys 14 Treffer
- chemistry.chemical_element 13 Treffer
- gate oxide 13 Treffer
- 0103 physical sciences 12 Treffer
- transconductance 12 Treffer
- voltage 12 Treffer
- computer science 11 Treffer
- 010302 applied physics 10 Treffer
- capacitor 10 Treffer
- fabrication 10 Treffer
- high-κ dielectric 10 Treffer
- miniaturization 10 Treffer
- nuclear and high energy physics 10 Treffer
- silicon 10 Treffer
- static random-access memory 10 Treffer
- surfaces and interfaces 10 Treffer
Publikation
- solid-state electronics 40 Treffer
- microelectronic engineering 22 Treffer
- microelectronics journal 18 Treffer
- microelectronics reliability 15 Treffer
- nuclear instruments and methods in physics research section a: accelerators, spectrometers, detectors and associated equipment 7 Treffer
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26 weitere Werte:
- thin solid films 7 Treffer
- sensors and actuators a: physical 5 Treffer
- superlattices and microstructures 5 Treffer
- cryogenics 4 Treffer
- applied surface science 3 Treffer
- current applied physics 2 Treffer
- integration 2 Treffer
- materials science and engineering: b 2 Treffer
- materials today: proceedings 2 Treffer
- measurement 2 Treffer
- nuclear instruments and methods in physics research section b: beam interactions with materials and atoms 2 Treffer
- physica b+c 2 Treffer
- sensors and actuators b: chemical 2 Treffer
- ssrn electronic journal 2 Treffer
- aeu - international journal of electronics and communications 1 Treffer
- journal of crystal growth 1 Treffer
- journal of electrostatics 1 Treffer
- journal of non-crystalline solids 1 Treffer
- materials science and engineering: c 1 Treffer
- materials science and engineering: r: reports 1 Treffer
- materials science in semiconductor processing 1 Treffer
- nuclear science and techniques 1 Treffer
- physica e: low-dimensional systems and nanostructures 1 Treffer
- procedia chemistry 1 Treffer
- procedia engineering 1 Treffer
- vacuum 1 Treffer
Sprache
156 Treffer
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In: Microelectronic Engineering, Jg. 200 (2018-11-01), S. 45-50Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 97 (2019-06-01), S. 53-65Online unknownZugriff:
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In: SSRN Electronic Journal, 2020Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 79 (2017-12-01), S. 416-425Online unknownZugriff:
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In: Microelectronics Journal, Jg. 55 (2016-09-01), S. 8-18Online unknownZugriff:
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In: Current Applied Physics, Jg. 15 (2015-03-01), S. 352-355Online unknownZugriff:
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-State Electronics, Jg. 91 (2014), S. 81-86Online unknownZugriff:
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In: Cryogenics, Jg. 59 (2014), S. 49-59Online unknownZugriff:
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In: Solid-State Electronics, Jg. 51 (2007), S. 48-56Online unknownZugriff:
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In: Microelectronics Journal, Jg. 44 (2013-02-01), S. 119-127Online unknownZugriff:
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In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Jg. 650 (2011-09-01), S. 163-168Online unknownZugriff:
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In: Solid-State Electronics, Jg. 54 (2010-09-01), S. 897-902Online unknownZugriff:
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In: Applied Surface Science, Jg. 256 (2010-07-01), S. 5698-5707Online unknownZugriff:
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In: Procedia Chemistry, Jg. 6 (2012), S. 110-116Online unknownZugriff:
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Si-nanowire CMOS inverter logic fabricated using gate-all-around (GAA) devices and top-down approachIn: Solid-State Electronics, Jg. 52 (2008-09-01), S. 1312-1317Online unknownZugriff:
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In: Microelectronic Engineering, Jg. 84 (2007-09-01), S. 1845-1852Online unknownZugriff:
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In: Cryogenics, Jg. 49 (2009-11-01), S. 595-598Online unknownZugriff:
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In: Microelectronics Journal, Jg. 40 (2009-09-01), S. 1281-1292Online unknownZugriff:
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In: Microelectronics Journal, Jg. 40 (2009-04-01), S. 769-772Online unknownZugriff:
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In: Thin Solid Films, Jg. 504 (2006-05-01), S. 170-173Online unknownZugriff: