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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures 6 Treffer
- structure electronique et proprietes electriques des surfaces, interfaces, couches minces et structures de basse dimensionnalite 6 Treffer
- barriere schottky 5 Treffer
- schottky barriers 5 Treffer
- barrier height 4 Treffer
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45 weitere Werte:
- compose mineral 4 Treffer
- condensed matter: structure, mechanical and thermal properties 4 Treffer
- doubles couches superficielles, barrieres de schottky et travail de sortie 4 Treffer
- etat condense: structure, proprietes mecaniques et thermiques 4 Treffer
- hauteur barriere 4 Treffer
- si 4 Treffer
- silicium 4 Treffer
- silicon 4 Treffer
- surface double layers, schottky barriers, and work functions 4 Treffer
- 73.20.-r 3 Treffer
- au 3 Treffer
- electronic structure 3 Treffer
- etats electroniques de surface et d'interface 3 Treffer
- structure des liquides et des solides; cristallographie 3 Treffer
- structure electronique 3 Treffer
- structure of solids and liquids; crystallography 3 Treffer
- surface and interface electron states 3 Treffer
- 68.55.-a 2 Treffer
- alkali halides 2 Treffer
- bande interdite 2 Treffer
- caracteristique courant tension 2 Treffer
- couche mince 2 Treffer
- cross-disciplinary physics: materials science; rheology 2 Treffer
- defaut 2 Treffer
- defect 2 Treffer
- defect density 2 Treffer
- defects 2 Treffer
- densidad defecto 2 Treffer
- densite defaut 2 Treffer
- diffraction et diffusion de rayons x 2 Treffer
- distribucion potencial 2 Treffer
- distribution potentiel 2 Treffer
- domaines interdisciplinaires: science des materiaux; rheologie 2 Treffer
- energy gap 2 Treffer
- energy levels 2 Treffer
- exafs 2 Treffer
- gold 2 Treffer
- inorganic compounds 2 Treffer
- interface metal isolant 2 Treffer
- interstitials 2 Treffer
- interstitiel 2 Treffer
- iv characteristic 2 Treffer
- metal-insulator boundaries 2 Treffer
- niveau energie 2 Treffer
- or 2 Treffer
Publikation
- acsin-7: proceedings of the seventh international symposium on atomically controlled surfaces, interfaces and nanostructures, nara, japan, november 16-20, 2003 2 Treffer
- 11th international conference on solid films and surfaces, marseille, france, july 8-12, 2002 (icsfs-11) 1 Treffer
- e-mrs iumrs icem 2006 spring meeting, nice, france - may 29-june 2, 2006, symposium h: photon-assisted synthesis and processing of functional materials 1 Treffer
- iscsi-4: proceedings of the fourth international symposium on the control of semiconductor interfaces, karuizawa, japan, october 21-25, 2002 1 Treffer
- proceedings of the eighth international conference on the formation of semiconductor interfaces, sapporo, japan, june 10-15, 2001 1 Treffer
- Ein weiterer Wert:
Sprache
9 Treffer
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In: E-MRS IUMRS ICEM 2006 Spring Meeting, Nice, France - May 29-June 2, Jg. 253 (2007), Heft 19, S. 8050-8053KonferenzZugriff:
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In: Applied surface science, Jg. 254 (2008), Heft 18, S. 5715-5721academicJournalZugriff:
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In: ACSIN-7: Proceedings of the Seventh International Symposium on Atomically Controlled Surfaces, Interfaces and Nanostructures, Nara, Japan, November 16-20, 2003, Jg. 237 (2004), Heft 1-4, S. 494-497KonferenzZugriff:
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In: ACSIN-7: Proceedings of the Seventh International Symposium on Atomically Controlled Surfaces, Interfaces and Nanostructures, Nara, Japan, November 16-20, 2003, Jg. 237 (2004), Heft 1-4, S. 165-169KonferenzZugriff:
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In: ISCSI-4: Proceedings of the Fourth International Symposium on the Control of Semiconductor Interfaces, Karuizawa, Japan, October 21-25, 2002, Jg. 216 (2003), Heft 1-4, S. 198-202KonferenzZugriff:
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In: 11th International Conference on Solid Films and Surfaces, Marseille, France, July 8-12, 2002 (ICSFS-11), Jg. 212-13 (2003), S. 701-704KonferenzZugriff:
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In: Special Issue: Proceedings of the Third International Symposium on the Control of Semiconductor Interfaces, ISCSI-3, Karuizawa, Japan, October 25-29, 1999, Jg. 159-60 (2000), S. 154-160KonferenzZugriff:
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In: Applied surface science, Jg. 252 (2006), Heft 16, S. 5659-5675academicJournalZugriff:
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In: Proceedings of the Eighth International Conference on the Formation of Semiconductor Interfaces, Sapporo, Japan, June 10-15, 2001, Jg. 190 (2002), Heft 1-4, S. 2-10KonferenzZugriff: