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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary mos technology 28 Treffer
- technologie mos complementaire 28 Treffer
- tecnologia mos complementario 28 Treffer
- circuits integres 25 Treffer
- conception. technologies. analyse fonctionnement. essais 25 Treffer
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45 weitere Werte:
- design. technologies. operation analysis. testing 25 Treffer
- integrated circuits 25 Treffer
- fabrication microelectronique (technologie des materiaux et des surfaces) 12 Treffer
- microelectronic fabrication (materials and surfaces technology) 12 Treffer
- fabricacion microelectrica 11 Treffer
- fabrication microelectronique 11 Treffer
- microelectronic fabrication 11 Treffer
- grille transistor 9 Treffer
- rejilla transistor 9 Treffer
- transistor gate 9 Treffer
- circuit properties 8 Treffer
- circuits electriques, optiques et optoelectroniques 8 Treffer
- circuits electroniques 8 Treffer
- dielectric, amorphous and glass solid devices 8 Treffer
- dispositifs dielectriques et dispositifs a base de verre et de solides amorphes 8 Treffer
- electric, optical and optoelectronic circuits 8 Treffer
- electronic circuits 8 Treffer
- proprietes des circuits 8 Treffer
- circuit integre 7 Treffer
- circuito integrado 7 Treffer
- integrated circuit 7 Treffer
- caracteristica electrica 6 Treffer
- caracteristique electrique 6 Treffer
- dielectrico alta constante dielectrica 6 Treffer
- dielectrique permittivite elevee 6 Treffer
- electrical characteristic 6 Treffer
- high k dielectric 6 Treffer
- oscillateurs, resonateurs, synthetiseurs 6 Treffer
- oscillators, resonators, synthetizers 6 Treffer
- transistors 6 Treffer
- capa multiple 5 Treffer
- capacitor 5 Treffer
- condensador 5 Treffer
- condensateur 5 Treffer
- courant fuite 5 Treffer
- evaluacion prestacion 5 Treffer
- evaluation performance 5 Treffer
- methode mocvd 5 Treffer
- mocvd 5 Treffer
- mosfet 5 Treffer
- multicouche 5 Treffer
- multiple layer 5 Treffer
- performance evaluation 5 Treffer
- transistor mosfet 5 Treffer
- caracteristique capacite tension 4 Treffer
Publikation
- microelectronic engineering 13 Treffer
- microelectronics journal 8 Treffer
- solid-state electronics 6 Treffer
- e-mrs 2006 symposium l : characterization of high-k dielectric materials 3 Treffer
- materials science in semiconductor processing 3 Treffer
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12 weitere Werte:
- biosensors & bioelectronics 1 Treffer
- infos 2007: proceedings of the 15th biennial conference on insulating films on semiconductors, june 20-23, 2007, glyfada athens, greece 1 Treffer
- international mixed signal testing workshop 1 Treffer
- isdrs 2005 1 Treffer
- micro and nano engineering 2004: proceedings of the 30th international conference on micro and nano engineering, september 19-22, 2004, rotterdam, the netherlands 1 Treffer
- papers selected from the 35th european solid-state device research conference - essderc'05 1 Treffer
- proceedings of symposium j on synthesis processing and characterization of nanoscale functional oxide films - emrs 2006 conference, nice, may 29-june 2, 2006 1 Treffer
- proceedings of the 28th international conference on micro- and nano-engineering, september 16-19, 2002, lugano, switzerland 1 Treffer
- proceedings of the 29th conference on micro and nano engineering, september 22-25, 2003, cambridge, united kingdom 1 Treffer
- proceedings of the 31st international conference on micro- and nano-engineering: 19-22 september 2005, vienna, austria 1 Treffer
- proceedings of the symposium and summer school on: nano and giga challenges in microelectronics research and opportunities in russia 1 Treffer
- thin solid films 1 Treffer
Sprache
32 Treffer
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In: Microelectronics journal, Jg. 37 (2006), Heft 11, S. 1241-1250KonferenzZugriff:
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In: Microelectronic engineering, Jg. 83 (2006), Heft 11-12, S. 2303-2308KonferenzZugriff:
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In: Microelectronic engineering, Jg. 83 (2006), Heft 11-12, S. 2412-2416KonferenzZugriff:
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In: Proceedings of the 28th International Conference on Micro- and Nano-Engineering, September 16-19, 2002, Lugano, Switzerland, Jg. 67-68 (2003), S. 487-494KonferenzZugriff:
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In: Microelectronics journal, Jg. 38 (2007), Heft 10-11, S. 1057-1063academicJournalZugriff:
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In: Biosensors & bioelectronics, Jg. 23 (2008), Heft 10, S. 1449-1457academicJournalZugriff:
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In: Solid-state electronics, Jg. 49 (2005), Heft 4, S. 595-605academicJournalZugriff:
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In: Microelectronics journal, Jg. 38 (2007), Heft 6-7, S. 672-677academicJournalZugriff:
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In: Solid-state electronics, Jg. 51 (2007), Heft 6, S. 888-893academicJournalZugriff:
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In: E-MRS 2006 symposium L : Characterization of high-k dielectric materials, Jg. 9 (2006), Heft 6, S. 964-968KonferenzZugriff:
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In: Microelectronic engineering, Jg. 77 (2005), Heft 3-4, S. 292-296academicJournalZugriff:
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In: Microelectronic engineering, Jg. 39 (1997), Heft 1-4, S. 139-144academicJournalZugriff:
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In: Microelectronic engineering, Jg. 39 (1997), Heft 1-4, S. 179-208academicJournalZugriff:
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In: Microelectronic engineering, Jg. 14 (1991), Heft 2, S. 87-100academicJournalZugriff:
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In: Microelectronics journal, Jg. 23 (1992), Heft 6, S. 479-481academicJournalZugriff:
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In: Microelectronics journal, Jg. 37 (2006), Heft 10, S. 1128-1135academicJournalZugriff:
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In: Solid-state electronics, Jg. 50 (2006), Heft 2, S. 114-118academicJournalZugriff:
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In: Microelectronics journal, Jg. 38 (2007), Heft 12, S. 1257-1262academicJournalZugriff:
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In: Microelectronics journal, Jg. 38 (2007), Heft 8-9, S. 828-833academicJournalZugriff:
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In: E-MRS 2006 symposium L : Characterization of high-k dielectric materials, Jg. 9 (2006), Heft 6, S. 969-974KonferenzZugriff: