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  1. El Boubkari, Anas ; Rouger, Nicolas ; et al.
    In: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD) ; 2023 IEEE 35th International Symposium on Power Semiconductor Devices and ICs (IEEE ISPSD) ; https://hal.science/hal-04132615 ; 2023 IEEE 35th International Symposium on Power Semiconductor Devices and ICs (IEEE ISPSD), Hong Kong University of Science and Technology (HKUST), May, 2023
    Online Konferenz
  2. Gheysens, Daniel ; Fleury, Alain ; et al.
    In: Proceedings of the IEEE 53rd European Solid-State Device Research Conference, ESSDERC ; IEEE 53rd European Solid-State Device Research Conference, 2023
    Online Konferenz
  3. Occello, Olivier ; Boukhezar, L. ; et al.
    In: 2022 52nd European Microwave Conference (EuMC) ; 52nd European Microwave Conference (EuMC 2022) ; https://hal.science/hal-03839576 ; 52nd European Microwave Conference (EuMC 2022), Sep 2022, Milan, Italy. pp.560-563, ⟨10.23919/EuMC54642.2022.9924358⟩, 2022
    Online Konferenz
  4. Lefèvre, Julia ; Debaud, Philippe ; et al.
    In: ETS 2022 - 27th IEEE European Test Symposium ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770756 ; ETS 2022 - 27th IEEE European Test Symposium, May 2022, Barcelona, Spain. pp.1-2, ⟨10.1109/ETS54262.2022.9810458⟩, 2022
    Online Konferenz
  5. Garba-Seybou, Tidjani ; Federspiel, Xavier ; et al.
    In: 2022 IEEE International Reliability Physics Symposium (IRPS) ; IEEE International Reliability Physics Symposium (IRPS 2022) ; https://hal.science/hal-03999581 ; IEEE International Reliability Physics Symposium (IRPS 2022), Mar 2022, Dallas, TX (en ligne), United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩, 2022
    Online Konferenz
  6. Wan, Fayu ; Gu, Taochen ; et al.
    In: ISSN: 0278-0070 ; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ; https://hal.science/hal-03969267 ; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022, 41 (11), pp.4965-4974. ⟨10.1109/TCAD.2021.3136982⟩, 2022
    Online academicJournal
  7. El Chaar, Mohamad ; Podevin, Florence ; et al.
    In: ISSN: 2573-9603 ; IEEE Solid-State Circuits Letters ; https://hal.science/hal-03775893 ; IEEE Solid-State Circuits Letters, 2022, 2022
    academicJournal
  8. Gao, S. ; Issartel, D. ; et al.
    In: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ; https://shs.hal.science/halshs-03515486 ; 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.301-304, ⟨10.1109/SISPAD54002.2021.9592555⟩, 2021
    Online Konferenz
  9. Devoge, Paul ; Aziza, Hassen ; et al.
    In: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ; https://hal.science/hal-03502361 ; 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), Jun 2021, Montpellier, France. pp.1-5, ⟨10.1109/DTIS53253.2021.9505137⟩, 2021
    Online Konferenz
  10. Saad, Sehmi ; Haddad, Fayrouz. ; et al.
    In: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021) ; https://hal.science/hal-03601915 ; 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021), Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505061⟩, 2021
    Online Konferenz
  11. Tochou, Guillaume ; Benarrouch, Robin ; et al.
    In: 2021 IEEE Radio Frequency Integrated Circuits Symposium (RFIC/IMS) ; https://hal.science/hal-03306898 ; 2021 IEEE Radio Frequency Integrated Circuits Symposium (RFIC/IMS), Jun 2021, Atlanta, United States. pp.195-198, ⟨10.1109/rfic51843.2021.9490464⟩, 2021
    Online Konferenz
  12. Diverrez, Gwennael ; Kerherve, Eric ; et al.
    In: 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023 ; https://hal.science/hal-04225781 ; 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023, Jun 2023, San Diego, United States. pp.182-185, ⟨10.1109/ims37964.2023.10188213⟩, 2023
    Konferenz
  13. Yan, Aibin ; Zhou, Zhen ; et al.
    In: DATE 2023 - Design, Automation & Test in Europe Conference & Exhibition ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240330 ; DATE 2023 - Design, 2023
    Online Konferenz
  14. Pavanello, Fabio ; Vatajelu, Ioana ; et al.
    In: Proceedings of 2023 IEEE 41st VLSI Test Symposium (VTS) ; IEEE VLSI Test Symposium (VTS 2023) ; https://hal.science/hal-04103973, 2023
    Online Konferenz
  15. Barazi, Yazan ; Rouger, Nicolas ; et al.
    In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) ; https://hal.science/hal-02920189 ; 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD), Sep 2020, Vienna (virtual), Austria. pp.94-97, ⟨10.1109/ISPSD46842.2020.9170164⟩, 2020
    Online Konferenz
  16. Vaz, Pablo Ilha ; Girard, Patrick ; et al.
    In: IOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03035780 ; IOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-6, ⟨10.1109/IOLTS50870.2020.9159709⟩, 2020
    Online Konferenz
  17. Rebiere, Valentin ; Drouot, Antoine ; et al.
    In: IEEE Sensors 2020 ; https://hal.science/hal-02981089 ; IEEE Sensors 2020, Oct 2020, Rotterdam (virtual ), Netherlands. pp.1-4, ⟨10.1109/SENSORS47125.2020.9278887⟩, 2020
    Online Konferenz
  18. Vaz, Pablo Ilha ; Girard, Patrick ; et al.
    In: ISSN: 1063-8210 ; IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03376937 ; IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2021, 29 (6), pp.1122-1131. ⟨10.1109/TVLSI.2021.3067446⟩, 2021
    Online academicJournal
  19. Zitouni, Wafa ; Vauché, Rémy ; et al.
    In: 2023 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS) ; https://hal.science/hal-04524656 ; 2023 IEEE International Conference on Design, 2023
    Online Konferenz
  20. Bouchoucha, Mohamed Khalil ; Barragan, Manuel ; et al.
    In: IEEE 49th European Solid State Circuits Conference (ESSCIRC 2023) ; https://hal.science/hal-04241250 ; IEEE 49th European Solid State Circuits Conference (ESSCIRC 2023), Sep 2023, Lisbon, Portugal. ⟨10.1109/ESSCIRC59616.2023.10268734⟩ ; IEEELink, 2023
    Konferenz
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