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Schlagwort
- [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics 347 Treffer
- [spi]engineering sciences [physics] 126 Treffer
- [spi.tron]engineering sciences [physics]/electronics 124 Treffer
- cmos 58 Treffer
- [phys.phys.phys-ins-det]physics [physics]/physics [physics]/instrumentation and detectors [physics.ins-det] 54 Treffer
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45 weitere Werte:
- pacs 8542 51 Treffer
- [spi.opti]engineering sciences [physics]/optics / photonic 50 Treffer
- [spi.nrj]engineering sciences [physics]/electric power 35 Treffer
- [spi.elec]engineering sciences [physics]/electromagnetism 34 Treffer
- [phys]physics [physics] 31 Treffer
- pacs 85.42 26 Treffer
- [spi.signal]engineering sciences [physics]/signal and image processing 19 Treffer
- dark current 18 Treffer
- radiation effects 18 Treffer
- cmos integrated circuits 15 Treffer
- cmos sensor 14 Treffer
- modeling 14 Treffer
- [spi.mat]engineering sciences [physics]/materials 13 Treffer
- complementary metal-oxide-semiconductor (cmos) 13 Treffer
- [sdv.ib.ima]life sciences [q-bio]/bioengineering/imaging 12 Treffer
- discriminator 12 Treffer
- neutron 12 Treffer
- sram 12 Treffer
- [phys.phys.phys-space-ph]physics [physics]/physics [physics]/space physics [physics.space-ph] 11 Treffer
- radiation hardening by design (rhbd) 11 Treffer
- reliability 11 Treffer
- [info.info-ts]computer science [cs]/signal and image processing 10 Treffer
- [phys.meca.ther]physics [physics]/mechanics [physics]/thermics [physics.class-ph] 10 Treffer
- [sdv.neu]life sciences [q-bio]/neurons and cognition [q-bio.nc] 10 Treffer
- [spi.meca.ther]engineering sciences [physics]/mechanics [physics.med-ph]/thermics [physics.class-ph] 10 Treffer
- active pixel sensor 10 Treffer
- single-event upset (seu) 10 Treffer
- substrates 10 Treffer
- fusion 9 Treffer
- interface states 9 Treffer
- optoelectronic 9 Treffer
- photodetector 9 Treffer
- rf 9 Treffer
- static random access memory (sram) 9 Treffer
- synchronization 9 Treffer
- system-on-chip 9 Treffer
- tokamak 9 Treffer
- [info.info-ar]computer science [cs]/hardware architecture [cs.ar] 8 Treffer
- [phys.hexp]physics [physics]/high energy physics - experiment [hep-ex] 8 Treffer
- [phys.phys.phys-optics]physics [physics]/physics [physics]/optics [physics.optics] 8 Treffer
- charged particle detector 8 Treffer
- cmos image sensor (cis) 8 Treffer
- latch design 8 Treffer
- magnetic tunnel junction (mtj) 8 Treffer
- maps 8 Treffer
Publikation
- issn: 0018-9499 207 Treffer
- issn: 1549-7747 ; eissn: 1558-3791 39 Treffer
- issn: 2469-7311 12 Treffer
- issn: 1531-1309 7 Treffer
- issn: 0361-5235 5 Treffer
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12 weitere Werte:
- issn: 2156-342x 5 Treffer
- issn: 1932-4545 4 Treffer
- issn: 0018-9219 3 Treffer
- issn: 0741-3106 ; ieee electron device letters ; https://hal.science/hal-00629363 ; ieee electron device letters, 2011, 32 (8), pp.1041 - 1043. ⟨10.1109/led.2011.2158054⟩ 3 Treffer
- issn: 0885-8993 ; ieee transactions on power electronics ; https://hal.science/hal-00811916 ; ieee transactions on power electronics, 2013, 28 (9), pp.4318 - 4326. ⟨10.1109/tpel.2012.2226754⟩ 3 Treffer
- issn: 0885-8993 ; ieee transactions on power electronics ; https://hal.science/hal-01272496 ; ieee transactions on power electronics, 2015, 31 (6), pp.3985 - 3988. ⟨10.1109/tpel.2015.2502058⟩ 3 Treffer
- issn: 1521-3331 ; ieee transactions on components and packaging technologies ; https://hal.science/hal-00192611 ; ieee transactions on components and packaging technologies, 2007, 30 (3), pp.424-431. ⟨10.1109/tcapt.2007.901748⟩ 3 Treffer
- issn: 1530-437x ; ieee sensors journal ; https://hal.sorbonne-universite.fr/hal-01238701 ; ieee sensors journal, 2016, 16 (6), pp.1611-1620. ⟨10.1109/jsen.2015.2501347⟩ 3 Treffer
- issn: 1530-437x ; ieee sensors journal ; https://ujm.hal.science/ujm-00122906 ; ieee sensors journal, 2005, 5, pp.1305-1309. ⟨10.1109/jsen.2005.858945⟩ 3 Treffer
- issn: 1536-125x ; ieee transactions on nanotechnology ; https://hal.science/hal-01745418 ; ieee transactions on nanotechnology, 2017, 16, pp.677 - 686. ⟨10.1109/tnano.2017.2703985⟩ 3 Treffer
- issn: 2771-957x 3 Treffer
- issn: 0093-9994 1 Treffer
Sprache
Geographischer Bezug
764 Treffer
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In: ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-04192324 ; IEEE Transactions on Electron Devices, 2023, 70 (11), pp.5814 - 5817. ⟨10.1109/TED.2023.3311415⟩, 2023Online academicJournalZugriff:
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In: ISSN: 1932-4545, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-04192324 ; IEEE Transactions on Electron Devices, 2023, 70 (11), pp.5814 - 5817. ⟨10.1109/TED.2023.3311415⟩, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-04192324 ; IEEE Transactions on Electron Devices, 2023, 70 (11), pp.5814 - 5817. ⟨10.1109/TED.2023.3311415⟩, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-04192324 ; IEEE Transactions on Electron Devices, In press, ⟨10.1109/TED.2023.3311415⟩, 2023Online academicJournalZugriff:
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In: ISSN: 1932-4545, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-04192324 ; IEEE Transactions on Electron Devices, 2023, 70 (11), pp.5814 - 5817. ⟨10.1109/TED.2023.3311415⟩, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9499, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9499, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9499, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9499, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9200 ; IEEE Journal of Solid-State Circuits ; https://hal.science/hal-03514856 ; IEEE Journal of Solid-State Circuits, 2022, 57, pp 1409-1420. ⟨10.1109/JSSC.2022.3140905⟩, 2022Online academicJournalZugriff:
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In: ISSN: 0018-9200 ; IEEE Journal of Solid-State Circuits ; https://hal.science/hal-03514856 ; IEEE Journal of Solid-State Circuits, 2022, 57, pp 1409-1420. ⟨10.1109/JSSC.2022.3140905⟩, 2022Online academicJournalZugriff:
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In: ISSN: 0018-9200 ; IEEE Journal of Solid-State Circuits ; https://hal.science/hal-03514856 ; IEEE Journal of Solid-State Circuits, 2022, 57, pp 1409-1420. ⟨10.1109/JSSC.2022.3140905⟩, 2022Online academicJournalZugriff:
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In: ISSN: 0018-9480 ; IEEE Transactions on Microwave Theory and Techniques ; https://cea.hal.science/cea-03637109 ; IEEE Transactions on Microwave Theory and Techniques, In press, ⟨10.1109/TMTT.2022.3162296⟩, 2022Online academicJournalZugriff:
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In: ISSN: 0018-9200 ; IEEE Journal of Solid-State Circuits ; https://hal.science/hal-03514856 ; IEEE Journal of Solid-State Circuits, 2022, 57, pp 1409-1420. ⟨10.1109/JSSC.2022.3140905⟩, 2022Online academicJournalZugriff:
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In: ISSN: 0018-9499, 2020Online academicJournalZugriff:
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In: ISSN: 0018-9499, 2020Online academicJournalZugriff:
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In: ISSN: 0018-9499 ; IEEE Transactions on Nuclear Science ; https://hal.archives-ouvertes.fr/hal-02536143 ; IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (2), pp.455-463. ⟨10.1109/TNS.2020.2964333⟩, 2020Online academicJournalZugriff:
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In: ISSN: 1530-4388 ; IEEE Transactions on Device and Materials Reliability ; https://hal.science/hal-01971932 ; IEEE Transactions on Device and Materials Reliability, 2019, 2019academicJournalZugriff: