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Weniger Treffer
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Schlagwort
- [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics 345 Treffer
- [spi]engineering sciences [physics] 126 Treffer
- [spi.tron]engineering sciences [physics]/electronics 119 Treffer
- cmos 57 Treffer
- [phys.phys.phys-ins-det]physics [physics]/physics [physics]/instrumentation and detectors [physics.ins-det] 53 Treffer
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45 weitere Werte:
- [spi.opti]engineering sciences [physics]/optics / photonic 51 Treffer
- pacs 8542 51 Treffer
- [spi.nrj]engineering sciences [physics]/electric power 35 Treffer
- [spi.elec]engineering sciences [physics]/electromagnetism 34 Treffer
- [phys]physics [physics] 29 Treffer
- pacs 85.42 26 Treffer
- [spi.signal]engineering sciences [physics]/signal and image processing 19 Treffer
- dark current 18 Treffer
- radiation effects 18 Treffer
- cmos integrated circuits 15 Treffer
- modeling 14 Treffer
- [spi.mat]engineering sciences [physics]/materials 13 Treffer
- sram 12 Treffer
- [phys.phys.phys-space-ph]physics [physics]/physics [physics]/space physics [physics.space-ph] 11 Treffer
- complementary metal-oxide-semiconductor (cmos) 11 Treffer
- neutron 11 Treffer
- reliability 11 Treffer
- single-event upset (seu) 11 Treffer
- [phys.meca.ther]physics [physics]/mechanics [physics]/thermics [physics.class-ph] 10 Treffer
- [sdv.ib.ima]life sciences [q-bio]/bioengineering/imaging 10 Treffer
- [spi.meca.ther]engineering sciences [physics]/mechanics [physics.med-ph]/thermics [physics.class-ph] 10 Treffer
- active pixel sensor 10 Treffer
- cmos sensor 10 Treffer
- discriminator 10 Treffer
- [phys.hexp]physics [physics]/high energy physics - experiment [hep-ex] 9 Treffer
- cmos image sensor (cis) 9 Treffer
- interface states 9 Treffer
- optoelectronic 9 Treffer
- photodetector 9 Treffer
- radiation hardening by design (rhbd) 9 Treffer
- static random access memory (sram) 9 Treffer
- synchronization 9 Treffer
- system-on-chip 9 Treffer
- [info.info-ts]computer science [cs]/signal and image processing 8 Treffer
- [phys.phys.phys-optics]physics [physics]/physics [physics]/optics [physics.optics] 8 Treffer
- [sdv.neu]life sciences [q-bio]/neurons and cognition [q-bio.nc] 8 Treffer
- annealing 8 Treffer
- charged particle detector 8 Treffer
- fusion 8 Treffer
- latch design 8 Treffer
- magnetic tunnel junction (mtj) 8 Treffer
- maps 8 Treffer
- real-time experiment 8 Treffer
- rf 8 Treffer
- soi 8 Treffer
Publikation
- issn: 0018-9499 155 Treffer
- issn: 1549-7747 ; eissn: 1558-3791 37 Treffer
- issn: 1521-3331 ; ieee transactions on components and packaging technologies ; https://hal.science/hal-00192611 ; ieee transactions on components and packaging technologies, 2007, 30 (3), pp.424-431. ⟨10.1109/tcapt.2007.901748⟩ 9 Treffer
- issn: 2469-7311 9 Treffer
- issn: 0361-5235 7 Treffer
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27 weitere Werte:
- issn: 1531-1309 7 Treffer
- issn: 0018-9383 ; ieee transactions on electron devices ; https://hal.science/hal-03372056 ; ieee transactions on electron devices, 2021, 68 (10), pp.4925-4932. ⟨10.1109/ted.2021.3108479⟩ 6 Treffer
- issn: 2771-957x 6 Treffer
- issn: 0018-9383 ; ieee transactions on electron devices ; https://hal.science/hal-01025022 ; ieee transactions on electron devices, 2013, 59 (5), pp.1279-1285. ⟨10.1109/ted.2012.2186969⟩ 5 Treffer
- issn: 1041-1135 ; ieee photonics technology letters ; https://hal.science/hal-01917904 ; ieee photonics technology letters, 2018, 30 (4), pp.355-358. ⟨10.1109/lpt.2018.2790045⟩ 5 Treffer
- issn: 1536-125x ; ieee transactions on nanotechnology ; https://hal.science/hal-01745418 ; ieee transactions on nanotechnology, 2017, 16, pp.677 - 686. ⟨10.1109/tnano.2017.2703985⟩ 5 Treffer
- issn: 2156-342x 5 Treffer
- issn: 0018-9200 ; ieee journal of solid-state circuits ; https://hal.science/hal-00482751 ; ieee journal of solid-state circuits, 2008, 43 (3), pp.706-717. ⟨10.1109/jssc.2007.916618⟩ 4 Treffer
- issn: 1530-437x ; ieee sensors journal ; https://hal.science/hal-00981343 ; ieee sensors journal, 2014, 14 (5), pp.1617-1624. ⟨10.1109/jsen.2013.2295118⟩ 4 Treffer
- issn: 1530-437x ; ieee sensors journal ; https://hal.sorbonne-universite.fr/hal-01238701 ; ieee sensors journal, 2016, 16 (6), pp.1611-1620. ⟨10.1109/jsen.2015.2501347⟩ 4 Treffer
- issn: 1530-4388 ; ieee transactions on device and materials reliability ; https://hal.science/hal-01971932 ; ieee transactions on device and materials reliability, 2019, 19 (1), pp.6-15. ⟨10.1109/tdmr.2018.2886463⟩ 4 Treffer
- issn: 0018-9219 3 Treffer
- issn: 0018-9383 ; ieee transactions on electron devices ; https://hal.in2p3.fr/in2p3-01067535 ; ieee transactions on electron devices, 2014, 61, pp.2412-2418. ⟨10.1109/ted.2014.2320966⟩ 3 Treffer
- issn: 0018-9383 ; ieee transactions on electron devices ; https://hal.science/hal-02899947 ; ieee transactions on electron devices, 2020, 67 (6), pp.2263-2269. ⟨10.1109/ted.2020.2989726⟩ 3 Treffer
- issn: 0018-9383 ; ieee transactions on electron devices ; https://hal.science/hal-03371300 ; ieee transactions on electron devices, 2021, 68 (12), pp.5989-5994. ⟨10.1109/ted.2021.3115990⟩ 3 Treffer
- issn: 0018-9464 ; ieee transactions on magnetics ; https://hal.science/hal-03182667 ; ieee transactions on magnetics, 2021, 57 (3), ⟨10.1109/tmag.2020.3045137⟩ 3 Treffer
- issn: 0885-8985 ; ieee aerospace and electronic systems magazine ; https://hal.sorbonne-universite.fr/hal-03011751 ; ieee aerospace and electronic systems magazine, 2018, 33 (8), pp.24-29. ⟨10.1109/maes.2018.170149⟩ 3 Treffer
- issn: 0894-6507 ; ieee transactions on semiconductor manufacturing ; https://hal-emse.ccsd.cnrs.fr/emse-00498544 ; ieee transactions on semiconductor manufacturing, 2008, 21 (3), pp.352-357. ⟨10.1109/tsm.2008.2001209⟩ 3 Treffer
- issn: 1530-437x ; ieee sensors journal ; https://hal.science/hal-01467697 ; ieee sensors journal, 2012, 13 (1), pp.159-166. ⟨10.1109/jsen.2012.2211347⟩ 3 Treffer
- issn: 1530-437x ; ieee sensors journal ; https://ujm.hal.science/ujm-00122906 ; ieee sensors journal, 2005, 5, pp.1305-1309. ⟨10.1109/jsen.2005.858945⟩ 3 Treffer
- issn: 1556-6013 ; ieee transactions on information forensics and security ; https://hal.science/hal-01279172 ; ieee transactions on information forensics and security, 2016, ⟨10.1109/tifs.2016.2524666⟩ ; 3 Treffer
- issn: 0018-9383 ; ieee transactions on electron devices ; https://hal.science/hal-04296517 ; ieee transactions on electron devices, 2023, pp.1-7. ⟨10.1109/ted.2023.3321277⟩ 2 Treffer
- issn: 0018-9383 ; ieee transactions on electron devices ; https://hal.science/hal-01759435 ; ieee transactions on electron devices, 2008, 55 (9), pp.2443-2453. ⟨10.1109/ted.2008.927656⟩ 1 Treffer
- issn: 0018-9383 ; ieee transactions on electron devices ; https://hal.science/hal-04192324 ; ieee transactions on electron devices, 2023, 70 (11), pp.5814 - 5817. ⟨10.1109/ted.2023.3311415⟩ 1 Treffer
- issn: 0018-9499 ; ieee transactions on nuclear science ; https://amu.hal.science/hal-03575419 ; ieee transactions on nuclear science, 2022, 69 (3), pp.1-1. ⟨10.1109/tns.2022.3149160⟩ 1 Treffer
- issn: 0093-9994 1 Treffer
- issn: 1932-4545 1 Treffer
Sprache
Geographischer Bezug
754 Treffer
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In: ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-04192324 ; IEEE Transactions on Electron Devices, In press, ⟨10.1109/TED.2023.3311415⟩, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-04192324 ; IEEE Transactions on Electron Devices, 2023, 70 (11), pp.5814 - 5817. ⟨10.1109/TED.2023.3311415⟩, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-04192324 ; IEEE Transactions on Electron Devices, 2023, 70 (11), pp.5814 - 5817. ⟨10.1109/TED.2023.3311415⟩, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-04192324 ; IEEE Transactions on Electron Devices, 2023, 70 (11), pp.5814 - 5817. ⟨10.1109/TED.2023.3311415⟩, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9499 ; IEEE Transactions on Nuclear Science ; https://amu.hal.science/hal-04059844 ; IEEE Transactions on Nuclear Science, 2023, 70 (5), pp.782-791. ⟨10.1109/TNS.2023.3263106⟩, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9499, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9499 ; IEEE Transactions on Nuclear Science ; https://amu.hal.science/hal-04059844 ; IEEE Transactions on Nuclear Science, 2023, 70 (5), pp.782-791. ⟨10.1109/TNS.2023.3263106⟩, 2023Online academicJournalZugriff:
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In: ISSN: 0018-9200 ; IEEE Journal of Solid-State Circuits ; https://hal.science/hal-03514856 ; IEEE Journal of Solid-State Circuits, 2022, 57, pp 1409-1420. ⟨10.1109/JSSC.2022.3140905⟩, 2022Online academicJournalZugriff:
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In: ISSN: 0018-9200 ; IEEE Journal of Solid-State Circuits ; https://hal.science/hal-03514856 ; IEEE Journal of Solid-State Circuits, 2022, 57, pp 1409-1420. ⟨10.1109/JSSC.2022.3140905⟩, 2022Online academicJournalZugriff:
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In: ISSN: 0018-9200 ; IEEE Journal of Solid-State Circuits ; https://hal.science/hal-03514856 ; IEEE Journal of Solid-State Circuits, 2022, 57, pp 1409-1420. ⟨10.1109/JSSC.2022.3140905⟩, 2022Online academicJournalZugriff:
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In: ISSN: 0018-9480 ; IEEE Transactions on Microwave Theory and Techniques ; https://cea.hal.science/cea-03637109 ; IEEE Transactions on Microwave Theory and Techniques, In press, ⟨10.1109/TMTT.2022.3162296⟩, 2022Online academicJournalZugriff:
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In: ISSN: 0018-9200 ; IEEE Journal of Solid-State Circuits ; https://hal.science/hal-03514856 ; IEEE Journal of Solid-State Circuits, 2022, 57, pp 1409-1420. ⟨10.1109/JSSC.2022.3140905⟩, 2022Online academicJournalZugriff:
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In: ISSN: 0018-9499, 2020Online academicJournalZugriff:
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In: ISSN: 0018-9499, 2020Online academicJournalZugriff:
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In: ISSN: 0018-9499 ; IEEE Transactions on Nuclear Science ; https://hal.archives-ouvertes.fr/hal-02536143 ; IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (2), pp.455-463. ⟨10.1109/TNS.2020.2964333⟩, 2020Online academicJournalZugriff:
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In: ISSN: 1530-4388 ; IEEE Transactions on Device and Materials Reliability ; https://hal.science/hal-01971932 ; IEEE Transactions on Device and Materials Reliability, 2019, 2019academicJournalZugriff:
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In: ISSN: 1530-4388 ; IEEE Transactions on Device and Materials Reliability ; https://hal.science/hal-01971932 ; IEEE Transactions on Device and Materials Reliability, 2019, 2019academicJournalZugriff:
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In: ISSN: 1530-4388 ; IEEE Transactions on Device and Materials Reliability ; https://hal.science/hal-01971932 ; IEEE Transactions on Device and Materials Reliability, 2019, 2019academicJournalZugriff:
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In: ISSN: 1530-4388 ; IEEE Transactions on Device and Materials Reliability ; https://hal.science/hal-01971932 ; IEEE Transactions on Device and Materials Reliability, 2019, 2019academicJournalZugriff:
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In: ISSN: 1530-4388 ; IEEE Transactions on Device and Materials Reliability ; https://hal.science/hal-01971932 ; IEEE Transactions on Device and Materials Reliability, 2019, 2019academicJournalZugriff: