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Artikel & mehr
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Suchergebnisse einschränken oder erweitern
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics 23 Treffer
- [spi]engineering sciences [physics] 20 Treffer
- [spi.tron]engineering sciences [physics]/electronics 19 Treffer
- [phys.phys.phys-ins-det]physics [physics]/physics [physics]/instrumentation and detectors [physics.ins-det] 8 Treffer
- atlas 8 Treffer
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45 weitere Werte:
- efficiency 8 Treffer
- particle tracking detectors 8 Treffer
- performance 8 Treffer
- radiation-hard detectors 8 Treffer
- semiconductor detector: pixel 8 Treffer
- accuracy 5 Treffer
- background modeling 5 Treffer
- dispersion 5 Treffer
- electronics: readout 5 Treffer
- evaluation metric 5 Treffer
- f-measure 5 Treffer
- heart rate variability 5 Treffer
- integrated circuit: design 5 Treffer
- n: irradiation 5 Treffer
- noise 5 Treffer
- noncontact 5 Treffer
- particle detectors 5 Treffer
- photoplethysmography 5 Treffer
- precision 5 Treffer
- rbd 5 Treffer
- recall 5 Treffer
- semiconductor detector: technology 5 Treffer
- solid state detectors 5 Treffer
- tracking detector 5 Treffer
- [spi.opti]engineering sciences [physics]/optics / photonic 4 Treffer
- [spi.signal]engineering sciences [physics]/signal and image processing 3 Treffer
- analogue decoding 3 Treffer
- analogue electronic circuits 3 Treffer
- channel coding 3 Treffer
- cmos analogue integrated circuits 3 Treffer
- electronics: design 3 Treffer
- ir-drop 3 Treffer
- magnetic tunnel junction 3 Treffer
- passive mixer 3 Treffer
- power noise 3 Treffer
- power supply 3 Treffer
- radiation-hard electronics 3 Treffer
- sampling mixer 3 Treffer
- simulation 3 Treffer
- soft error 3 Treffer
- spin transfer torque 3 Treffer
- test 3 Treffer
- upgrade 3 Treffer
- digital cmos ic 2 Treffer
- 65nm 1 Treffer
Verlag
Publikation
- ieee international conference on artificial intellignence circuits and systems (aicas) ; https://hal.science/hal-02159142 ; ieee international conference on artificial intellignence circuits and systems (aicas), mar 2019, hsinshu, taiwan. ⟨10.1109/aicas.2019.8771544⟩ ; http://www.aicas2019.org/ 3 Treffer
- jinst ; 9th international workshop on semiconductor pixel detectors for particles and imaging ; https://hal.science/hal-02065863 ; 9th international workshop on semiconductor pixel detectors for particles and imaging, dec 2018, taipei, taiwan. pp.c06006, ⟨10.1088/1748-0221/14/06/c06006⟩ 1 Treffer
Sprache
Geographischer Bezug
64 Treffer
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In: ITC-Asia 2022 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770182 ; ITC-Asia 2022 - IEEE International Test Conference in Asian, Aug 2022, Taipei, Taiwan. pp.73-78, ⟨10.1109/ITCAsia55616.2022.00023⟩, 2022Online KonferenzZugriff:
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In: ITC-Asia 2022 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770182 ; ITC-Asia 2022 - IEEE International Test Conference in Asian, Aug 2022, Taipei, Taiwan. pp.73-78, ⟨10.1109/ITCAsia55616.2022.00023⟩, 2022Online KonferenzZugriff:
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In: ITC-Asia 2022 - IEEE International Test Conference in Asian ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770182 ; ITC-Asia 2022 - IEEE International Test Conference in Asian, Aug 2022, Taipei, Taiwan. pp.73-78, ⟨10.1109/ITCAsia55616.2022.00023⟩, 2022Online KonferenzZugriff:
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In: Microwave Conference Proceedings (APMC), 2012 Asia-Pacific ; 2012 Asia Pacific Microwave Conference ; https://hal.science/hal-00783042 ; 2012 Asia Pacific Microwave Conference, Dec 2012, Kaohsiung, Taiwan. p1 - 3, ⟨10.1109/APMC.2012.6421533⟩, 2012Online KonferenzZugriff:
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In: Microwave Conference Proceedings (APMC), 2012 Asia-Pacific ; 2012 Asia Pacific Microwave Conference ; https://hal.science/hal-00783042 ; 2012 Asia Pacific Microwave Conference, Dec 2012, Kaohsiung, Taiwan. p1 - 3, ⟨10.1109/APMC.2012.6421533⟩, 2012Online KonferenzZugriff:
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In: Microwave Conference Proceedings (APMC), 2012 Asia-Pacific ; 2012 Asia Pacific Microwave Conference ; https://hal.archives-ouvertes.fr/hal-00783042 ; 2012 Asia Pacific Microwave Conference, Dec 2012, Kaohsiung, Taiwan. p1 - 3, ⟨10.1109/APMC.2012.6421533⟩, 2012Online KonferenzZugriff:
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In: Proceding of ISCAS 2009 ; 2009 IEEE International Symposium on Circuits and Systems ; https://hal.archives-ouvertes.fr/hal-00363758 ; 2009 IEEE International Symposium on Circuits and Systems, May 2009, Taipei, Taiwan. 4 p, 2009KonferenzZugriff:
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In: 30th International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2016 ; https://hal.science/hal-03224659 ; 30th International Instrumentation and Meausurement Technology Conference, 2016KonferenzZugriff:
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In: 30th International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2016 ; https://hal.science/hal-03224659 ; 30th International Instrumentation and Meausurement Technology Conference, 2016KonferenzZugriff:
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In: 30th International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2016 ; https://hal.science/hal-03224659 ; 30th International Instrumentation and Meausurement Technology Conference, 2016KonferenzZugriff:
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In: 30th International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2016 ; https://hal.archives-ouvertes.fr/hal-03224659 ; 30th International Instrumentation and Meausurement Technology Conference, 2016KonferenzZugriff:
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In: 30th International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2016 ; https://hal.science/hal-03224659 ; 30th International Instrumentation and Meausurement Technology Conference, 2016KonferenzZugriff:
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In: 22nd Asian Test Symposium, 2013Online KonferenzZugriff:
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In: 22nd Asian Test Symposium, 2013Online KonferenzZugriff:
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In: 22nd Asian Test Symposium, 2013Online KonferenzZugriff:
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In: Proceedings IEEE International Symposium on Circuits And Systems, Taiwan ; IEEE International Symposium on Circuits And Systems, 2009KonferenzZugriff:
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In: Proceedings IEEE International Symposium on Circuits And Systems, Taiwan ; IEEE International Symposium on Circuits And Systems, 2009KonferenzZugriff:
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In: Proceedings IEEE International Symposium on Circuits And Systems, Taiwan ; IEEE International Symposium on Circuits And Systems, 2009KonferenzZugriff:
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In: ATS 2022 - 31st IEEE Asian Test Symposium ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770951 ; ATS 2022 - 31st IEEE Asian Test Symposium, Nov 2022, Taichung, Taiwan. ⟨10.1109/ATS56056.2022.00013⟩ ; https://ats2022.ee.nthu.edu.tw/, 2022Online KonferenzZugriff:
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In: ATS 2022 - 31st IEEE Asian Test Symposium ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770951 ; ATS 2022 - 31st IEEE Asian Test Symposium, Nov 2022, Taichung, Taiwan. ⟨10.1109/ATS56056.2022.00013⟩ ; https://ats2022.ee.nthu.edu.tw/, 2022Online KonferenzZugriff: