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  1. Lefèvre, Julia ; Debaud, Philippe ; et al.
    In: ITC 2023 - IEEE International Test Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240449 ; ITC 2023 - IEEE International Test Conference, Oct 2023, Anaheim, United States, 2023
    Online Konferenz
  2. Lefèvre, Julia ; Debaud, Philippe ; et al.
    In: ITC 2023 - IEEE International Test Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240449 ; ITC 2023 - IEEE International Test Conference, Oct 2023, Anaheim, United States, 2023
    Online Konferenz
  3. Siligaris, Alexandre ; Courouve, Pierre ; et al.
    In: 2023 IEEE 23rd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems ; https://cea.hal.science/cea-04228432 ; 2023 IEEE 23rd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, Jan 2023, Las Vegas, United States. ⟨10.1109/SiRF56960.2023.10046233⟩ ; https://ieeexplore.ieee.org/document/10046233, 2023
    Online Konferenz
  4. Lefèvre, Julia ; Debaud, Philippe ; et al.
    In: ITC 2023 - IEEE International Test Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240449 ; ITC 2023 - IEEE International Test Conference, Oct 2023, Anaheim, United States, 2023
    Online Konferenz
  5. Yan, Aibin ; Wei, Shaojie ; et al.
    In: ISCAS 2023 - IEEE International Symposium on Circuits and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241285 ; ISCAS 2023 - IEEE International Symposium on Circuits and Systems, May 2023, Monterey, 2023
    Online Konferenz
  6. Yan, Aibin ; Wei, Shaojie ; et al.
    In: ISCAS 2023 - IEEE International Symposium on Circuits and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241285 ; ISCAS 2023 - IEEE International Symposium on Circuits and Systems, May 2023, Monterey, 2023
    Online Konferenz
  7. Yan, Aibin ; Wei, Shaojie ; et al.
    In: ISCAS 2023 - IEEE International Symposium on Circuits and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241285 ; ISCAS 2023 - IEEE International Symposium on Circuits and Systems, May 2023, Monterey, 2023
    Online Konferenz
  8. Le Ravallec, Antoine ; Garcia, Patrice ; et al.
    In: Radio Frequency Integrated Circuits Symposium / International Microwave Symposium ; https://hal.science/hal-03727320 ; Radio Frequency Integrated Circuits Symposium / International Microwave Symposium, Jun 2022, Denver, United States, 2022
    Online Konferenz
  9. Le Ravallec, Antoine ; Garcia, Patrice ; et al.
    In: Radio Frequency Integrated Circuits Symposium / International Microwave Symposium ; https://hal.science/hal-03727320 ; Radio Frequency Integrated Circuits Symposium / International Microwave Symposium, Jun 2022, Denver, United States, 2022
    Online Konferenz
  10. Garba-Seybou, Tidjani ; Federspiel, Xavier ; et al.
    In: 2022 IEEE International Reliability Physics Symposium (IRPS) ; IEEE International Reliability Physics Symposium (IRPS 2022) ; https://hal.science/hal-03999581 ; IEEE International Reliability Physics Symposium (IRPS 2022), Mar 2022, Dallas, TX (en ligne), United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩, 2022
    Online Konferenz
  11. Garba-Seybou, Tidjani ; Federspiel, Xavier ; et al.
    In: 2022 IEEE International Reliability Physics Symposium (IRPS) ; https://hal.science/hal-03659269 ; 2022 IEEE International Reliability Physics Symposium (IRPS), Mar 2022, Dallas, United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩, 2022
    Online Konferenz
  12. Garba-Seybou, Tidjani ; Federspiel, Xavier ; et al.
    In: 2022 IEEE International Reliability Physics Symposium (IRPS) ; IEEE International Reliability Physics Symposium (IRPS 2022) ; https://hal.science/hal-03999581 ; IEEE International Reliability Physics Symposium (IRPS 2022), Mar 2022, Dallas, TX (en ligne), United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩, 2022
    Online Konferenz
  13. Garba-Seybou, Tidjani ; Federspiel, Xavier ; et al.
    In: 2022 IEEE International Reliability Physics Symposium (IRPS) ; https://hal.science/hal-03659269 ; 2022 IEEE International Reliability Physics Symposium (IRPS), Mar 2022, Dallas, United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩, 2022
    Online Konferenz
  14. Garba-Seybou, Tidjani ; Federspiel, Xavier ; et al.
    In: 2022 IEEE International Reliability Physics Symposium (IRPS) ; IEEE International Reliability Physics Symposium (IRPS 2022) ; https://hal.science/hal-03999581 ; IEEE International Reliability Physics Symposium (IRPS 2022), Mar 2022, Dallas, TX (en ligne), United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩, 2022
    Online Konferenz
  15. Garba-Seybou, Tidjani ; Federspiel, Xavier ; et al.
    In: 2022 IEEE International Reliability Physics Symposium (IRPS) ; https://hal.science/hal-03659269 ; 2022 IEEE International Reliability Physics Symposium (IRPS), Mar 2022, Dallas, United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩, 2022
    Online Konferenz
  16. Gao, S. ; Issartel, D. ; et al.
    In: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ; https://shs.hal.science/halshs-03515486 ; 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.301-304, ⟨10.1109/SISPAD54002.2021.9592555⟩, 2021
    Online Konferenz
  17. Gao, S. ; Issartel, D. ; et al.
    In: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ; https://shs.hal.science/halshs-03515486 ; 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.301-304, ⟨10.1109/SISPAD54002.2021.9592555⟩, 2021
    Online Konferenz
  18. Gao, S. ; Issartel, D. ; et al.
    In: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ; https://shs.hal.science/halshs-03515486 ; 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.301-304, ⟨10.1109/SISPAD54002.2021.9592555⟩, 2021
    Online Konferenz
  19. Gao, S. ; Issartel, D. ; et al.
    In: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ; https://shs.hal.science/halshs-03515486 ; 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.301-304, ⟨10.1109/SISPAD54002.2021.9592555⟩, 2021
    Online Konferenz
  20. Gao, S. ; Issartel, D. ; et al.
    In: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ; https://shs.hal.science/halshs-03515486 ; 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.301-304, ⟨10.1109/SISPAD54002.2021.9592555⟩, 2021
    Online Konferenz
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