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Weniger Treffer
Gefunden in
Schlagwort
- materials science 13 Treffer
- business 7 Treffer
- business.industry 7 Treffer
- mosfet 5 Treffer
- quantum tunnelling 4 Treffer
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45 weitere Werte:
- threshold voltage 4 Treffer
- electrical engineering 3 Treffer
- ferromagnetism 3 Treffer
- optoelectronics 3 Treffer
- plasma 3 Treffer
- 01 natural sciences 2 Treffer
- 0103 physical sciences 2 Treffer
- 010302 applied physics 2 Treffer
- 02 engineering and technology 2 Treffer
- 0210 nano-technology 2 Treffer
- 021001 nanoscience & nanotechnology 2 Treffer
- annealing (metallurgy) 2 Treffer
- biotechnology 2 Treffer
- chemistry 2 Treffer
- chemistry.chemical_compound 2 Treffer
- coercivity 2 Treffer
- computer science::hardware architecture 2 Treffer
- condensed matter::mesoscopic systems and quantum hall effect 2 Treffer
- electrical and electronic engineering 2 Treffer
- electron 2 Treffer
- electronic engineering 2 Treffer
- electronic, optical and magnetic materials 2 Treffer
- layer (electronics) 2 Treffer
- metal gate 2 Treffer
- passivation 2 Treffer
- quantum dot 2 Treffer
- quantum well 2 Treffer
- static random-access memory 2 Treffer
- subthreshold conduction 2 Treffer
- and gate 1 Treffer
- astrophysics::high energy astrophysical phenomena 1 Treffer
- atomic force microscopy 1 Treffer
- ballistic conduction 1 Treffer
- band gap 1 Treffer
- capacitance 1 Treffer
- cmos 1 Treffer
- communication channel 1 Treffer
- computational physics 1 Treffer
- computer science::emerging technologies 1 Treffer
- computingmethodologies_documentandtextprocessing 1 Treffer
- computingmethodologies_symbolicandalgebraicmanipulation 1 Treffer
- condensed matter::materials science 1 Treffer
- conductance 1 Treffer
- congenital, hereditary, and neonatal diseases and abnormalities 1 Treffer
- coulomb blockade 1 Treffer
Publikation
- digest of intermag 2003. international magnetics conference (cat. no.03ch37401) 2 Treffer
- ieee journal of the electron devices society 2 Treffer
- 1999 57th annual device research conference digest (cat. no.99th8393) 1 Treffer
- 2001 6th international conference on solid-state and integrated circuit technology. proceedings (cat. no.01ex443) 1 Treffer
- 2006 international electron devices meeting 1 Treffer
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8 weitere Werte:
- 2007 international conference on electrical machines and systems (icems) 1 Treffer
- 2007 international semiconductor device research symposium 1 Treffer
- 2010 international electron devices meeting 1 Treffer
- 2011 international reliability physics symposium 1 Treffer
- 2011 xxxth ursi general assembly and scientific symposium 1 Treffer
- 2014 ieee international reliability physics symposium 1 Treffer
- 4th ieee international conference on vacuum electronics, 2003 1 Treffer
- international semiconductor device research symposium, 2003 1 Treffer
Sprache
15 Treffer
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In: IEEE Journal of the Electron Devices Society, Jg. 9 (2021), S. 209-214Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 9 (2021), S. 42-48Online unknownZugriff:
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In: 2014 IEEE International Reliability Physics Symposium, 2014-06-01Online unknownZugriff:
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In: 2011 XXXth URSI General Assembly and Scientific Symposium, 2011-08-01Online unknownZugriff:
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In: 2011 International Reliability Physics Symposium, 2011-04-01Online unknownZugriff:
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In: 2010 International Electron Devices Meeting, 2010-12-01Online unknownZugriff:
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In: 2007 International Semiconductor Device Research Symposium, 2007-12-01Online unknownZugriff:
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In: 2007 International Conference on Electrical Machines and Systems (ICEMS), 2007-10-01Online unknownZugriff:
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In: 2006 International Electron Devices Meeting, 2006Online unknownZugriff:
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In: 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443), 2005-08-25Online unknownZugriff:
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In: 4th IEEE International Conference on Vacuum Electronics, 2003, 2004-07-08Online unknownZugriff:
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In: International Semiconductor Device Research Symposium, 2003, 2004-07-08Online unknownZugriff:
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In: Digest of INTERMAG 2003. International Magnetics Conference (Cat. No.03CH37401), 2004-03-30Online unknownZugriff:
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Effect of surface roughness on plasma oxidation behavior of Al layer and tunneling magnetoresistanceIn: Digest of INTERMAG 2003. International Magnetics Conference (Cat. No.03CH37401), 2004-03-23Online unknownZugriff:
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In: 1999 57th Annual Device Research Conference Digest (Cat. No.99TH8393), 2003-01-20Online unknownZugriff: