Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Schlagwort
- cmos 25 Treffer
- hardware_integratedcircuits 19 Treffer
- law 19 Treffer
- law.invention 19 Treffer
- electrical engineering 18 Treffer
-
45 weitere Werte:
- electronic engineering 17 Treffer
- biotechnology 13 Treffer
- condensed matter physics 13 Treffer
- hardware_performanceandreliability 13 Treffer
- 02 engineering and technology 10 Treffer
- lcsh:electrical engineering. electronics. nuclear engineering 10 Treffer
- lcsh:tk1-9971 10 Treffer
- optoelectronics 9 Treffer
- 01 natural sciences 8 Treffer
- 0103 physical sciences 8 Treffer
- logic gate 8 Treffer
- surfaces, coatings and films 8 Treffer
- 010302 applied physics 7 Treffer
- hardware_logicdesign 7 Treffer
- integrated circuit 7 Treffer
- materials science 7 Treffer
- transistor 7 Treffer
- 0210 nano-technology 6 Treffer
- 021001 nanoscience & nanotechnology 6 Treffer
- atomic and molecular physics, and optics 6 Treffer
- safety, risk, reliability and quality 6 Treffer
- electrostatic discharge 5 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 4 Treffer
- capacitance 4 Treffer
- chip 4 Treffer
- computer science 4 Treffer
- electronic circuit 4 Treffer
- mosfet 4 Treffer
- silicon on insulator 4 Treffer
- 020208 electrical & electronic engineering 3 Treffer
- bicmos 3 Treffer
- diode 3 Treffer
- electronic 3 Treffer
- hardware_general 3 Treffer
- industrial and manufacturing engineering 3 Treffer
- instrumentation 3 Treffer
- integrated circuit layout 3 Treffer
- optical and magnetic materials 3 Treffer
- pixel 3 Treffer
- simulation 3 Treffer
- system testing 3 Treffer
- voltage 3 Treffer
- 010308 nuclear & particles physics 2 Treffer
- 020202 computer hardware & architecture 2 Treffer
- application-specific integrated circuit 2 Treffer
Publikation
- ieee journal of the electron devices society 10 Treffer
- proceedings of the 7th european symposium on reliability of electron devices, failure physics and analysis 2 Treffer
- 1993 international symposium on vlsi technology, systems, and applications proceedings of technical papers 1 Treffer
- 2004 ieee international reliability physics symposium. proceedings 1 Treffer
- 2006 ieee/rsj international conference on intelligent robots and systems 1 Treffer
-
11 weitere Werte:
- 2007 18th european conference on circuit theory and design 1 Treffer
- 2007 ieee symposium on vlsi circuits 1 Treffer
- 2011 proceedings of the european solid-state device research conference (essderc) 1 Treffer
- 2014 ieee hot chips 26 symposium (hcs) 1 Treffer
- 2016 ieee international nanoelectronics conference (inec) 1 Treffer
- 2016 mixdes - 23rd international conference mixed design of integrated circuits and systems 1 Treffer
- electrical overstress/electrostatic discharge symposium proceedings 1 Treffer
- icmts 93 proceedings of the 1993 international conference on microelectronic test structures 1 Treffer
- international conference on microelectronic test structures, 2003. 1 Treffer
- iscas'99. proceedings of the 1999 ieee international symposium on circuits and systems vlsi (cat. no.99ch36349) 1 Treffer
- proceedings of 35th european solid-state device research conference, 2005. essderc 2005. 1 Treffer
Sprache
33 Treffer
-
In: IEEE Journal of the Electron Devices Society, Jg. 9 (2021), S. 415-423Online unknownZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 8 (2020), S. 27-32Online unknownZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 5 (2017), Heft 5, S. 299-305Online unknownZugriff:
-
In: 2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems, 2016-06-01Online unknownZugriff:
-
A perpetuum mobile 32bit CPU on 65nm SOTB CMOS technology with reverse-body-bias assisted sleep modeIn: 2014 IEEE Hot Chips 26 Symposium (HCS), 2014-08-01Online unknownZugriff:
-
In: 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC), 2011-09-01Online unknownZugriff:
-
In: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC, 2005-12-13Online unknownZugriff:
-
In: Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2005-08-29Online unknownZugriff:
-
In: ISCAS'99. Proceedings of the 1999 IEEE International Symposium on Circuits and Systems VLSI (Cat. No.99CH36349), 2003-01-20Online unknownZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 6 (2018), S. 55-62Online unknownZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 4 (2016), Heft 5, S. 227-235Online unknownZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 5 (2017), Heft 1, S. 90-94Online unknownZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 5 (2017), Heft 1, S. 59-63Online unknownZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 4 (2016), Heft 5, S. 236-245Online unknownZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 1 (2013), Heft 11, S. 181-190Online unknownZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 3 (2015), Heft 2, S. 73-77Online unknownZugriff:
-
In: 2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems, 2016-06-01Online unknownZugriff:
-
In: 2007 18th European Conference on Circuit Theory and Design, 2007-08-01Online unknownZugriff: