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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- computer vision 4 Treffer
- chaotic systems 3 Treffer
- components, circuits, devices and systems 3 Treffer
- computing and processing 3 Treffer
- deep learning 3 Treffer
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45 weitere Werte:
- engineered materials, dielectrics and plasmas 3 Treffer
- signal processing and analysis 3 Treffer
- smart farming 3 Treffer
- aerospace 2 Treffer
- biology 2 Treffer
- biology.organism_classification 2 Treffer
- business 2 Treffer
- business.industry 2 Treffer
- chemistry 2 Treffer
- chemistry.chemical_compound 2 Treffer
- communication, networking and broadcast technologies 2 Treffer
- electrical engineering. electronics. nuclear engineering 2 Treffer
- general topics for engineers 2 Treffer
- image quality 2 Treffer
- inverter 2 Treffer
- materials science 2 Treffer
- petroleum 2 Treffer
- power, energy and industry applications 2 Treffer
- pretreatment 2 Treffer
- robotics and control systems 2 Treffer
- tk1-9971 2 Treffer
- adaptive control 1 Treffer
- artificial intelligence 1 Treffer
- backward diode 1 Treffer
- band pass filters 1 Treffer
- base (chemistry) 1 Treffer
- biodegradable materials 1 Treffer
- bioengineering 1 Treffer
- breakdown voltage 1 Treffer
- chaos theory 1 Treffer
- chemistry.chemical_classification 1 Treffer
- chromatography 1 Treffer
- circuits 1 Treffer
- classification algorithms 1 Treffer
- combustible gas 1 Treffer
- computer science 1 Treffer
- contrast resolution 1 Treffer
- control system synthesis 1 Treffer
- control systems 1 Treffer
- dark-field 1 Treffer
- degradation 1 Treffer
- dielectric liquids 1 Treffer
- dielectric materials 1 Treffer
- dielectrics and electrical insulation 1 Treffer
- digital image processing 1 Treffer
Publikation
- 2006 ieee conference on electrical insulation and dielectric phenomena 1 Treffer
- 2006 ieee conference on electrical insulation and dielectric phenomena, electrical insulation and dielectric phenomena, 2006 ieee conference on 1 Treffer
- 2011 ieee international conference of electron devices and solid-state circuits 1 Treffer
- 2011 ieee international conference of electron devices and solid-state circuits, electron devices and solid-state circuits (edssc), 2011 international conference of 1 Treffer
- 2012 fourth international workshop on quality of multimedia experience 1 Treffer
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7 weitere Werte:
- 2012 fourth international workshop on quality of multimedia experience, quality of multimedia experience (qomex), 2012 fourth international workshop on 1 Treffer
- 2012 ieee colloquium on humanities, science & engineering (chuser) 1 Treffer
- 2012 ieee colloquium on humanities, science and engineering (chuser) 1 Treffer
- 2012 ieee colloquium on humanities, science and engineering (chuser), humanities, science and engineering (chuser), 2012 ieee colloquium on 1 Treffer
- ieee access 1 Treffer
- ieee access, access, ieee 1 Treffer
- sice annual conference 2007, sice, 2007 annual conference 1 Treffer
Sprache
11 Treffer
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In: IEEE Access, Jg. 11 (2023), S. 65849-65857Online academicJournalZugriff:
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In: 2012 IEEE Colloquium on Humanities, Science and Engineering (CHUSER), 2012-12-01, S. 752-755KonferenzZugriff:
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In: 2012 Fourth International Workshop on Quality of Multimedia Experience, 2012-07-01, S. 260-265KonferenzZugriff:
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In: IEEE Access, Jg. 11 (2023), S. 65849-65857Online academicJournalZugriff:
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In: 2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena, 2006-10-01, S. 162KonferenzZugriff:
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In: 2011 IEEE International Conference of Electron Devices and Solid-State Circuits, 2011-11-01, S. 1-2KonferenzZugriff:
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In: 2012 IEEE Colloquium on Humanities, Science and Engineering (CHUSER), 2012-12-01Online unknownZugriff:
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In: 2012 Fourth International Workshop on Quality of Multimedia Experience, 2012-07-01Online unknownZugriff:
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In: 2011 IEEE International Conference of Electron Devices and Solid-State Circuits, 2011-11-01Online unknownZugriff:
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In: 2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena, 2006-10-01Online unknownZugriff:
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In: SICE Annual Conference 2007, 2007-09-01, S. 1299KonferenzZugriff: