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Weniger Treffer
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- cmos 53 Treffer
- complementary metal oxide semiconductors -- research 49 Treffer
- complementary metal oxide semiconductors -- usage 23 Treffer
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- integrated circuits -- research 19 Treffer
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45 weitere Werte:
- standard ic 17 Treffer
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- technology application 10 Treffer
- integrated circuits -- design and construction 9 Treffer
- logic circuitry 9 Treffer
- testing 9 Treffer
- algorithm 8 Treffer
- embedded system 8 Treffer
- gates 8 Treffer
- scientific research 8 Treffer
- semiconductor industry -- research 8 Treffer
- system on a chip 8 Treffer
- adders 7 Treffer
- complementary metal oxide semiconductors -- technology application 7 Treffer
- very-large-scale integration 7 Treffer
- circuit designer 6 Treffer
- integrated circuit fabrication 6 Treffer
- integrated circuits -- analysis 6 Treffer
- modeling 6 Treffer
- mos integrated circuits 6 Treffer
- ram 6 Treffer
- semiconductor chips 6 Treffer
- semiconductor device 6 Treffer
- bipolar integrated circuits 5 Treffer
- complementary metal oxide semiconductors -- models 5 Treffer
- computer-aided design 5 Treffer
- semiconductor chips -- design and construction 5 Treffer
- algorithms -- research 4 Treffer
- analog integrated circuits -- research 4 Treffer
- bicmos 4 Treffer
- circuit design -- analysis 4 Treffer
- complementary metal oxide semiconductors -- innovations 4 Treffer
- complementary metal oxide semiconductors -- structure 4 Treffer
- computer arithmetic 4 Treffer
- embedded systems -- research 4 Treffer
- gate arrays 4 Treffer
- layout 4 Treffer
- metal oxide semiconductor field effect transistors -- research 4 Treffer
- optimization 4 Treffer
- research and development 4 Treffer
- semiconductor chips -- analysis 4 Treffer
Publikation
Sprache
222 Treffer
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In: IEEE Transactions on Computers, Jg. v43 (1994-04-01), Heft n4, S. 460-469Online academicJournalZugriff:
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In: IEEE Transactions on Computers, Jg. v43 (1994-04-01), Heft n4, S. 385-399Online academicJournalZugriff:
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In: IEEE Transactions on Computers, Jg. v42 (1993-12-01), Heft n12, S. 1510-1516Online academicJournalZugriff:
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In: Proceedings of the IEEE, Jg. v81 (1993-09-01), Heft n9, S. 1311-1324Online academicJournalZugriff:
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In: Proceedings of the IEEE, Jg. v81 (1993-05-01), Heft n5, S. 682-689Online academicJournalZugriff:
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In: IEEE Transactions on Computers, Jg. v41 (1992-12-01), Heft n12, S. 1612-1615Online academicJournalZugriff:
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In: IEEE Transactions on Computers, Jg. v39 (1990-08-01), Heft n8, S. 983-992Online academicJournalZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 33 (2014-04-01), Heft 4, S. 495-506Online academicJournalZugriff:
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In: IEEE Transactions on Computers, Jg. 62 (2013-12-01), Heft 12, S. 2382-2396Online academicJournalZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 32 (2013-06-01), Heft 6, S. 869-880Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 62 (2013-05-01), Heft 5, S. 1065-1072Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 61 (2012-09-01), Heft 9, S. 2581-2590Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 61 (2012-08-01), Heft 8, S. 2212-2221Online academicJournalZugriff:
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In: IEEE Communications Magazine, Jg. 50 (2012-04-01), Heft 4, S. 136-144Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 61 (2012-03-01), Heft 3, S. 729-739Online academicJournalZugriff:
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Integrated polarization - analyzing CMOS image sensor for detecting the incoming light ray directionIn: IEEE Transactions on Instrumentation & Measurement, Jg. 60 (2011-08-01), Heft 8, S. 2759-2767Online academicJournalZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 30 (2011-04-01), Heft 4, S. 574-583Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 59 (2010-12-01), Heft 12, S. 3270-3278Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 59 (2010-08-01), Heft 8, S. 2076-2082Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 59 (2010-08-01), Heft 8, S. 2015-2025Online academicJournalZugriff: