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In: IEEE Electron Device Letters, Jg. 44 (2023-06-01), S. 887-890Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 43 (2022), S. 52-55Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 42 (2021-10-01), S. 1488-1491Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 42 (2021-12-01), S. 1849-1852Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 44 (2023-05-01), S. 789-792Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 44 (2023-03-01), S. 532-535Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 42 (2021-08-01), S. 1244-1247Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 42 (2021-07-01), S. 1045-1048Online unknownZugriff:
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Highly Sensitive DNA Detection Beyond the Debye Screening Length Using CMOS Field Effect TransistorsIn: IEEE Electron Device Letters, Jg. 42 (2021-08-01), S. 1220-1223Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 42 (2021-04-01), S. 541-544Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 42 (2021), S. 110-113Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 42 (2021), S. 78-81Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 44 (2023), S. 136-139Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 44 (2023), S. 100-103Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 42 (2021-02-01), S. 196-199Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 42 (2021-02-01), S. 232-235Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 43 (2022-11-01), S. 1798-1801Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 43 (2022-10-01), S. 1713-1716Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 43 (2022-10-01), S. 1697-1700Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 43 (2022-09-01), S. 1551-1554Online unknownZugriff: