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- finite element method 1 Treffer
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- image reconstruction 1 Treffer
- image registration 1 Treffer
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- infrared imaging 1 Treffer
- infrared microscopy 1 Treffer
- infrared radiation 1 Treffer
- integrated circuits 1 Treffer
- lamotrigine 1 Treffer
- low pressure (science) 1 Treffer
- mechanical behavior of materials 1 Treffer
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- motion 1 Treffer
- multiple correspondence analysis (statistics) 1 Treffer
- noise measurement 1 Treffer
- orthogonal decompositions 1 Treffer
- oxygen 1 Treffer
- polycrystals 1 Treffer
- proper orthogonal decomposition 1 Treffer
- python programming language 1 Treffer
- quaternion functions 1 Treffer
- scalar field theory 1 Treffer
- scanning electron microscopes 1 Treffer
- shear waves 1 Treffer
- spacetime 1 Treffer
- spectral sensitivity 1 Treffer
Publikation
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11 Treffer
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In: Journal of The Electrochemical Society, Jg. 164 (2017-06-01), Heft 7, S. B321- (9S.)academicJournalZugriff:
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In: Measurement Science & Technology, Jg. 32 (2021-09-01), Heft 9, S. 1-13academicJournalZugriff:
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In: Measurement Science & Technology, Jg. 25 (2014-05-01), Heft 5, S. 55903-55911academicJournalZugriff:
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Characterization of SEM speckle pattern marking and imaging distortion by digital image correlation.In: Measurement Science & Technology, Jg. 25 (2014), Heft 1, S. 15401-15412academicJournalZugriff:
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In: Measurement Science & Technology, Jg. 31 (2020-02-01), Heft 2, S. 1-1academicJournalZugriff:
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In: Measurement Science & Technology, Jg. 30 (2019-03-01), Heft 3, S. 1-1academicJournalZugriff:
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In: Measurement Science & Technology, Jg. 29 (2018-12-01), Heft 12, S. 1-1academicJournalZugriff:
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In: Measurement Science & Technology, Jg. 29 (2018-02-01), Heft 2, S. 1-1academicJournalZugriff:
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In: Measurement Science & Technology, Jg. 28 (2017-09-01), Heft 9, S. 1-1academicJournalZugriff:
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In: Measurement Science & Technology, Jg. 27 (2016-09-01), Heft 9, S. 1-1academicJournalZugriff:
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In: Journal of Physics D: Applied Physics, Jg. 45 (2012-12-19), Heft 50, S. 1-1Online academicJournalZugriff: