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Ferroelectric Hf0.5Zr0.5O2 films with improved endurance obtained through low temperature epitaxial growth on seed layersElectronic supplementary information (ESI) available: XRD pole figures. XRD 2θ–χ maps measured with a 2D detector. Simulation of Laue fringes. XRD θ–2θ scans of the HZO films deposited on Si(001). Current–voltage loops measured in the HZO films deposited on STO(001). Current–voltage and the corresponding polarization–voltage loops of the HZO films deposited on Si(001). PUND measurements. Polarization–voltage loops measured in the pristine state and after the indicated number of cycles. Polarization retention measurements for films on STO(001). Leakage current curves measured in the pristine state and after the indicated number of cycles. See DOI: https://doi.org/10.1039/d2nr05935e

Song, Tingfeng ; Bachelet, Romain ; et al.

In: Nanoscale, Jg. 15 (2023), Heft 11, S. 5293-5299

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Effect of stoichiometry on the resistive switching characteristics of STO resistive memory

Hsu, Chih-Chieh ; Cheng, Chao-Wen ; et al.

In: Journal of materials chemistry.C, Jg. 11 (2023), Heft 31, S. 10651-10659

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Perovskite Al-SrTiO3 semiconductor electrolyte with superionic conduction in ceramic fuel cellsElectronic supplementary information (ESI) available: Fig. 1 exhibits the XRD patterns of Al-STO before and after testing, Fig. 2(a and b) show scanning electron microscopy images of STO and Al-STO at a 1 μm magnification scale, while (c) shows the HR-TEM image of Al : STO before testing, Fig. 3 shows the X-ray photoelectron spectroscopy (XPS) spectra of STO and Al-STO and Fig. 4(a and b) shows UV-visible absorption spectra of Al-STO before and after testing, while, (c and d) reveals the UPS spectra of Al : STO before and after testing, Tables 1 and 2 show the fitted parameters of EIS data. See https://doi.org/10.1039/d2se00643j

Shah, M. A. K. Yousaf ; Lu, Yuzheng ; et al.

In: Sustainable energy & fuels, Jg. 6 (2022), Heft 16, S. 3794-3805

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Large enhancement of ferroelectric polarization in Hf0.5Zr0.5O2 films by low plasma energy pulsed laser depositionElectronic supplementary information (ESI) available: Sketches of the PAr and PO2 partial pressures used to grow the films. XRD θ–2θ scans of the series of films. Simulation of Laue oscillations. Thickness and growth rate as a function of PAr. XRD pole figures. Intensity of the o-(111) reflection, normalized to that of the STO(002) peak. The normalized o-(111) reflection. Leakage–voltage curves of films. See DOI: 10.1039/d1tc05387f

Song, Tingfeng ; Solanas, Raul ; et al.

In: Journal of materials chemistry.C, Jg. 10 (2022), Heft 3, S. 1084-1089

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Detailansicht für Treffer 5 öffnen

Thickness effect on the ferroelectric properties of La-doped HfO2 epitaxial films down to 4.5 nmElectronic supplementary information (ESI) available: XRD 2θ–χ maps and θ–2θ scans of films on Si(001). XRD reciprocal space maps. The wake-up effect of films on a STO substrate at lower voltages. The wake-up effect of films on Si(001). The leakage current of the films on Si(001). The polarization loops after different cycles. Normalized polarization of a t = 6.9 nm film on STO(001) as a function of the number of cycles. Endurance measurement at different cycling frequencies. Endurance and retention of a 6.9 nm film on Si(001). See DOI: 10.1039/d1tc02512k

Song, Tingfeng ; Bachelet, Romain ; et al.

In: Journal of materials chemistry.C, Jg. 9 (2021), Heft 36, S. 12224-12230

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Detailansicht für Treffer 6 öffnen

Interfacial acidity on the strontium titanate surface: a scaling paradigm and the role of the hydrogen bondThis manuscript has been authored by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. The United States Government retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for United States Government purposes. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan).Electronic supplementary information (ESI) available: Computations of STO surface stability, adsorption potential-energy-surface scan, alkanol adsorption structural and vibrational frequency data, discussion of van der Waals interactions and interfacial acidity, experimental X-ray diffraction, atomic force microscopy surface characterization data, separate file containing the atomic coordinates of all DFT-optimized structures. See DOI: 10.1039/d1cp03587h

Chapleski, Robert C. ; Chowdhury, Azhad U. ; et al.

In: Physical chemistry chemical physics, Jg. 23 (2021), Heft 41, S. 23478-23485

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Detailansicht für Treffer 7 öffnen

Interfacial acidity on the strontium titanate surface: a scaling paradigm and the role of the hydrogen bondThis manuscript has been authored by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. The United States Government retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for United States Government purposes. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan).Electronic supplementary information (ESI) available: Computations of STO surface stability, adsorption potential-energy-surface scan, alkanol adsorption structural and vibrational frequency data, discussion of van der Waals interactions and interfacial acidity, experimental X-ray diffraction, atomic force microscopy surface characterization data, separate file containing the atomic coordinates of all DFT-optimized structures. See DOI: 10.1039/d1cp03587h

Chapleski, Robert C. ; Chowdhury, Azhad U. ; et al.

In: Physical chemistry chemical physics, Jg. 23 (2021), Heft 41, S. 23478-23485

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Detailansicht für Treffer 8 öffnen

Atomic scale study of the oxygen annealing effect on piezoelectricity enhancement of (K, Na)NbO3 nanorodsElectronic supplementary information (ESI) available: TEM image of the cross section of a specific as-grown KNN nanorod along the [010] direction, high-resolution HAADF image of a specific as-grown KNN nanorod far away from the KNN/STO interface along [100], high-resolution HAADF image of an as-grown KNN nanorod including a 90° domain, atomic-resolution HAADF image of the specific annealed KNN/STO interface showing an anti-phase boundary, high-resolution ABF image of the annealed KNN/STO interface, and schematic of the unit cells of KNN nanorods before and after oxygen annealing using the same axes notation based on the measured lattice parameters. See DOI: 10.1039/d0tc03152f

Li, Luying ; Hu, Xiaokang ; et al.

In: Journal of materials chemistry.C, Jg. 8 (2020), Heft 44, S. 15830-15838

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Ferroelectric resistance switching in Pt/Fe/BiFeO3/SrRuO3/SrTiO3 heterostructuresPACS numbers: 77.55.Nv, 79.60.Jv, 73.40.-c, 62.20.me.Electronic supplementary information (ESI) available: The KPFM patterns of the SRO/STO and Pt/STO heterostructures, retentivity testing of the HRS and the LRS for the Pt/Fe/BFO/SRO heterostructure, temperature dependent I–V curves and retentivity measurements. See DOI: 10.1039/d0cp00124d

Zheng, Wanchao ; Wang, Yuchen ; et al.

In: Physical chemistry chemical physics, Jg. 22 (2020), Heft 23, S. 13277-13284

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Strain modulated magnetocaloric effect in (111) oriented La0.7Sr0.3MnO3–SrRuO3 superlatticesElectronic supplementary information (ESI) available: The zero-field-cooled field-dependent magnetization and polarized Raman spectra recorded at various temperatures of the (111)STO/[11-u.c.LSMO/3-u.c. SRO]×15 and (111)STO/[11-u.c.SRO/3-u.c.LSMO]×15 superlattices. See DOI: 10.1039/d0nr00620c

S. H., Roshna ; Prellier, W. ; et al.

In: Nanoscale, Jg. 12 (2020), Heft 8, S. 5151-5158

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Water adsorption, dissociation and oxidation on SrTiO3 and ferroelectric surfaces revealed by ambient pressure X-ray photoelectron spectroscopyElectronic supplementary information (ESI) available: Section A: Fig. S1: piezoresponse force microscopy characterization of ferroelectric thin films showing the as grown down homogeneous polarization state. Fig. S2: XPS spectra of C1s and O1s regions for SrTiO3 single crystals during the cleaning process by annealing in O2 pressure at high temperatures. Section B: detailed description of the fitting methodology for the O1s region and the attenuation model. Fig. S3: decomposition of the XPS spectrum of the O1s region for STO at all pressures (shown in Fig. 1a, with the results plotted in Fig. 3a) and T (results plotted in Fig. 3b). Table S1: fitting parameters used for the decomposition of the O1s region in Fig. 6. Table S2: parameters used in the multilayer electron attenuation model. Fig. S4: comparison of the calculations of hydroxyls coverage using different values for N and λ parameters. Section C: Fig. S5: O1s spectra measured at 700 eV and 1000 eV on the same spot under residual water vapour gas conditions (pressure < 10−3 mbar). Fig. S6: evolution of the calculated thickness of the adsorbate layer as a function of the water pressure. Fig. S7: survey spectra of the three different ferroelectric perovskite thin films shown in the manuscript measured at 700 eV. See DOI: 10.1039/c8cp07632d

Domingo, Neus ; Pach, Elzbieta ; et al.

In: Physical chemistry chemical physics, Jg. 21 (2019), Heft 9, S. 4920-4930

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