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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- optics 211 Treffer
- business 147 Treffer
- business.industry 147 Treffer
- law 68 Treffer
- law.invention 68 Treffer
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45 weitere Werte:
- optique 67 Treffer
- physique 67 Treffer
- exact sciences and technology 65 Treffer
- sciences exactes et technologie 65 Treffer
- electronics 64 Treffer
- electronique 64 Treffer
- spectral density 63 Treffer
- detector 43 Treffer
- telecommunications 43 Treffer
- applied sciences 32 Treffer
- sciences appliquees 32 Treffer
- general 29 Treffer
- generalites 29 Treffer
- metrologie et instrumentation 28 Treffer
- metrology and instrumentation 28 Treffer
- instruments, apparatus, components and techniques common to several branches of physics and astronomy 26 Treffer
- instruments, appareillage, composants et techniques communs a plusieurs branches de la physique et de l'astronomie 26 Treffer
- spatial frequency 26 Treffer
- position sensor 25 Treffer
- symbols 25 Treffer
- symbols.namesake 25 Treffer
- wavefront 24 Treffer
- interferometry 20 Treffer
- adaptive optics 19 Treffer
- domaines classiques de la physique (y compris les applications) 17 Treffer
- fundamental areas of phenomenology (including applications) 17 Treffer
- scattering 17 Treffer
- 01 natural sciences 16 Treffer
- 0103 physical sciences 16 Treffer
- laser 16 Treffer
- astrophysics::instrumentation and methods for astrophysics 14 Treffer
- general equipment and techniques 14 Treffer
- surface finish 14 Treffer
- techniques et equipements generaux 14 Treffer
- detecteur positionnement 13 Treffer
- electronique des semiconducteurs. microelectronique. optoelectronique. dispositifs a l'etat solide 13 Treffer
- semiconductor electronics. microelectronics. optoelectronics. solid state devices 13 Treffer
- beam (structure) 12 Treffer
- computational physics 12 Treffer
- physics::instrumentation and detectors 12 Treffer
- position (vector) 12 Treffer
- 010309 optics 11 Treffer
- 02 engineering and technology 11 Treffer
- captador medida 11 Treffer
- capteur mesure 11 Treffer
Publikation
- spie proceedings 109 Treffer
- spie proceedings series 35 Treffer
- proceedings of spie, the international society for optical engineering 19 Treffer
- 0instrumentation and control technology 4 Treffer
- sixth international symposium on instrumentation and control technology (signal analysis, measurement theory, photo-electronic technology, and artificial intelligence) 4 Treffer
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45 weitere Werte:
- optoelectronic devices and integration (beijing, 8-11 november 2004) 3 Treffer
- proceedings of spie 3 Treffer
- 0smart sensor monitoring systems and applications 2 Treffer
- data mining, intrusion detection, information security and assurance, and data networks security 2009 (15-16 april 2009, orlando, florida, united states) 2 Treffer
- imac-xx (los angeles ca, 4-7 february 2002) 2 Treffer
- instrumentation and control technology (beijing, 24-27 october 2003) 2 Treffer
- smart structures and materials 2006 (smart sensor monitoring systems and applications : 27 february-1 march 2006, san diego, california, usa) 2 Treffer
- vibration measurements by laser techniques : advances and applications (ancona, 22-25 june 2004) 2 Treffer
- 05th international workshop on adaptive optics for industry and medicine 1 Treffer
- 0free-space laser communications 6 1 Treffer
- 0practical holography 21 1 Treffer
- 0smart electronics, mems, biomems, and nanotechnology 1 Treffer
- adaptive optics for industry and medicine 1 Treffer
- advanced characterization techniques for optics, semiconductors, and nanotechnologies ii (2-4 august 2005, san diego, california, usa) 1 Treffer
- advances in metrology for x-ray and euv optics (2-3 august 2005, san diego, california, usa) 1 Treffer
- atmospheric optical modeling, measurement, and simulation ii (15 august 2006, san diego, ca, usa) 1 Treffer
- bioengineered and bioinspired systems ii (9-11 may 2005 seville, spain) 1 Treffer
- damping and isolation (san diego ca, 15-18 march 2004) 1 Treffer
- digital photography (san jose ca, 17-18 january 2005) 1 Treffer
- emerging lithographic technologies vi (santa clara ca, 5-7 march 2002) 1 Treffer
- emerging lithographic technologies x (21-23 february 2006, san jose, california, usa) 1 Treffer
- experimental mechanics (singapore, 29 november - 1 december 2000) 1 Treffer
- free-space laser communication and active laser illumination iii (san diego ca, 4-6 august 2003) 1 Treffer
- free-space laser communications vi (15-17 august, 2006, san diego, california, usa) 1 Treffer
- ico20 (optical information processing) 1 Treffer
- ico20, optical devices and instruments (21-26 august 2005, changchun, china) 1 Treffer
- imaps 2000 : international symposium on microelectronics (boston ma, 20-22 september 2000) 1 Treffer
- independent component analyses, wavelets, unsupervised smart sensors, and neural networks iv (17 and 19-21 april 2006, kissimmee, florida, usa) 1 Treffer
- infrared detectors and focal plane arrays viii (15-16 august 2006, san diego, california, usa) 1 Treffer
- intelligent robots and computer vision xxi : algorithms, techniques, and active vision (providence ri, 28-29 october 2003) 1 Treffer
- mems, moems, and micromachining (strasbourg, 29-30 april 2004) 1 Treffer
- mems, moems, and micromachining ii (3-4 april, 2006, strasbourg, france) 1 Treffer
- metrology, inspection, and process control for microlithography xiv (santa clara ca, 28 february - 2 march 2000) 1 Treffer
- microelectronics : design, technology, and packaging (perth, 10-12 december 2003) 1 Treffer
- micromachining and microfabrication process technology vii (san francisco ca, 22-24 october 2001) 1 Treffer
- microrobotics and microassembly (boston ma, 21-22 september 1999) 1 Treffer
- nano-and micro-metrology (16-17 june, 2005, munich, germany) 1 Treffer
- nondestructive evaluation of aging materials and composites iii (newport beach ca, 3-5 march 1999) 1 Treffer
- nondestructive testing and computer simulations in science and engineering (st. petersburg, 8-12 june 1998) 1 Treffer
- optical fabrication, testing and metrology ii (13-15 september 2005, jena, germany) 1 Treffer
- optical information systems iii (3-4 august 2005, san diego, california, usa) 1 Treffer
- optical manufacturing and testing vi (31 july-1 august 2005, san diego, california, usa) 1 Treffer
- optical microlithography xiv (santa clara ca, 27 february - 2 march 2001) 1 Treffer
- optical microlithography xix (21-24 february 2006, san jose, california, usa) 1 Treffer
- optical modeling and performance predictions ii (3-4 august 2005, san diego, california, usa) 1 Treffer
Sprache
240 Treffer
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In: Optoelectronic devices and integration (Beijing, 8-11 November 2004), 2005, S. 763-768KonferenzZugriff:
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In: Optoelectronic devices and integration (Beijing, 8-11 November 2004), 2005, S. 15-20KonferenzZugriff:
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In: Bioengineered and bioinspired systems II (9-11 May 2005 Seville, Spain), 2005, S. 172-181KonferenzZugriff:
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In: Smart structures and integrated systems (Newport Beach, 5-8 March 2001 ), 2001, S. 213-222KonferenzZugriff:
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In: Tribute to James C. Wyant: The Extraordinaire in Optical Metrology and Optics Education, 2021-09-09Online unknownZugriff:
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In: Sensors and camera systems for scientific, industrial, 2002, S. 227-231KonferenzZugriff:
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In: Surface characterization for computer disks, wafers, and flat panel displays (San Jose CA, 28 January 1999), 1999, S. 112-120KonferenzZugriff:
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In: Sixth International Symposium on Instrumentation and Control Technology (Signal analysis, measurement theory, photo-electronic technology, 2006KonferenzZugriff:
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In: Sixth International Symposium on Instrumentation and Control Technology (Signal analysis, measurement theory, photo-electronic technology, 2006KonferenzZugriff:
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In: Sixth International Symposium on Instrumentation and Control Technology (Signal analysis, measurement theory, photo-electronic technology, 2006KonferenzZugriff:
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In: ICO20 (optical information processing), 2005KonferenzZugriff:
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In: Adaptive optics for industry and medicine, 2005, S. 60180V.1KonferenzZugriff:
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In: Optical manufacturing and testing VI (31 July-1 August 2005, San Diego, California, USA), 2005, S. 58690U.1KonferenzZugriff:
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In: SPIE Proceedings, 2014-07-22Online unknownZugriff:
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2015Online unknownZugriff:
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In: SPIE Proceedings, 2010-08-07Online unknownZugriff:
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In: SPIE Proceedings, 2010-05-13Online unknownZugriff:
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In: SPIE Proceedings, 2008-12-11Online unknownZugriff:
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In: Optifab 2007: Technical Digest, 2007-05-14Online unknownZugriff:
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In: SPIE Proceedings, 2010-04-23Online unknownZugriff: