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Publikation
Sprache
17 Treffer
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In: Microscopy of Semiconducting Materials; (2005) S. 379-388BuchZugriff:
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In: Nanoscale Research Letters, Jg. 5, Heft 10, S. 1654-1657Online unknownZugriff:
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In: Chinese Science Bulletin, Jg. 57, Heft 7, S. 716-718Online unknownZugriff:
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In: Micro and Nano Systems Letters, Jg. 5, Heft 1Online unknownZugriff:
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In: Nanoscale Research Letters, Jg. 12, Heft 1Online unknownZugriff:
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In: Nanoscale Research Letters, Jg. 6, Heft 1, S. 400-400Online unknownZugriff:
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In: Journal of Failure Analysis & Prevention, Jg. 23 (2023-04-01), Heft 2, S. 687-690Online academicJournalZugriff:
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In: Nanoscale Research Letters, Jg. 10, Heft 1Online unknownZugriff:
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In: Nano-Micro Letters, Jg. 2, Heft 2, S. 114-120Online unknownZugriff:
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In: Nanoscale Research Letters, Jg. 12, Heft 1Online unknownZugriff:
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In: Nanoscale Research Letters, Jg. 6, Heft 1, S. 368-368Online unknownZugriff:
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In: Applied Physics A, Jg. 95, Heft 4, S. 967-972Online unknownZugriff:
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In: Applied Physics A, Jg. 122, Heft 5Online unknownZugriff:
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In: Nanoscale Research Letters, Jg. 11, Heft 1Online unknownZugriff:
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In: Nanoscale Research Letters, Jg. 10, Heft 1Online unknownZugriff:
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In: Nanoscale Research Letters, Jg. 9, Heft 1, S. 426-426Online unknownZugriff: