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Reliability and Ruggedness of 1200V SiC Planar Gate MOSFETs Fabricated in a High Volume CMOS FoundryIn: Materials Science Forum, Jg. 924 (2018-06-01), S. 697-702Online unknownZugriff:
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In: Materials Science Forum, Jg. 924 (2018-06-01), S. 731-734Online unknownZugriff:
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In: Journal of Nano Research, Jg. 39 (2016-02-01), S. 228-234Online unknownZugriff:
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In: Advanced Engineering Forum, Jg. 30 (2018-11-01), S. 43-53Online unknownZugriff: