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In: Test & Measurement World, Jg. 21 (2001-02-01), Heft 2, S. 69Online serialPeriodicalZugriff:
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In: EDN, Jg. 45 (2000-07-20), Heft 15, S. 48Online serialPeriodicalZugriff:
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In: EDN, Jg. 46 (2001-11-22), Heft 26, S. 123-123Online serialPeriodicalZugriff:
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In: EDN, Jg. 50 (2005-02-17), Heft 4, S. 92-92Online serialPeriodicalZugriff:
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In: EDN, Jg. 49 (2004-10-14), Heft 21, S. 130-130Online serialPeriodicalZugriff:
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In: EDN, Jg. 49 (2004-08-19), Heft 17, S. 87-87Online serialPeriodicalZugriff:
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In: EDN, Jg. 49 (2004-02-19), Heft 4, S. 93-93Online serialPeriodicalZugriff:
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In: EDN, Jg. 47 (2002-03-07), Heft 5, S. 155-155Online serialPeriodicalZugriff:
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In: EDN, Jg. 47 (2002-02-07), Heft 3, S. 115-115Online serialPeriodicalZugriff: