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- [spi.mat]engineering sciences [physics]/materials 52 Treffer
- [spi.opti]engineering sciences [physics]/optics / photonic 51 Treffer
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45 weitere Werte:
- [phys.cond.cm-ms]physics [physics]/condensed matter [cond-mat]/materials science [cond-mat.mtrl-sci] 49 Treffer
- [phys.cond]physics [physics]/condensed matter [cond-mat] 45 Treffer
- [spi.nrj]engineering sciences [physics]/electric power 33 Treffer
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- [phys.phys.phys-optics]physics [physics]/physics [physics]/optics [physics.optics] 10 Treffer
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- [phys.phys.phys-plasm-ph]physics [physics]/physics [physics]/plasma physics [physics.plasm-ph] 9 Treffer
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- ieee photonics technology letters ; ieee international photonics conference (ipc 2018) ; https://hal.univ-grenoble-alpes.fr/hal-01942772 ; ieee international photonics conference (ipc 2018), sep 2018, rexton, united states. pp.591-594, ⟨10.1109/lpt.2018.2791631⟩ ; https://ieeexplore.ieee.org/document/8253489 7 Treffer
- mrs spring meeting ; https://hal.science/hal-01489617 ; mrs spring meeting, apr 2015, san francisco, california, united states. 2015 6 Treffer
- spie opto 2018 ; https://hal.univ-grenoble-alpes.fr/hal-01942725 ; spie opto 2018, 2018, san francisco, united states. ⟨10.1117/12.2289564⟩ 6 Treffer
- 2015 mrs spring meeting & exhibit ; https://hal.science/hal-01489575 ; 2015 mrs spring meeting & exhibit, 2015, san francisco, california, united states 5 Treffer
- 2014 mrs spring meeting & exhibit ; https://hal.science/hal-01489869 ; 2014 mrs spring meeting & exhibit, 2014, san francisco, california, usa, united states 3 Treffer
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3 weitere Werte:
- annual conference on nanotechnology and advanced materials ; https://hal.science/hal-03029510 ; annual conference on nanotechnology and advanced materials, nov 2019, san francisco, united states 3 Treffer
- issn: 1431-9276 3 Treffer
- mrs spring meeting ; https://hal.science/hal-02071838 ; mrs spring meeting, apr 2014, san-francisco, united states 3 Treffer
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1.442 Treffer
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In: NIST National Institute of Standard and Technology Center for Nanoscale -Science-Technology Gaithersburg ; https://hal.science/hal-00394838 ; NIST National Institute of Standard and Technology Center for Nanoscale -Science-Technology Gaithersburg, 2008, washington, United States, 2008KonferenzZugriff:
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In: NIST National Institute of Standard and Technology Center for Nanoscale -Science-Technology Gaithersburg ; https://hal.science/hal-00394838 ; NIST National Institute of Standard and Technology Center for Nanoscale -Science-Technology Gaithersburg, 2008, washington, United States, 2008KonferenzZugriff:
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In: NIST National Institute of Standard and Technology Center for Nanoscale -Science-Technology Gaithersburg ; https://hal.archives-ouvertes.fr/hal-00394838 ; NIST National Institute of Standard and Technology Center for Nanoscale -Science-Technology Gaithersburg, 2008, washington, United States, 2008KonferenzZugriff:
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In: Proceedings of SPIE ; SPIE OPTO 2022 - Physics, Simulation, and Photonic Engineering of Photovoltaic ; https://hal.science/hal-03781347 ; SPIE OPTO 2022 - Physics, 2022Online KonferenzZugriff:
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In: Proceedings of SPIE ; SPIE OPTO 2022 - Physics, Simulation, and Photonic Engineering of Photovoltaic ; https://hal.science/hal-03781347 ; SPIE OPTO 2022 - Physics, 2022Online KonferenzZugriff:
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In: Proceedings of SPIE ; SPIE OPTO 2022 - Physics, Simulation, and Photonic Engineering of Photovoltaic ; https://hal.science/hal-03781347 ; SPIE OPTO 2022 - Physics, 2022Online KonferenzZugriff:
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In: Proceedings of SPIE ; SPIE OPTO 2022 - Physics, Simulation, and Photonic Engineering of Photovoltaic ; https://hal.science/hal-03781347 ; SPIE OPTO 2022 - Physics, 2022Online KonferenzZugriff:
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In: Proceedings of SPIE ; SPIE OPTO 2022 - Physics, Simulation, and Photonic Engineering of Photovoltaic ; https://hal.science/hal-03781347 ; SPIE OPTO 2022 - Physics, 2022Online KonferenzZugriff:
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In: Proceedings of SPIE ; SPIE OPTO 2022 - Physics, Simulation, and Photonic Engineering of Photovoltaic ; https://hal.science/hal-03781347 ; SPIE OPTO 2022 - Physics, 2022Online KonferenzZugriff:
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In: 17th Conference on Concentrated PhotoVoltaïcs System ; https://hal.science/hal-03407487 ; 17th Conference on Concentrated PhotoVoltaïcs System, 2021, Denver (On line), United States, 2021Online KonferenzZugriff:
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In: ISSN: 1431-9276, 2021Online KonferenzZugriff:
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In: 17th Conference on Concentrated PhotoVoltaïcs System ; https://hal.science/hal-03407487 ; 17th Conference on Concentrated PhotoVoltaïcs System, 2021, Denver (On line), United States, 2021Online KonferenzZugriff:
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In: 17th Conference on Concentrated PhotoVoltaïcs System ; https://hal.science/hal-03407487 ; 17th Conference on Concentrated PhotoVoltaïcs System, 2021, Denver (On line), United States, 2021Online KonferenzZugriff:
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In: 17th Conference on Concentrated PhotoVoltaïcs System ; https://hal.science/hal-03407487 ; 17th Conference on Concentrated PhotoVoltaïcs System, 2021, Denver (On line), United States, 2021Online KonferenzZugriff:
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In: ISSN: 1431-9276, 2021Online KonferenzZugriff:
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In: ISSN: 1431-9276, 2021Online KonferenzZugriff:
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In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ; https://cnrs.hal.science/hal-03017738 ; 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), Aug 2020, Saratoga Springs, United States. pp.1-6, ⟨10.1109/ASMC49169.2020.9185349⟩ ; https://ieeexplore.ieee.org/document/9185349, 2020Online KonferenzZugriff:
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In: NSREC 2020 - Nuclear and Space Radiation Effects Conference ; https://cea.hal.science/cea-03086369 ; NSREC 2020 - Nuclear and Space Radiation Effects Conference, Dec 2020, Virtual Event, United States, 2020Online KonferenzZugriff:
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In: Proceedings SPIE Volume 11325 ; Metrology, Inspection, and Process Control for Microlithography XXXIV ; https://hal.science/hal-03093860 ; Metrology, 2020Online KonferenzZugriff:
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In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ; https://cnrs.hal.science/hal-03017738 ; 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), Aug 2020, Saratoga Springs, United States. pp.1-6, ⟨10.1109/ASMC49169.2020.9185349⟩ ; https://ieeexplore.ieee.org/document/9185349, 2020Online KonferenzZugriff: