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Weniger Treffer
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- Techniques de L'ingenieur 349 Treffer
- Sexual Health Visual 349 Treffer
- OpenAIRE 349 Treffer
- NASA Technical Reports 349 Treffer
- Music ID 349 Treffer
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59 weitere Werte:
- Marketline Advantage 349 Treffer
- IEEE Xplore Digital Library 349 Treffer
- Health Reference Center 349 Treffer
- Emerald Insight 349 Treffer
- Economena Document Library 349 Treffer
- Classiques Garnier Numerique: Littérature Française et Francophone 349 Treffer
- Classiques Garnier Numerique: Dictionnaires, Grammaires et Encyclopédies 349 Treffer
- BASE 221 Treffer
- Complementary Index 115 Treffer
- Scopus® 40 Treffer
- ABC-CLIO eBooks 24 Treffer
- FRANCIS Archive 24 Treffer
- PASCAL Archive 24 Treffer
- Politics Trove 24 Treffer
- Universalis 24 Treffer
- VIDAL Consult 24 Treffer
- Westlaw UK 24 Treffer
- World Religions 24 Treffer
- Elgaronline 24 Treffer
- E-knihovna 24 Treffer
- dblp computer science bibliography 24 Treffer
- Bloom's Literature 24 Treffer
- ASTM Compass 24 Treffer
- Memòria Digital de Catalunya (MDC) 24 Treffer
- British Library Document Supply Centre Inside Serials & Conference Proceedings 12 Treffer
- Agrow 5 Treffer
- Base SantéPsy 5 Treffer
- Cairn.info International Edition 5 Treffer
- Multilegis: Publicationes Actualizables 5 Treffer
- EMIS University – Company Information 5 Treffer
- EMIS University – News Sources 5 Treffer
- EMIS University – Research Sources 5 Treffer
- SciTech Connect 5 Treffer
- SAGE Research Methods 5 Treffer
- RxTx 5 Treffer
- Psychotherapy.net 5 Treffer
- Naxos Sheet Music 5 Treffer
- EMIS University M&A Information 5 Treffer
- Gale OneFile: CPI.Q 5 Treffer
- Gale Literature Criticism 5 Treffer
- Gale In Context: Middle School 5 Treffer
- 스콜라(Scholar) 4 Treffer
- KRpia 4 Treffer
- DBPIA 4 Treffer
- eArticle 4 Treffer
- Korean Studies Information Service System 4 Treffer
- KERIS Theses & Dissertations 4 Treffer
- RAMBI 1 Treffer
- SciELO 1 Treffer
- ProjectMUSE 1 Treffer
- NARCIS 1 Treffer
- LUNA Commons 1 Treffer
- IndianJournals.com 1 Treffer
- Idunn.no 1 Treffer
- IBISWorld 1 Treffer
- British Standards Online 1 Treffer
- Air University Library Index to Military Periodicals (AULIMP) 1 Treffer
- Swedish National Bibliography 1 Treffer
- BiblioBoard 1 Treffer
Art der Quelle
Schlagwort
- components, circuits, devices and systems 306 Treffer
- circuit testing 217 Treffer
- circuit faults 176 Treffer
- signal processing and analysis 171 Treffer
- power, energy and industry applications 133 Treffer
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45 weitere Werte:
- computing and processing 125 Treffer
- engineered materials, dielectrics and plasmas 108 Treffer
- fault detection 97 Treffer
- logic testing 91 Treffer
- voltage 85 Treffer
- integrated circuit testing 76 Treffer
- current measurement 65 Treffer
- electrical fault detection 65 Treffer
- cmos technology 61 Treffer
- power supplies 52 Treffer
- leakage current 48 Treffer
- cmos logic circuits 46 Treffer
- communication, networking and broadcast technologies 43 Treffer
- circuit simulation 41 Treffer
- current supplies 41 Treffer
- semiconductor device modeling 37 Treffer
- production 36 Treffer
- testing 36 Treffer
- monitoring 33 Treffer
- costs 32 Treffer
- system testing 28 Treffer
- very large scale integration 28 Treffer
- automatic testing 27 Treffer
- cmos integrated circuits 27 Treffer
- manufacturing 27 Treffer
- switches 26 Treffer
- delay 23 Treffer
- failure analysis 23 Treffer
- semiconductor device measurement 22 Treffer
- performance evaluation 20 Treffer
- fault diagnosis 19 Treffer
- general topics for engineers 19 Treffer
- robotics and control systems 19 Treffer
- computer science 18 Treffer
- integrated circuit modeling 18 Treffer
- laboratories 18 Treffer
- switching circuits 18 Treffer
- application specific integrated circuits 17 Treffer
- clocks 17 Treffer
- frequency 17 Treffer
- leak detection 17 Treffer
- logic circuits 17 Treffer
- threshold voltage 17 Treffer
- bicmos integrated circuits 16 Treffer
- bridge circuits 16 Treffer
Verlag
- ieee 490 Treffer
- ieee comput. soc. press 67 Treffer
- ieee comput. soc 51 Treffer
- int. test conference 25 Treffer
- institute of electrical and electronics engineers inc. 15 Treffer
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42 weitere Werte:
- hal ccsd 7 Treffer
- int. test. conference 5 Treffer
- acm press 4 Treffer
- american institute of physics 4 Treffer
- association for computing machinery 4 Treffer
- ieee comput. soc. press, los alamitos, ca, usa 4 Treffer
- acm 3 Treffer
- country:ita 2 Treffer
- elsevier ltd 2 Treffer
- gordon and breach 2 Treffer
- ieee comput. soc, los alamitos, ca, usa 2 Treffer
- 전력전자학회 2 Treffer
- association for computing machinery, inc 1 Treffer
- astronomical society of the pacific 1 Treffer
- country:nld 1 Treffer
- csrea press 1 Treffer
- digital scholarship@unlv 1 Treffer
- electrochemical society; international society of electrochemistry 1 Treffer
- elsevier bv 1 Treffer
- ieee computer society 1 Treffer
- jsap 1 Treffer
- kahuta; dr. a. q. khan research laboratories 1 Treffer
- mdpi 1 Treffer
- minerals, metals & materials soc (tms) 1 Treffer
- miskolc; university of miskolc 1 Treffer
- place:groningen 1 Treffer
- place:pavia 1 Treffer
- place:rende (cs) 1 Treffer
- prous science 1 Treffer
- seoul; seoul national university 1 Treffer
- spie 1 Treffer
- springer science and business media deutschland gmbh 1 Treffer
- the korean institute of power electronics 1 Treffer
- the korean institute of power electronics (kipe) 1 Treffer
- tms 1 Treffer
- ultra clean soc 1 Treffer
- universita della calabria 1 Treffer
- university of twente 1 Treffer
- wiley-vch 1 Treffer
- издательство амб 1 Treffer
- 한국고분자학회 1 Treffer
- 한국자동차공학회 1 Treffer
Publikation
- digest of papers ieee international workshop on iddq testing 18 Treffer
- itc 14 Treffer
- proceedings of 1995 ieee international test conference (itc), test conference, 1995. proceedings., international, international test conference 11 Treffer
- digest of papers 1996 ieee international workshop on iddq testing 10 Treffer
- digest of papers ieee international workshop on iddq testing, iddq testing, 1997. digest of papers., ieee international workshop on, iddq testing 10 Treffer
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45 weitere Werte:
- proceedings 13th ieee vlsi test symposium 9 Treffer
- international test conference 1999. proceedings (ieee cat. no.99ch37034), test conference, 1999. proceedings. international, international test conference 8 Treffer
- proceedings 13th ieee vlsi test symposium, vlsi test symposium, 1995. proceedings., 13th ieee, vlsi test symposium 8 Treffer
- proceedings of 1995 ieee international test conference (itc) 8 Treffer
- digest of papers 1996 ieee international workshop on iddq testing, iddq testing, 1996., ieee international workshop on, iddq testing 7 Treffer
- proceedings international test conference 1996. test and design validity, test conference, 1996. proceedings., international, international test conference 7 Treffer
- proceedings international test conference 1997, test conference, 1997. proceedings., international, test conference 7 Treffer
- proceedings of 1995 ieee international test conference (itc 7 Treffer
- proceedings 1998 ieee international workshop on iddq testing (cat. no.98ex232), iddq testing, 1998. proceedings. 1998 ieee international workshop on, iddq testing 6 Treffer
- proceedings international test conference 1996 test & design validity 6 Treffer
- proceedings international test conference 1996. test and design validity 6 Treffer
- proceedings international test conference 1997 6 Treffer
- proceedings international test conference 1998 (ieee cat. no.98ch36270), test conference, 1998. proceedings., international, international test conference 6 Treffer
- proceedings international test conference 2000 (ieee cat. no.00ch37159), test conference, 2000. proceedings. international, international test conference 2000 6 Treffer
- proceedings of 14th vlsi test symposium 6 Treffer
- proceedings. international test conference 1990, test conference, 1990. proceedings., international 6 Treffer
- proceedings., international test conference, test conference, 1994. proceedings., international, international test conference 1994 6 Treffer
- international test conference 1999 proceedings (ieee cat no99ch37034) 5 Treffer
- international test conference 1999. proceedings (ieee cat. no.99ch37034 5 Treffer
- proceedings international test conference 1990 5 Treffer
- proceedings international test conference 1992 5 Treffer
- proceedings. international test conference 1990 5 Treffer
- digest of papers eleventh annual 1993 ieee vlsi test symposium 4 Treffer
- proceedings of 7th international conference on vlsi design 4 Treffer
- proceedings of ieee vlsi test symposium 4 Treffer
- proceedings of the ieee vlsi test symposium 3 Treffer
- 1997 proceedings second annual ieee international conference on innovative systems in silicon 2 Treffer
- ieee international conference on test, 2005 2 Treffer
- materials today: proceedings 2 Treffer
- molecular crystals and liquid crystals 2 Treffer
- proceedings -design, automation and test in europe, date 2 Treffer
- proceedings of 9th international conference on vlsi design 2 Treffer
- proceedings of cicc 97 - custom integrated circuits conference 2 Treffer
- proceedings of ieee custom integrated circuits conference - cicc '94 2 Treffer
- proceedings of the fourth asian test symposium 2 Treffer
- proceedings of the ieee 1991 custom integrated circuits conference 2 Treffer
- proceedings of the ieee 1995 custom integrated circuits conference 2 Treffer
- proceedings tenth international conference on vlsi design 2 Treffer
- synthetic metals 2 Treffer
- advanced materials -international symposium- 1 Treffer
- astronomical society of the pacific conference series 1 Treffer
- icpe(ispe)논문집 1 Treffer
- 전력전자학회 학술대회 논문집 1 Treffer
- 한국고분자학회 학술대회 연구논문 초록집 1 Treffer
- 한국자동차공학회 춘 추계 학술대회 논문집 1 Treffer
Sprache
Geographischer Bezug
771 Treffer
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In: 2023 Asian Hardware Oriented Security and Trust Symposium (AsianHOST), 2023-12-13, S. 1-4KonferenzZugriff:
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In: 2023 IEEE 23rd International Conference on Communication Technology (ICCT), 2023-10-20, S. 1325-1329KonferenzZugriff:
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In: 2023 3rd International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME), 2023-07-19, S. 1-5KonferenzZugriff:
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In: 2022 IEEE Transportation Electrification Conference & Expo (ITEC), 2022-06-15, S. 579-583KonferenzZugriff:
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In: 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia), 2023-05-22, S. 1031-1037KonferenzZugriff:
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In: 2017 2nd International Conference On Emerging Computation and Information Technologies (ICECIT), 2017-12-01, S. 1-6KonferenzZugriff:
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In: 2019 IEEE Energy Conversion Congress and Exposition (ECCE), 2019-09-01, S. 551-556KonferenzZugriff:
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In: 전력전자학회 학술대회 논문집, Jg. 2022 (2022-07-31), Heft 7, S. 230-231KonferenzZugriff:
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In: 2019 IEEE PELS Workshop on Emerging Technologies: Wireless Power Transfer (WoW), 2019-06-01, S. 140-143KonferenzZugriff:
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In: AsianHOST, 2023, S. 1-4KonferenzZugriff:
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In: ICCT, 2023, S. 1325-1329KonferenzZugriff:
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In: 2018 9th Annual Power Electronics, Drives Systems and Technologies Conference (PEDSTC), 2018-02-01, S. 26-29KonferenzZugriff:
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In: 2017 IEEE PELS Workshop on Emerging Technologies: Wireless Power Transfer (WoW), 2017-05-01, S. 1-6KonferenzZugriff:
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In: 2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE), 2013-12-01, S. 67-70KonferenzZugriff:
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In: Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA, 2005, S. 47-51KonferenzZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!KonferenzZugriff:
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In: Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637), 2000, S. 45-50KonferenzZugriff:
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In: 23rd IEEE VLSI Test Symposium (VTS'05), 2005, S. 427-432KonferenzZugriff:
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In: Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC, 2005, S. 471-474KonferenzZugriff:
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In: 17th International Conference on VLSI, 2004, S. 889-894KonferenzZugriff: