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Weniger Treffer
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32 weitere Werte:
- NASA Technical Reports 16 Treffer
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- Classiques Garnier Numerique: Littérature Française et Francophone 16 Treffer
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Art der Quelle
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- components, circuits, devices and systems 13 Treffer
- routing 11 Treffer
- [spi.meca.mema]engineering sciences [physics]/mechanics [physics.med-ph]/mechanics of materials [physics.class-ph] 10 Treffer
- computing and processing 10 Treffer
- engineered materials, dielectrics and plasmas 9 Treffer
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45 weitere Werte:
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- polynomials 3 Treffer
- power, energy and industry applications 3 Treffer
- [phys.meca.mema]physics [physics]/mechanics [physics]/mechanics of materials [physics.class-ph] 2 Treffer
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- 3d from multi-view and sensors 1 Treffer
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Verlag
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16 weitere Werte:
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- societes d'ophtalmologie 1 Treffer
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- springer verlag 1 Treffer
- univ. tehran 1 Treffer
- university of tehran, electrical and engineering department, faculty of engineering 1 Treffer
Publikation
- aip conference proceedings 4 Treffer
- 1991 ieee international symposium on circuits and systems (iscas), circuits and systems (iscas), 1991 ieee international symposium on 2 Treffer
- 22eme congres francais de mecanique, 24 au 28 aout 2015, lyon, france (fr 2 Treffer
- lecture notes in computer science 2 Treffer
- [1991 proceedings] tenth annual international phoenix conference on computers and communications, computers and communications, 1991. conference proceedings., tenth annual international phoenix conference on 1 Treffer
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37 weitere Werte:
- [1991] proceedings. fourth csi/ieee international symposium on vlsi design 1 Treffer
- [1991] proceedings. fourth csi/ieee international symposium on vlsi design, vlsi design, 1991. proceedings., fourth csi/ieee international symposium on 1 Treffer
- 1991 proceedings fourth csi/ieee international symposium on vlsi design 1 Treffer
- 1997 ieee international symposium on defect & fault tolerance in vlsi systems 1 Treffer
- 1997 ieee international symposium on defect and fault tolerance in vlsi systems 1 Treffer
- 1997 ieee international symposium on defect and fault tolerance in vlsi systems, defect and fault tolerance in vlsi systems, 1997. proceedings., 1997 ieee international symposium on, defect and fault tolerance in vlsi systems 1 Treffer
- 2004 ieee region 10 conference tencon 2004., tencon 2004. 2004 ieee region 10 conference, tencon 2004 1 Treffer
- 2009 international conference on computational intelligence and software engineering, computational intelligence and software engineering, 2009. cise 2009. international conference on 1 Treffer
- 2011 ieee 73rd vehicular technology conference (vtc spring), vehicular technology conference (vtc spring), 2011 ieee 73rd 1 Treffer
- 2017 ieee 12th international conference on asic (asicon), asic (asicon), 2017 ieee 12th international conference on 1 Treffer
- 2022 ieee/cvf conference on computer vision and pattern recognition (cvpr 1 Treffer
- 2022 ieee/cvf conference on computer vision and pattern recognition (cvpr), computer vision and pattern recognition (cvpr), 2022 ieee/cvf conference on, cvpr 1 Treffer
- advances in intelligent systems and computing 1 Treffer
- banach algebras and their applications 1 Treffer
- bulletin- societes d ophtalmologie de france 1 Treffer
- cvpr 1 Treffer
- dft 1 Treffer
- emerging technology in modelling and graphics - proceedings of iem graph 2018 1 Treffer
- esscirc conference 2015 - 41st european solid-state circuits conference (esscirc), european solid-state circuits conference (esscirc), esscirc 2015 - 41st 1 Treffer
- icm 2000. proceedings of the 12th international conference on microelectronics. (ieee cat. no.00ex453 1 Treffer
- icm 2000. proceedings of the 12th international conference on microelectronics. (ieee cat. no.00ex453) 1 Treffer
- icm 2000. proceedings of the 12th international conference on microelectronics. (ieee cat. no.00ex453), microelectronics, 2000. icm 2000. proceedings of the 12th international conference on, microelectronics 1 Treffer
- ieee international workshop on defect and fault tolerance in vlsi systems 1 Treffer
- international quantum electronics conference, 2004. (iqec) 1 Treffer
- proceedings - ieee international symposium on defect and fault tolerance in vlsi systems 1 Treffer
- proceedings of 7th international conference on vlsi design, vlsi design, 1994., proceedings of the seventh international conference on 1 Treffer
- proceedings of tencon '93. ieee region 10 international conference on computers, communications and automation, tencon '93. proceedings. computer, communication, control and power engineering.1993 ieee region 10 conference on, computer, communication, control and power engineering 1 Treffer
- proceedings of the 15th international conference on x-ray microscopy - xrm2022 ; aip conference proceedings ; issn 0094-243x 1 Treffer
- proceedings of the 8th international conference on vlsi design, vlsi design, 1995., proceedings of the 8th international conference on, vlsi design 1 Treffer
- proceedings of the ieee computer society conference on computer vision and pattern recognition 1 Treffer
- proceedings of the international conference on microelectronics 1 Treffer
- proceedings of the international conference on microelectronics, icm 1 Treffer
- proceedings tenth international conference on vlsi design, vlsi design, 1997. proceedings., tenth international conference on, vlsi design 1 Treffer
- rruidera repositorio institucional de la uclm 1 Treffer
- spaccs 2020 international workshops, 2020, proceedings 1 Treffer
- spaccs workshops 1 Treffer
- 한국정보과학회 학술발표논문집 1 Treffer
Sprache
Geographischer Bezug
59 Treffer
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In: 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2022-06-01, S. 6133-6144Online KonferenzZugriff:
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In: Lecture notes in computer science, Jg. 12383 (2021), S. 492-505KonferenzZugriff:
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In: CVPR, 2022, S. 6133-6144KonferenzZugriff:
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In: SpaCCS Workshops, 2020, S. 492-505KonferenzZugriff:
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In: ICM 2000. Proceedings of the 12th International Conference on Microelectronics. (IEEE Cat. No.00EX453), 2000, S. 25-28KonferenzZugriff:
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In: 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 1997, S. 38-42KonferenzZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!KonferenzZugriff:
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In: [1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design, 1991, S. 275-276KonferenzZugriff:
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In: PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON MICROELECTRONICS, 2000, S. 25-28KonferenzZugriff:
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In: IEEE INTERNATIONAL WORKSHOP ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, , S. 38-43KonferenzZugriff:
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In: BULLETIN- SOCIETES D OPHTALMOLOGIE DE FRANCE, Jg. 94, Heft 11, S. 847-852KonferenzZugriff:
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In: DEPOS26 ; https://hal.science/hal-01229515 ; DEPOS26, Sep 2015, Aber Wrac’h, France, 2015Online KonferenzZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!KonferenzZugriff:
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In: ICM 2000. Proceedings of the 12th International Conference on Microelectronics. (IEEE Cat. No.00EX453, 2002Online KonferenzZugriff:
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In: 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002Online KonferenzZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!BuchZugriff:
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In: International Quantum Electronics Conference, 2004. (IQEC), 2004, S. 522-524KonferenzZugriff:
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In: AIP Conference Proceedings, Jg. 2403 (2021-12-02), Heft 1, S. 1-9KonferenzZugriff:
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In: Proceedings of the 8th International Conference on VLSI Design, 1995, S. 202-207KonferenzZugriff:
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In: 2009 International Conference on Computational Intelligence and Software Engineering, 2009-12-01, S. 1KonferenzZugriff: