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In: Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066], Jg. 3 (2000), S. 1512-1517KonferenzZugriff:
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In: IMEKO -WORLD CONGRESS-, Jg. 2 (2000), S. 3-8KonferenzZugriff:
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In: IMEKO -WORLD CONGRESS-, Jg. 1 (2000), S. 12-12KonferenzZugriff:
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In: Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066], 2002Online KonferenzZugriff:
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In: 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 2013-06-01, S. 292-295KonferenzZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!KonferenzZugriff: