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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 25 (2017-06-01), S. 1881-1894Online unknownZugriff:
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In: IEEE Design & Test, Jg. 33 (2016-12-01), S. 55-62Online unknownZugriff:
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In: Journal of Computer Science and Technology, Jg. 31 (2016-09-01), S. 861-868Online unknownZugriff: