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Weniger Treffer
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- hardware_integratedcircuits 1.683 Treffer
- 010302 applied physics 1.553 Treffer
- 02 engineering and technology 1.548 Treffer
- cmos 1.499 Treffer
- business 1.394 Treffer
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45 weitere Werte:
- business.industry 1.394 Treffer
- law 970 Treffer
- law.invention 969 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 924 Treffer
- hardware_logicdesign 868 Treffer
- electronic engineering 829 Treffer
- electrical and electronic engineering 692 Treffer
- electrical engineering 666 Treffer
- computer science 641 Treffer
- 0210 nano-technology 609 Treffer
- 021001 nanoscience & nanotechnology 609 Treffer
- materials science 608 Treffer
- transistor 580 Treffer
- 020208 electrical & electronic engineering 530 Treffer
- optoelectronics 508 Treffer
- electronic circuit 452 Treffer
- engineering 444 Treffer
- electronic, optical and magnetic materials 411 Treffer
- logic gate 379 Treffer
- voltage 355 Treffer
- hardware_general 279 Treffer
- 010308 nuclear & particles physics 269 Treffer
- 020202 computer hardware & architecture 237 Treffer
- integrated circuit 206 Treffer
- condensed matter physics 194 Treffer
- mosfet 185 Treffer
- hardware_arithmeticandlogicstructures 182 Treffer
- physics 180 Treffer
- chemistry 161 Treffer
- [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics 149 Treffer
- hardware_memorystructures 144 Treffer
- power (physics) 143 Treffer
- chip 139 Treffer
- atomic and molecular physics, and optics 131 Treffer
- silicon on insulator 127 Treffer
- capacitor 126 Treffer
- static random-access memory 126 Treffer
- threshold voltage 123 Treffer
- computer science::hardware architecture 120 Treffer
- chemistry.chemical_element 119 Treffer
- silicon 115 Treffer
- general engineering 109 Treffer
- 020206 networking & telecommunications 105 Treffer
- inverter 103 Treffer
- capacitance 102 Treffer
Verlag
- ieee 633 Treffer
- institute of electrical and electronics engineers (ieee) 281 Treffer
- elsevier bv 186 Treffer
- hal ccsd 161 Treffer
- springer science and business media llc 108 Treffer
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45 weitere Werte:
- iop publishing 47 Treffer
- institution of engineering and technology (iet) 38 Treffer
- mdpi ag 30 Treffer
- springer singapore 13 Treffer
- world scientific pub co pte lt 13 Treffer
- arxiv 12 Treffer
- springer international publishing 12 Treffer
- acm 11 Treffer
- aip publishing 11 Treffer
- wiley 11 Treffer
- association for computing machinery (acm) 10 Treffer
- informa uk limited 10 Treffer
- multidisciplinary digital publishing institute 9 Treffer
- pleiades publishing ltd 9 Treffer
- spie 9 Treffer
- mdpi 7 Treffer
- the optical society 6 Treffer
- elsevier 5 Treffer
- institute of electrical and electronics engineers 5 Treffer
- osa 5 Treffer
- springer berlin heidelberg 5 Treffer
- trans tech publications, ltd. 5 Treffer
- edp sciences 4 Treffer
- emerald 4 Treffer
- institute of electrical and electronics engineers inc. 4 Treffer
- aip publishing llc 3 Treffer
- american chemical society (acs) 3 Treffer
- american vacuum society 3 Treffer
- foundation of computer science 3 Treffer
- research publishing services 3 Treffer
- scientific research publishing, inc. 3 Treffer
- spie-intl soc optical eng 3 Treffer
- the institute of electronics engineers of korea 3 Treffer
- zenodo 3 Treffer
- american institute of physics 2 Treffer
- american physical society (aps) 2 Treffer
- aperta 2 Treffer
- hindawi limited 2 Treffer
- hindawi publishing corporation 2 Treffer
- ieee-inst electrical electronics engineers inc 2 Treffer
- igi global 2 Treffer
- imaps - international microelectronics assembly and packaging society 2 Treffer
- institute of advanced engineering and science 2 Treffer
- institute of electronics, information and communications engineers (ieice) 2 Treffer
- keai communications co., ltd. 2 Treffer
Publikation
- ieee transactions on electron devices 67 Treffer
- microelectronics journal 56 Treffer
- microelectronics reliability 37 Treffer
- ieee transactions on device and materials reliability 32 Treffer
- ieee transactions on nuclear science 31 Treffer
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45 weitere Werte:
- ieee electron device letters 27 Treffer
- ieee journal of the electron devices society 26 Treffer
- iet circuits, devices & systems 25 Treffer
- materials today: proceedings 20 Treffer
- solid-state electronics 18 Treffer
- japanese journal of applied physics 17 Treffer
- journal of instrumentation 16 Treffer
- microsystem technologies 16 Treffer
- electronics 14 Treffer
- ieee transactions on very large scale integration (vlsi) systems 14 Treffer
- journal of computational electronics 14 Treffer
- silicon 14 Treffer
- ieee transactions on circuits and systems i: regular papers 13 Treffer
- ieee journal of solid-state circuits 12 Treffer
- ieee transactions on circuits and systems ii: express briefs 12 Treffer
- electronics letters 11 Treffer
- journal of circuits, systems and computers 10 Treffer
- journal of electronic testing 10 Treffer
- micromachines 9 Treffer
- nuclear instruments and methods in physics research section a: accelerators, spectrometers, detectors and associated equipment 9 Treffer
- international journal of theoretical physics 8 Treffer
- microelectronic engineering 8 Treffer
- scientific reports 8 Treffer
- 2019 ieee international symposium on circuits and systems (iscas) 7 Treffer
- acm journal on emerging technologies in computing systems 7 Treffer
- ieee transactions on magnetics 7 Treffer
- sensors 7 Treffer
- spie proceedings 7 Treffer
- 2016 ieee international reliability physics symposium (irps) 6 Treffer
- 2016 ieee international symposium on circuits and systems (iscas) 6 Treffer
- 2017 china semiconductor technology international conference (cstic) 6 Treffer
- 2017 ieee 60th international midwest symposium on circuits and systems (mwscas) 6 Treffer
- 2017 ieee international electron devices meeting (iedm) 6 Treffer
- 2017 ieee international symposium on circuits and systems (iscas) 6 Treffer
- 2018 ieee international electron devices meeting (iedm) 6 Treffer
- 2018 ieee international symposium on circuits and systems (iscas) 6 Treffer
- optics express 6 Treffer
- russian microelectronics 6 Treffer
- 2016 ieee asia pacific conference on circuits and systems (apccas) 5 Treffer
- 2016 ieee international electron devices meeting (iedm) 5 Treffer
- 2016 international siberian conference on control and communications (sibcon) 5 Treffer
- 2017 ieee 12th international conference on asic (asicon) 5 Treffer
- aip advances 5 Treffer
- applied sciences 5 Treffer
- integration 5 Treffer
Sprache
1.887 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-12-01), S. 6430-6436Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-04-01), S. 2083-2091Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-04-01), S. 2077-2082Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), S. 913-920Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-04-01), S. 1446-1453Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-02-01), S. 746-752Online unknownZugriff:
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In: Silicon, Jg. 14 (2021-01-07), S. 1169-1177Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 42 (2021), S. 110-113Online unknownZugriff:
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In: Materials Today: Proceedings, Jg. 43 (2021), S. 3675-3678Online unknownZugriff:
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In: IEEE Transactions on Circuits and Systems I: Regular Papers, Jg. 67 (2020-12-01), S. 4281-4294Online unknownZugriff:
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In: IEEE Transactions on Circuits and Systems II: Express Briefs, Jg. 68 (2021-02-01), S. 562-567Online unknownZugriff:
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In: IEEE Transactions on Circuits and Systems I: Regular Papers, Jg. 67 (2020-12-01), S. 4593-4606Online unknownZugriff:
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In: Journal of Information Display, Jg. 21 (2020-06-01), S. 131-137Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020-10-01), S. 4010-4020Online unknownZugriff:
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In: IET Circuits, Devices & Systems, Jg. 14 (2020-09-01), S. 908-914Online unknownZugriff:
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In: Journal of Computational Electronics, Jg. 19 (2020-07-27), S. 1685-1694Online unknownZugriff:
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In: Silicon, Jg. 13 (2020-07-13), S. 1939-1949Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 20 (2020-06-01), S. 459-467Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020-11-01), S. 4631-4635Online unknownZugriff: