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Weniger Treffer
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Schlagwort
- business 29 Treffer
- business.industry 29 Treffer
- cmos 28 Treffer
- 02 engineering and technology 27 Treffer
- hardware_logicdesign 27 Treffer
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45 weitere Werte:
- nmos logic 21 Treffer
- electrical engineering 17 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 16 Treffer
- electrical and electronic engineering 15 Treffer
- electronic engineering 15 Treffer
- materials science 13 Treffer
- optoelectronics 11 Treffer
- engineering 10 Treffer
- mosfet 10 Treffer
- 0210 nano-technology 9 Treffer
- 021001 nanoscience & nanotechnology 9 Treffer
- computer science 9 Treffer
- 020202 computer hardware & architecture 8 Treffer
- 020208 electrical & electronic engineering 8 Treffer
- condensed matter physics 8 Treffer
- electronic circuit 8 Treffer
- electronic, optical and magnetic materials 8 Treffer
- logic gate 6 Treffer
- negative-bias temperature instability 6 Treffer
- voltage 6 Treffer
- reliability (semiconductor) 5 Treffer
- static random-access memory 5 Treffer
- 010308 nuclear & particles physics 4 Treffer
- safety, risk, reliability and quality 4 Treffer
- surfaces, coatings and films 4 Treffer
- threshold voltage 4 Treffer
- atomic and molecular physics, and optics 3 Treffer
- capacitance 3 Treffer
- degradation (telecommunications) 3 Treffer
- general engineering 3 Treffer
- hardware and architecture 3 Treffer
- integrated circuit 3 Treffer
- inverter 3 Treffer
- node (circuits) 3 Treffer
- ac power 2 Treffer
- biasing 2 Treffer
- circuit design 2 Treffer
- digital electronics 2 Treffer
- hardware_general 2 Treffer
- hardware_memorystructures 2 Treffer
- image sensor 2 Treffer
- instrumentation 2 Treffer
- logic level 2 Treffer
- materials chemistry 2 Treffer
- memory cell 2 Treffer
Verlag
Publikation
- microelectronics reliability 3 Treffer
- 2016 2nd international conference on advances in electrical, electronics, information, communication and bio-informatics (aeeicb) 1 Treffer
- 2016 ieee 25th asian test symposium (ats) 1 Treffer
- 2016 ieee sensors 1 Treffer
- 2016 international conference on signal processing and communication (icsc) 1 Treffer
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23 weitere Werte:
- 2017 ieee international electron devices meeting (iedm) 1 Treffer
- 2017 international conference on noise and fluctuations (icnf) 1 Treffer
- 2018 ieee 27th asian test symposium (ats) 1 Treffer
- 2018 ieee international solid - state circuits conference - (isscc) 1 Treffer
- 2018 international soc design conference (isocc) 1 Treffer
- 2019 ieee international electron devices meeting (iedm) 1 Treffer
- 2019 international conference on ic design and technology (icicdt) 1 Treffer
- circuit world 1 Treffer
- circuits and systems 1 Treffer
- computing in science & engineering 1 Treffer
- ieee journal of solid-state circuits 1 Treffer
- ieee transactions on device and materials reliability 1 Treffer
- ieee transactions on nuclear science 1 Treffer
- ieee transactions on very large scale integration (vlsi) systems 1 Treffer
- iet circuits, devices & systems 1 Treffer
- journal of circuits, systems and computers 1 Treffer
- journal of electronic testing 1 Treffer
- materials science forum 1 Treffer
- microsystem technologies 1 Treffer
- nuclear instruments and methods in physics research section a: accelerators, spectrometers, detectors and associated equipment 1 Treffer
- proceedings of the 2020 international symposium on physical design 1 Treffer
- sensors and actuators a: physical 1 Treffer
- solid-state electronics 1 Treffer
Sprache
34 Treffer
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In: IET Circuits, Devices & Systems, Jg. 14 (2020-04-30), S. 555-561Online unknownZugriff:
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In: Microsystem Technologies, Jg. 27 (2018-09-22), S. 601-612Online unknownZugriff:
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First Demonstration of CMOS Inverter and 6T-SRAM Based on GAA CFETs Structure for 3D-IC ApplicationsIn: 2019 IEEE International Electron Devices Meeting (IEDM), 2019-12-01Online unknownZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 53 (2018-02-01), S. 656-667Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), S. 418-425Online unknownZugriff:
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In: 2018 International Semiconductor Conference (CAS), 2018-10-01Online unknownZugriff:
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In: Circuits and Systems, 2016, S. 2622-2632Online unknownZugriff:
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In: 2016 International Conference on Signal Processing and Communication (ICSC), 2016-12-01Online unknownZugriff:
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In: 2016 2nd International Conference on Advances in Electrical, Electronics, Information, Communication and Bio-Informatics (AEEICB), 2016-02-01Online unknownZugriff:
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In: Journal of Circuits, Systems and Computers, Jg. 27 (2018-05-24), S. 1850160-1850160Online unknownZugriff:
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In: 2016 IEEE SENSORS, 2016-10-01Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 20 (2020-03-01), S. 58-66Online unknownZugriff:
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In: Circuit World, Jg. 48 (2021-06-17), S. 322-332Online unknownZugriff:
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In: Proceedings of the 2020 International Symposium on Physical Design, 2020-03-30Online unknownZugriff:
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In: Materials Science Forum, Jg. 897 (2017-05-01), S. 513-516Online unknownZugriff:
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In: Computing in Science & Engineering, Jg. 19 (2017-03-01), S. 51-62Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 62 (2016-07-01), S. 156-166Online unknownZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 24 (2016-02-01), S. 521-529Online unknownZugriff: