Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Schlagwort
- condensed matter physics 3 Treffer
- doping 3 Treffer
- optoelectronics 3 Treffer
- analytical chemistry 2 Treffer
- band gap 2 Treffer
-
45 weitere Werte:
- cathodoluminescence 2 Treffer
- dopant 2 Treffer
- electrical and electronic engineering 2 Treffer
- general materials science 2 Treffer
- instrumentation 2 Treffer
- law 2 Treffer
- law.invention 2 Treffer
- optics 2 Treffer
- qc 2 Treffer
- scanning electron microscope 2 Treffer
- spectroscopy 2 Treffer
- wide-bandgap semiconductor 2 Treffer
- [phys.cond.cm-ms]physics [physics]/condensed matter [cond-mat]/materials science [cond-mat.mtrl-sci] 1 Treffer
- annular dark-field imaging 1 Treffer
- applied mathematics 1 Treffer
- characterization (materials science) 1 Treffer
- chemical vapor deposition 1 Treffer
- chemistry 1 Treffer
- chemistry.chemical_compound 1 Treffer
- conventional transmission electron microscope 1 Treffer
- ddc:530 1 Treffer
- electron beam-induced deposition 1 Treffer
- electron microprobe 1 Treffer
- electron microscope 1 Treffer
- electronic, optical and magnetic materials 1 Treffer
- emission spectrum 1 Treffer
- engineering (miscellaneous) 1 Treffer
- environmental scanning electron microscope 1 Treffer
- gan 1 Treffer
- high-resolution transmission electron microscopy 1 Treffer
- hrem 1 Treffer
- ingot 1 Treffer
- light-emitting diode 1 Treffer
- luminescence 1 Treffer
- materials chemistry 1 Treffer
- mbe 1 Treffer
- mechanical engineering 1 Treffer
- mechanics of materials 1 Treffer
- metalorganic vapour phase epitaxy 1 Treffer
- microprobe 1 Treffer
- microscope 1 Treffer
- molecular beam epitaxy 1 Treffer
- nano 1 Treffer
- nanotechnology 1 Treffer
- scanning transmission electron microscopy 1 Treffer
Verlag
Publikation
Sprache
5 Treffer
-
In: Superlattices and Microstructures, Jg. 45 (2009-04-01), S. 407-412Online unknownZugriff:
-
In: Materials Science and Engineering: B, Jg. 105 (2003-12-01), S. 114-117Online unknownZugriff:
-
In: Measurement Science and Technology, Jg. 28 (2016-12-08), S. 015904-15904Online unknownZugriff: