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In: Solid-State Electronics, Jg. 154 (2019-04-01), S. 7-11Online unknownZugriff:
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In: Solid-State Electronics, Jg. 135 (2017-09-01), S. 100-104Online unknownZugriff:
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In: Solid-State Electronics, Jg. 173 (2020-11-01), S. 107901-107901Online unknownZugriff:
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In: Solid-State Electronics, Jg. 162 (2019-12-01), S. 107630-107630Online unknownZugriff:
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In: Solid-State Electronics, 2012Online unknownZugriff:
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In: Solid-State Electronics, 2011Online unknownZugriff:
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In: Solid-State Electronics, Jg. 156 (2019-06-01), S. 33-40Online unknownZugriff:
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In: Solid-State Electronics, Jg. 159 (2019-09-01), S. 90-98Online unknownZugriff:
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In: Solid-State Electronics, Jg. 125 (2016-11-01), S. 82-102Online unknownZugriff:
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In: Solid-State Electronics, Jg. 143 (2018-05-01), S. 97-102Online unknownZugriff:
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In: Solid-State Electronics, Jg. 125 (2016-11-01), S. 214-219Online unknownZugriff:
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In: Solid-State Electronics, Jg. 117 (2016-03-01), S. 2-9Online unknownZugriff:
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In: Solid-State Electronics, Jg. 116 (2016-02-01), S. 8-11Online unknownZugriff:
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In: Solid-State Electronics, Jg. 108 (2015-06-01), S. 24-29Online unknownZugriff:
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In: Solid-State Electronics, Jg. 70 (2012-04-01), S. 8-13Online unknownZugriff:
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A new method for characterization of gate overlap capacitances and effective channel size in MOSFETsIn: Solid-State Electronics, Jg. 159 (2019-09-01), S. 184-190Online unknownZugriff: