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In: Sensors, Jg. 19 (2019-04-01), Heft 8Online unknownSiehe Detailanzeige für VolltextZugriff:
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In: IEEE Journal of Selected Topics in Quantum Electronics, Jg. 23 (2017-05-01), S. 64-76Online unknownZugriff:
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In: Nature Nanotechnology, Jg. 12 (2017-02-13), S. 460-466Online unknownZugriff:
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In: Optical Materials, Jg. 102 (2020-04-01), S. 109783-109783Online unknownZugriff:
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In: ACS Photonics, Jg. 6 (2019-09-18), S. 2523-2529Online unknownZugriff:
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In: Optics Express, Jg. 27 (2019-09-11), S. 26924-26924Online unknownZugriff:
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In: Optics Express, Jg. 26 (2018-02-15), S. 4842-4842Online unknownZugriff:
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In: Conference on Lasers and Electro-Optics, 2016Online unknownZugriff:
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In: Sensors, 2020-05-12Online unknownSiehe Detailanzeige für VolltextZugriff:
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In: Semiconductors, Jg. 52 (2018-12-01), S. 1958-1962Online unknownSiehe Detailanzeige für VolltextZugriff:
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In: Sensors; Volume 18; Issue 1; Pages: 107, 2018-01-02Online unknownSiehe Detailanzeige für VolltextZugriff:
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In: Microelectronics Reliability, Jg. 72 (2017-05-01), S. 24-29Online unknownZugriff:
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In: Photonics, Jg. 1 (2014-07-02), S. 162-197Online unknownZugriff:
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In: Microelectronic Engineering, Jg. 232 (2020-08-01), S. 111416-111416Online unknownZugriff:
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In: Sensors (Basel, Switzerland), Jg. 18 (2018-06-01), Heft 7Online unknownZugriff:
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Improved high-temperature etch processing of high-k metal gate stacks in scaled TANOS memory devicesIn: Microelectronic Engineering, Jg. 87 (2010-05-01), S. 1629-1633Online unknownZugriff:
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In: Optics Express, Jg. 26 (2018-04-10), S. 10305-10305Online unknownZugriff:
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In: Microelectronic Engineering, 2011-07-01Online unknownZugriff: