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In: IEEE Transactions on Reliability, Jg. 66 (2017-09-01), Heft 3, S. 603-615Online academicJournalZugriff:
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In: IEEE Transactions on Reliability, Jg. 66 (2017-09-01), S. 603-615Online unknownZugriff:
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In: ISSN: 0018-9529 ; IEEE Transactions on Reliability ; https://hal.archives-ouvertes.fr/hal-01652218 ; IEEE Transactions on Reliability, Institute of Electrical and Electronics Engineers, 2017, 66 (3), pp.603 - 615. ⟨10.1109/TR.2017.2696341⟩, 2017Online academicJournalZugriff: