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- cmos image sensors 3 Treffer
- irradiation 3 Treffer
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- complementary metal oxide semiconductors 2 Treffer
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- active pixel sensors 1 Treffer
- aps 1 Treffer
- clusters 1 Treffer
- dark current distribution 1 Treffer
- degradation 1 Treffer
- detectors 1 Treffer
- digital cameras 1 Treffer
- doping 1 Treffer
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- gamma rays 1 Treffer
- image converters 1 Treffer
- image sensors 1 Treffer
- interface states 1 Treffer
- ionization 1 Treffer
- ionizing radiation 1 Treffer
- ions 1 Treffer
- layout 1 Treffer
- mathematical models 1 Treffer
- metal semiconductor field-effect transistors 1 Treffer
- monolithic active pixel sensor (maps) 1 Treffer
- monte carlo method 1 Treffer
- neutrons 1 Treffer
- niel 1 Treffer
- point defects 1 Treffer
- protons 1 Treffer
- radiation hardening 1 Treffer
- radiation hardening (electronics) 1 Treffer
- radiation hardening by design (rhbd) 1 Treffer
- radiation-induced defects 1 Treffer
- rutherford scattering 1 Treffer
- shallow trench isolation (sti) 1 Treffer
- spectroscopy 1 Treffer
- total ionizing dose (tid) 1 Treffer
- trapped charge 1 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 27-37Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 63 (2016-08-01), Heft a4, S. 2183-2192Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 58 (2011-12-01), Heft 6, S. 3076-3084Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 59 (2012-04-15), Heft 4, S. 909-917Online academicJournalZugriff: