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- complementary metal oxide semiconductors 3 Treffer
- sensitivity 3 Treffer
- cmos 2 Treffer
- cmos integrated circuits 2 Treffer
- radiation 2 Treffer
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45 weitere Werte:
- shallow trench isolation (sti) 2 Treffer
- total ionizing dose (tid) 2 Treffer
- acquisition of data 1 Treffer
- bipolar 1 Treffer
- charge carrier processes 1 Treffer
- circuit model 1 Treffer
- degradation 1 Treffer
- dose rate 1 Treffer
- electric fields 1 Treffer
- enhanced low dose rate sensitivity (eldrs) 1 Treffer
- fet 1 Treffer
- field effect transistors 1 Treffer
- field-effect transistors 1 Treffer
- hadron colliders 1 Treffer
- heterojunction bipolar transistors 1 Treffer
- holes (electron deficiencies) 1 Treffer
- information retrieval 1 Treffer
- interface traps 1 Treffer
- inverters 1 Treffer
- logic circuits 1 Treffer
- logic gates 1 Treffer
- microelectronics 1 Treffer
- mosfet 1 Treffer
- musca sep3 1 Treffer
- neutrons 1 Treffer
- numerical calculations 1 Treffer
- oxides 1 Treffer
- protons 1 Treffer
- pulsed-laser 1 Treffer
- radiation doses 1 Treffer
- radiation-hardening-by-design (rhbd) 1 Treffer
- semiconductor device measurement 1 Treffer
- semiconductor device modeling 1 Treffer
- semiconductor devices 1 Treffer
- sige hbt 1 Treffer
- silicon compounds 1 Treffer
- silicon dioxide 1 Treffer
- silicon germanium 1 Treffer
- silicon germanium integrated circuits 1 Treffer
- single event effects 1 Treffer
- single event latchup 1 Treffer
- single event transients 1 Treffer
- single-event effect (see) 1 Treffer
- single-event transient (set) 1 Treffer
- single-pole single-throw (spst) 1 Treffer
Sprache
4 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), Heft 5, S. 573-580Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 61 (2014-12-01), Heft 6, S. 3543-3549Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 62 (2015-12-01), Heft 6a, S. 3057-3063Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 58 (2011-12-01), Heft 6, S. 2945-2952Online academicJournalZugriff: