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- image sensors 3 Treffer
- radiation effects 3 Treffer
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- cmos image sensor (cis) 2 Treffer
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- ccd image sensors 1 Treffer
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- charge transfer 1 Treffer
- cmos image sensor 1 Treffer
- cmos image sensors (cis) 1 Treffer
- complementary metal oxide semiconductors 1 Treffer
- crosstalk 1 Treffer
- crystal structure 1 Treffer
- dark currents (electric) 1 Treffer
- data models 1 Treffer
- diffusion tensor imaging 1 Treffer
- displacement damage dose (ddd) 1 Treffer
- epitaxial layer 1 Treffer
- epitaxial layers 1 Treffer
- extreme value theory 1 Treffer
- gamma ray bursts 1 Treffer
- histograms 1 Treffer
- ionizing radiation dosage 1 Treffer
- ionizing radiation measurement 1 Treffer
- monolithic active pixel sensor (maps) 1 Treffer
- photonic band gap 1 Treffer
- proton irradiation 1 Treffer
- protons 1 Treffer
- radiation damage 1 Treffer
- silicon 1 Treffer
- solid state detectors 1 Treffer
- statistical analysis 1 Treffer
- switches 1 Treffer
- temperature measurement 1 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 38-44Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 61 (2014-03-01), Heft 2, S. 939-947Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 19-26Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 60 (2013-12-01), Heft 6, S. 4323-4331Online academicJournalZugriff: