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In: Microelectronics Reliability, Jg. 50 (2010-02-01), S. 169-173Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 48 (2008-11-01), S. 1786-1790Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 49 (2009-09-01), S. 1107-1110Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 39 (1999-06-01), S. 957-961Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 38 (1998-10-01), S. 1547-1552Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 38 (1998-10-01), S. 1621-1626Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 32 (1992-07-01), S. 941-944Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 127 (2021-12-01), S. 114414-114414Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 72 (2017-05-01), S. 24-29Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 61 (2016-06-01), S. 125-128Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 42 (2002), S. 3-13Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 50 (2010-05-01), S. 662-665Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 41 (2001-11-01), S. 1761-1770Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 38 (1998-09-01), S. 1401-1405Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 15 (1976), S. 113-122Online unknownZugriff: