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Weniger Treffer
Gefunden in
Schlagwort
- cmos 102 Treffer
- 02 engineering and technology 94 Treffer
- optoelectronics 82 Treffer
- materials science 72 Treffer
- law 60 Treffer
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45 weitere Werte:
- law.invention 60 Treffer
- 0210 nano-technology 57 Treffer
- 021001 nanoscience & nanotechnology 57 Treffer
- electrical and electronic engineering 57 Treffer
- electrical engineering 56 Treffer
- hardware_integratedcircuits 50 Treffer
- transistor 47 Treffer
- electronic, optical and magnetic materials 42 Treffer
- hardware_performanceandreliability 42 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 37 Treffer
- hardware_logicdesign 37 Treffer
- engineering 28 Treffer
- electronic engineering 24 Treffer
- 020208 electrical & electronic engineering 22 Treffer
- chemistry 21 Treffer
- computer science 18 Treffer
- voltage 18 Treffer
- electronic circuit 17 Treffer
- silicon on insulator 17 Treffer
- threshold voltage 17 Treffer
- 010308 nuclear & particles physics 15 Treffer
- nmos logic 14 Treffer
- semiconductor device modeling 14 Treffer
- [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics 13 Treffer
- chemistry.chemical_compound 12 Treffer
- physics 12 Treffer
- integrated circuit 11 Treffer
- chemistry.chemical_element 10 Treffer
- 020206 networking & telecommunications 9 Treffer
- capacitance 9 Treffer
- gate oxide 9 Treffer
- subthreshold conduction 9 Treffer
- inverter 8 Treffer
- scaling 8 Treffer
- silicon 8 Treffer
- biotechnology 7 Treffer
- energy (signal processing) 7 Treffer
- fabrication 7 Treffer
- field-effect transistor 7 Treffer
- hardware_arithmeticandlogicstructures 7 Treffer
- noise (electronics) 7 Treffer
- reliability (semiconductor) 7 Treffer
- subthreshold slope 7 Treffer
- electronics 6 Treffer
- hardware_general 6 Treffer
Verlag
Publikation
- ieee transactions on electron devices 18 Treffer
- ieee journal of the electron devices society 7 Treffer
- ieee transactions on device and materials reliability 6 Treffer
- ieee transactions on nuclear science 4 Treffer
- ieee electron device letters 3 Treffer
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45 weitere Werte:
- indrastra global 3 Treffer
- 2016 13th ieee international conference on solid-state and integrated circuit technology (icsict) 2 Treffer
- 2016 ieee international electron devices meeting (iedm) 2 Treffer
- 2016 ieee silicon nanoelectronics workshop (snw) 2 Treffer
- 2017 75th annual device research conference (drc) 2 Treffer
- 2018 33rd symposium on microelectronics technology and devices (sbmicro) 2 Treffer
- 2018 ieee computer society annual symposium on vlsi (isvlsi) 2 Treffer
- 2019 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s) 2 Treffer
- ieee transactions on nanotechnology 2 Treffer
- ieee transactions on terahertz science and technology 2 Treffer
- 2016 13th international conference on electrical engineering, computing science and automatic control (cce) 1 Treffer
- 2016 16th european conference on radiation and its effects on components and systems (radecs) 1 Treffer
- 2016 28th international symposium on power semiconductor devices and ics (ispsd) 1 Treffer
- 2016 46th european solid-state device research conference (essderc) 1 Treffer
- 2016 50th asilomar conference on signals, systems and computers 1 Treffer
- 2016 74th annual device research conference (drc) 1 Treffer
- 2016 compound semiconductor week (csw) [includes 28th international conference on indium phosphide & related materials (iprm) & 43rd international symposium on compound semiconductors (iscs) 1 Treffer
- 2016 ieee applied power electronics conference and exposition (apec) 1 Treffer
- 2016 ieee international conference on electronics, circuits and systems (icecs) 1 Treffer
- 2016 ieee international reliability physics symposium (irps) 1 Treffer
- 2016 ifip/ieee international conference on very large scale integration (vlsi-soc) 1 Treffer
- 2016 international conference on circuit, power and computing technologies (iccpct) 1 Treffer
- 2016 international conference on simulation of semiconductor processes and devices (sispad) 1 Treffer
- 2016 international symposium on integrated circuits (isic) 1 Treffer
- 2016 progress in electromagnetic research symposium (piers) 1 Treffer
- 2017 14th international conference on electrical engineering, computing science and automatic control (cce) 1 Treffer
- 2017 china semiconductor technology international conference (cstic) 1 Treffer
- 2017 ieee 17th international conference on communication technology (icct) 1 Treffer
- 2017 ieee 24th international symposium on the physical and failure analysis of integrated circuits (ipfa) 1 Treffer
- 2017 ieee 60th international midwest symposium on circuits and systems (mwscas) 1 Treffer
- 2017 ieee compound semiconductor integrated circuit symposium (csics) 1 Treffer
- 2017 ieee international integrated reliability workshop (iirw) 1 Treffer
- 2017 international conference on electron devices and solid-state circuits (edssc) 1 Treffer
- 2018 10th international conference on communications, circuits and systems (icccas) 1 Treffer
- 2018 18th european conference on radiation and its effects on components and systems (radecs) 1 Treffer
- 2018 4th international conference on devices, circuits and systems (icdcs) 1 Treffer
- 2018 ieee 18th international conference on nanotechnology (ieee-nano) 1 Treffer
- 2018 ieee 30th international symposium on power semiconductor devices and ics (ispsd) 1 Treffer
- 2018 ieee radio frequency integrated circuits symposium (rfic) 1 Treffer
- 2018 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s) 1 Treffer
- 2018 international soc design conference (isocc) 1 Treffer
- 2018 second international conference on intelligent computing and control systems (iciccs) 1 Treffer
- 2019 34th symposium on microelectronics technology and devices (sbmicro) 1 Treffer
- 2019 ieee biomedical circuits and systems conference (biocas) 1 Treffer
- 2019 mixdes - 26th international conference "mixed design of integrated circuits and systems" 1 Treffer
Sprache
130 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), S. 573-580Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 9 (2021), S. 415-423Online unknownZugriff:
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In: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT), 2020-11-03Online unknownZugriff:
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In: IEEE Photonics Journal, Jg. 11 (2019-06-01), S. 1-10Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 66 (2019-04-01), S. 1648-1655Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 7 (2019), S. 227-238Online unknownZugriff:
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In: 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2020-11-08Online unknownZugriff:
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In: 2020 IEEE 20th International Conference on Nanotechnology (IEEE-NANO), 2020-07-01Online unknownZugriff:
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In: 2020 17th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE), 2020-11-11Online unknownZugriff:
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In: 2019 IEEE Biomedical Circuits and Systems Conference (BioCAS), 2019-10-01Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 18 (2018-03-01), S. 27-36Online unknownZugriff:
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In: IEEE Transactions on Nanotechnology, Jg. 17 (2018-05-01), S. 424-431Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), S. 550-557Online unknownZugriff:
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In: Materials Science in Semiconductor Processing, Jg. 66 (2017-08-01), S. 87-91Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 6 (2018), S. 1213-1219Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 63 (2016-08-01), S. 3354-3359Online unknownZugriff:
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In: 2018 International Semiconductor Conference (CAS), 2018-10-01Online unknownZugriff:
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In: 2018 33rd Symposium on Microelectronics Technology and Devices (SBMicro), 2018-08-01Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-06-01), S. 1118-1124Online unknownZugriff:
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In: 2017 14th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE), 2017-10-01Online unknownZugriff: