Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary mos technology 35 Treffer
- technologie mos complementaire 35 Treffer
- tecnologia mos complementario 35 Treffer
- evaluacion prestacion 18 Treffer
- evaluation performance 18 Treffer
-
45 weitere Werte:
- performance evaluation 18 Treffer
- capa empobrecimiento 14 Treffer
- couche appauvrissement 14 Treffer
- depletion layer 14 Treffer
- seuil tension 13 Treffer
- umbral tension 13 Treffer
- voltage threshold 13 Treffer
- couche ultramince 11 Treffer
- dual gate transistor 11 Treffer
- transistor de compuerta doble 11 Treffer
- transistor grille double 11 Treffer
- ultrathin films 11 Treffer
- grille transistor 9 Treffer
- rejilla transistor 9 Treffer
- self aligned technology 9 Treffer
- technologie autoalignee 9 Treffer
- tecnologia rejilla autoalineada 9 Treffer
- transistor gate 9 Treffer
- nmos technology 8 Treffer
- technologie nmos 8 Treffer
- tecnologia nmos 8 Treffer
- caracteristica electrica 7 Treffer
- caracteristique electrique 7 Treffer
- electrical characteristic 7 Treffer
- miniaturisation 7 Treffer
- miniaturizacion 7 Treffer
- miniaturization 7 Treffer
- canal n 6 Treffer
- damaging 6 Treffer
- deterioracion 6 Treffer
- doped materials 6 Treffer
- endommagement 6 Treffer
- field effect transistor 6 Treffer
- materiau dope 6 Treffer
- n channel 6 Treffer
- transistor efecto campo 6 Treffer
- transistor effet champ 6 Treffer
- autocalentamiento 5 Treffer
- autoechauffement 5 Treffer
- canal p 5 Treffer
- capa fina 5 Treffer
- circuit integre cmos 5 Treffer
- cmos integrated circuits 5 Treffer
- complementary mos transistor 5 Treffer
- couche mince 5 Treffer
Verlag
Publikation
- i.e.e.e. transactions on electron devices 11 Treffer
- microelectronic engineering 6 Treffer
- solid-state electronics 6 Treffer
- ieee electron device letters 4 Treffer
- ieee transactions on nanotechnology 3 Treffer
-
11 weitere Werte:
- microelectronics and reliability 3 Treffer
- 2004 ieee international soi conference (charleston sc, 4-7 october 2004) 2 Treffer
- infos 2007: proceedings of the 15th biennial conference on insulating films on semiconductors, june 20-23, 2007, glyfada athens, greece 2 Treffer
- semiconductor science and technology 2 Treffer
- techniques de l'ingenieur. electronique 2 Treffer
- 3rd international sige technology and device meeting (princeton, new jersey, 15-17 may 2006) 1 Treffer
- electron devices (san francisco ca, 8-11 december 2002, technical digest) 1 Treffer
- ieee transactions on very large scale integration (vlsi) systems 1 Treffer
- micro and nano engineering 2004: proceedings of the 30th international conference on micro and nano engineering, september 19-22, 2004, rotterdam, the netherlands 1 Treffer
- selected extended papers from ulis 2012 conference 1 Treffer
- selected full-length extended papers from the eurosoi 2009 conference 1 Treffer
Sprache
41 Treffer
-
In: Microelectronics and reliability, Jg. 53 (2013), Heft 3, S. 349-355academicJournalZugriff:
-
In: I.E.E.E. transactions on electron devices, Jg. 52 (2005), Heft 6, S. 1159-1164Online academicJournalZugriff:
-
In: Electron devices (San Francisco CA, 8-11 December 2002, technical digest), 2002, S. 943-945KonferenzZugriff:
-
In: IEEE electron device letters, Jg. 26 (2005), Heft 1, S. 26-28Online academicJournalZugriff:
-
In: INFOS 2007: Proceedings of the 15th Biennial Conference on Insulating Films on Semiconductors, June 20-23, Jg. 84 (2007), Heft 9-10, S. 2117-2120KonferenzZugriff:
-
In: Solid-state electronics, Jg. 51 (2007), Heft 1, S. 170-178academicJournalZugriff:
-
In: Microelectronic engineering, Jg. 94 (2012), S. 26-28academicJournalZugriff:
-
In: Solid-state electronics, Jg. 49 (2005), Heft 5, S. 684-694academicJournalZugriff:
-
In: Solid-state electronics, Jg. 52 (2008), Heft 6, S. 919-925academicJournalZugriff:
-
In: 3rd International SiGe Technology and Device Meeting (Princeton, New Jersey, 15-17 May 2006), Jg. 22 (2007), Heft 1Online KonferenzZugriff:
-
In: I.E.E.E. transactions on electron devices, Jg. 52 (2005), Heft 8, S. 1780-1786Online academicJournalZugriff:
-
In: I.E.E.E. transactions on electron devices, Jg. 57 (2010), Heft 9, S. 2067-2072Online academicJournalZugriff:
-
In: Selected Full-Length Extended Papers from the EUROSOI 2009 Conference, Jg. 54 (2010), Heft 2, S. 131-136academicJournalZugriff:
-
In: I.E.E.E. transactions on electron devices, Jg. 54 (2007), Heft 7, S. 1784-1788Online academicJournalZugriff:
-
In: I.E.E.E. transactions on electron devices, Jg. 54 (2007), Heft 6, S. 1464-1470Online academicJournalZugriff:
-
In: IEEE transactions on nanotechnology, Jg. 6 (2007), Heft 4, S. 421-430Online academicJournalZugriff:
-
In: I.E.E.E. transactions on electron devices, Jg. 60 (2013), Heft 6, S. 1878-1883Online academicJournalZugriff:
-
In: I.E.E.E. transactions on electron devices, Jg. 59 (2012), Heft 4, S. 994-1001Online academicJournalZugriff:
-
In: IEEE electron device letters, Jg. 27 (2006), Heft 3, S. 182-184Online academicJournalZugriff:
-
In: IEEE electron device letters, Jg. 27 (2006), Heft 4, S. 288-290Online academicJournalZugriff: