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Weniger Treffer
Gefunden in
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Schlagwort
- business 1.044 Treffer
- business.industry 1.044 Treffer
- optoelectronics 935 Treffer
- cmos 893 Treffer
- chemistry.chemical_element 770 Treffer
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45 weitere Werte:
- silicon 564 Treffer
- chemistry.chemical_compound 497 Treffer
- electrical engineering 430 Treffer
- law 351 Treffer
- law.invention 351 Treffer
- electrical and electronic engineering 341 Treffer
- electronic engineering 310 Treffer
- electronic, optical and magnetic materials 310 Treffer
- transistor 281 Treffer
- hardware_integratedcircuits 254 Treffer
- hardware_performanceandreliability 222 Treffer
- silicon on insulator 197 Treffer
- electron mobility 178 Treffer
- hardware_logicdesign 160 Treffer
- oxide 156 Treffer
- threshold voltage 156 Treffer
- gate oxide 142 Treffer
- condensed matter physics 127 Treffer
- silicon-germanium 113 Treffer
- field-effect transistor 111 Treffer
- logic gate 108 Treffer
- nanotechnology 102 Treffer
- 01 natural sciences 101 Treffer
- 0103 physical sciences 99 Treffer
- doping 99 Treffer
- 010302 applied physics 97 Treffer
- 02 engineering and technology 96 Treffer
- metal gate 94 Treffer
- germanium 91 Treffer
- hardware_general 86 Treffer
- dielectric 83 Treffer
- pmos logic 83 Treffer
- wafer 82 Treffer
- fabrication 79 Treffer
- nmos logic 79 Treffer
- analytical chemistry 78 Treffer
- ion implantation 78 Treffer
- leakage (electronics) 78 Treffer
- 0210 nano-technology 72 Treffer
- 021001 nanoscience & nanotechnology 72 Treffer
- gate dielectric 68 Treffer
- silicide 67 Treffer
- substrate (electronics) 65 Treffer
- annealing (metallurgy) 60 Treffer
- high-κ dielectric 60 Treffer
Verlag
- ieee 583 Treffer
- institute of electrical and electronics engineers (ieee) 217 Treffer
- elsevier bv 74 Treffer
- iop publishing 25 Treffer
- springer science and business media llc 23 Treffer
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45 weitere Werte:
- aip publishing 18 Treffer
- hal ccsd 14 Treffer
- japan soc. appl. phys 14 Treffer
- the electrochemical society 14 Treffer
- american vacuum society 8 Treffer
- institution of engineering and technology (iet) 8 Treffer
- spie 7 Treffer
- trans tech publications, ltd. 7 Treffer
- american vacuum soc 5 Treffer
- elsevier 5 Treffer
- aip 4 Treffer
- ire 4 Treffer
- japan soc. applied phys 4 Treffer
- springer berlin heidelberg 4 Treffer
- springer us 4 Treffer
- world scientific pub co pte lt 4 Treffer
- esd assoc 3 Treffer
- ieee / institute of electrical and electronics engineers incorporated:445 hoes lane:piscataway, nj 08854:(800)701-4333, (732)981-0060, email: subscription-service@ieee.org, internet: http://www.ieee.org, fax: (732)981-9667 3 Treffer
- imaps - international microelectronics assembly and packaging society 3 Treffer
- institute of electrical and electronics engineers 3 Treffer
- purdue university 3 Treffer
- american scientific publishers 2 Treffer
- arxiv 2 Treffer
- crc press 2 Treffer
- foundation of computer science 2 Treffer
- inderscience publishers 2 Treffer
- institute of electronics, information and communications engineers (ieice) 2 Treffer
- springer international publishing 2 Treffer
- springer new york 2 Treffer
- wiley 2 Treffer
- acm 1 Treffer
- american chemical society (acs) 1 Treffer
- asmedc 1 Treffer
- atlantis press 1 Treffer
- bonfring 1 Treffer
- cambridge university press 1 Treffer
- diva enterprises private limited 1 Treffer
- edp sciences 1 Treffer
- educational institution «belarusian state university of informatics and radioelectronics» 1 Treffer
- escholarship, university of california 1 Treffer
- hindawi limited 1 Treffer
- ibm 1 Treffer
- ieee-inst electrical electronics engineers inc, 445 hoes lane, piscataway, nj 08855 usa 1 Treffer
- institute of advanced engineering and science 1 Treffer
- wiley-vch 1 Treffer
Publikation
- ieee electron device letters 95 Treffer
- ieee transactions on electron devices 86 Treffer
- solid-state electronics 18 Treffer
- japanese journal of applied physics 16 Treffer
- microelectronic engineering 14 Treffer
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45 weitere Werte:
- thin solid films 11 Treffer
- ieee transactions on device and materials reliability 10 Treffer
- 2002 symposium on vlsi technology. digest of technical papers (cat. no.01ch37303) 9 Treffer
- applied physics letters 9 Treffer
- iedm technical digest. ieee international electron devices meeting, 2004. 9 Treffer
- ieee transactions on nuclear science 9 Treffer
- international electron devices meeting 1999. technical digest (cat. no.99ch36318) 9 Treffer
- mrs proceedings 9 Treffer
- 2009 ieee international electron devices meeting (iedm) 8 Treffer
- 2009 international semiconductor device research symposium 8 Treffer
- digest of technical papers. 2004 symposium on vlsi technology, 2004. 8 Treffer
- 1999 symposium on vlsi technology. digest of technical papers (ieee cat. no.99ch36325) 7 Treffer
- 2006 international sige technology and device meeting 7 Treffer
- ieee internationalelectron devices meeting, 2005. iedm technical digest. 7 Treffer
- international semiconductor device research symposium, 2003 7 Treffer
- journal of applied physics 7 Treffer
- 2007 ieee international electron devices meeting 6 Treffer
- digest. international electron devices meeting 6 Treffer
- ecs transactions 6 Treffer
- electronics letters 6 Treffer
- ieee transactions on nanotechnology 6 Treffer
- international electron devices meeting 2000. technical digest. iedm (cat. no.00ch37138) 6 Treffer
- international electron devices meeting. iedm technical digest 6 Treffer
- international electron devices meeting. technical digest (cat. no.01ch37224) 6 Treffer
- microelectronics reliability 6 Treffer
- proceedings of international electron devices meeting 6 Treffer
- semiconductor science and technology 6 Treffer
- 2001 symposium on vlsi technology. digest of technical papers (ieee cat. no.01 ch37184) 5 Treffer
- 2007 international symposium on vlsi technology, systems and applications (vlsi-tsa) 5 Treffer
- 2010 international electron devices meeting 5 Treffer
- 2013 ieee international electron devices meeting 5 Treffer
- digest of technical papers. 2005 symposium on vlsi technology, 2005. 5 Treffer
- 2001 ieee international soi conference. proceedings (cat. no.01ch37207) 4 Treffer
- 2003 symposium on vlsi technology. digest of technical papers (ieee cat. no.03ch37407) 4 Treffer
- 2004 ieee international reliability physics symposium. proceedings 4 Treffer
- 2006 international workshop on nano cmos 4 Treffer
- 2008 9th international conference on solid-state and integrated-circuit technology 4 Treffer
- 2008 ieee international electron devices meeting 4 Treffer
- 2008 international symposium on vlsi technology, systems and applications (vlsi-tsa) 4 Treffer
- 2008 symposium on vlsi technology 4 Treffer
- 2010 10th ieee international conference on solid-state and integrated circuit technology 4 Treffer
- 2010 symposium on vlsi technology 4 Treffer
- 2012 international silicon-germanium technology and device meeting (istdm) 4 Treffer
- chemical vapor deposition (print) 1 Treffer
- special issue on high-permittivity dielectric oxides 1 Treffer
Sprache
1.169 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-12-01), S. 6644-6647Online unknownZugriff:
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In: Silicon, Jg. 14 (2021-01-07), S. 1169-1177Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020), S. 224-229Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 7 (2019), S. 943-948Online unknownZugriff:
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In: npj 2D Materials and Applications, Jg. 5 (2021-01-04)Online unknownZugriff:
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In: 2020 IEEE International Electron Devices Meeting (IEDM), 2020-12-12Online unknownZugriff:
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In: Proceedings of the 14th International Joint Conference on Biomedical Engineering Systems and Technologies, 2021Online unknownZugriff:
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In: 2020 IEEE 20th International Conference on Nanotechnology (IEEE-NANO), 2020-07-01Online unknownZugriff:
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In: 2020 IEEE International Electron Devices Meeting (IEDM), 2020-12-12Online unknownZugriff:
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In: Solid-State Electronics, Jg. 186 (2021-12-01), S. 108126-108126Online unknownZugriff:
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In: 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2020Online unknownZugriff:
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In: Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT), Jg. 2017 (2017), S. 1-22Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 63 (2016-08-01), S. 3028-3035Online unknownZugriff:
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In: 2018 26th Telecommunications Forum (TELFOR), 2018-11-01Online unknownZugriff:
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In: 2018 IEEE Electron Devices Kolkata Conference (EDKCON), 2018-11-01Online unknownZugriff:
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In: 2019 IEEE 10th International Symposium on Power Electronics for Distributed Generation Systems (PEDG), 2019-06-01Online unknownZugriff:
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In: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS), 2019-03-01Online unknownZugriff:
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In: 2018 IEEE International Electron Devices Meeting (IEDM), 2018-12-01Online unknownZugriff: