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Weniger Treffer
Gefunden in
Schlagwort
- business 98 Treffer
- business.industry 98 Treffer
- optoelectronics 94 Treffer
- doping 60 Treffer
- electronic, optical and magnetic materials 42 Treffer
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45 weitere Werte:
- law 42 Treffer
- law.invention 42 Treffer
- electrical and electronic engineering 40 Treffer
- electrical engineering 39 Treffer
- thin-film transistor 39 Treffer
- transistor 36 Treffer
- electronic engineering 23 Treffer
- field-effect transistor 23 Treffer
- mosfet 23 Treffer
- chemistry.chemical_compound 22 Treffer
- engineering 18 Treffer
- ion implantation 18 Treffer
- oxide 17 Treffer
- engineering.material 16 Treffer
- condensed matter physics 15 Treffer
- polycrystalline silicon 14 Treffer
- analytical chemistry 11 Treffer
- degradation (geology) 11 Treffer
- electric field 11 Treffer
- general physics and astronomy 11 Treffer
- materials chemistry 10 Treffer
- substrate (electronics) 10 Treffer
- voltage 10 Treffer
- cmos 9 Treffer
- gate oxide 8 Treffer
- general engineering 8 Treffer
- hardware_integratedcircuits 8 Treffer
- transconductance 8 Treffer
- boron 7 Treffer
- fabrication 7 Treffer
- stress (mechanics) 7 Treffer
- dopant 6 Treffer
- leakage (electronics) 6 Treffer
- nitride 6 Treffer
- sheet resistance 6 Treffer
- surfaces, coatings and films 6 Treffer
- technology, industry, and agriculture 6 Treffer
- threshold voltage 6 Treffer
- annealing (metallurgy) 5 Treffer
- current (fluid) 5 Treffer
- grain boundary 5 Treffer
- hardware_performanceandreliability 5 Treffer
- nmos logic 5 Treffer
- passivation 5 Treffer
- reliability (semiconductor) 5 Treffer
Verlag
- institute of electrical and electronics engineers (ieee) 31 Treffer
- ieee 26 Treffer
- spie 10 Treffer
- elsevier bv 9 Treffer
- iop publishing 9 Treffer
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12 weitere Werte:
- springer science and business media llc 5 Treffer
- aip publishing 3 Treffer
- the electrochemical society 3 Treffer
- trans tech publications, ltd. 3 Treffer
- aip 2 Treffer
- institution of engineering and technology (iet) 2 Treffer
- ire 2 Treffer
- american vacuum society 1 Treffer
- ieee institute of electrical and electronic engineers 1 Treffer
- inst. electr. eng. japan 1 Treffer
- springer netherlands 1 Treffer
- wiley 1 Treffer
Publikation
- ieee transactions on electron devices 16 Treffer
- ieee electron device letters 14 Treffer
- spie proceedings 9 Treffer
- japanese journal of applied physics 8 Treffer
- solid-state electronics 5 Treffer
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41 weitere Werte:
- defect and diffusion forum 3 Treffer
- mrs proceedings 3 Treffer
- aip conference proceedings 2 Treffer
- applied physics letters 2 Treffer
- electronics letters 2 Treffer
- journal of the electrochemical society 2 Treffer
- technical digest., international electron devices meeting 2 Treffer
- thin solid films 2 Treffer
- 1984 international electron devices meeting 1 Treffer
- 1985 international electron devices meeting 1 Treffer
- 1987 international electron devices meeting 1 Treffer
- 1991 international symposium on vlsi technology, systems, and applications - proceedings of technical papers 1 Treffer
- 1996 ieee international soi conference proceedings 1 Treffer
- 2000 international conference on ion implantation technology proceedings. ion implantation technology - 2000 (cat. no.00ex432) 1 Treffer
- 2002 ieee international reliability physics symposium. proceedings. 40th annual (cat. no.02ch37320) 1 Treffer
- 2005 ieee international reliability physics symposium, 2005. proceedings. 43rd annual. 1 Treffer
- 2005 international vacuum nanoelectronics conference 1 Treffer
- 2006 8th international conference on solid-state and integrated circuit technology proceedings 1 Treffer
- 2007 international semiconductor device research symposium 1 Treffer
- 2020 china semiconductor technology international conference (cstic) 1 Treffer
- 23rd european mask and lithography conference 1 Treffer
- applied surface science 1 Treffer
- conference digest [late news papers volume included]device research conference, 2004. 62nd drc. 1 Treffer
- conference record of the twenty sixth ieee photovoltaic specialists conference - 1997 1 Treffer
- current applied physics 1 Treffer
- ecs transactions 1 Treffer
- electronic materials letters 1 Treffer
- iedm technical digest. ieee international electron devices meeting, 2004. 1 Treffer
- ieee journal on selected areas in communications 1 Treffer
- ieee transactions on device and materials reliability 1 Treffer
- international electron devices and materials symposium 1 Treffer
- international electron devices meeting 2000. technical digest. iedm (cat. no.00ch37138) 1 Treffer
- international electron devices meeting. iedm technical digest 1 Treffer
- international technical digest on electron devices meeting 1 Treffer
- journal of applied physics 1 Treffer
- journal of vacuum science & technology a: vacuum, surfaces, and films 1 Treffer
- proceedings of ieee international electron devices meeting 1 Treffer
- proceedings of the 13th international symposium on power semiconductor devices & ics. ipsd '01 (ieee cat. no.01ch37216) 1 Treffer
- science china information sciences 1 Treffer
- semiconductor science and technology 1 Treffer
- sid symposium digest of technical papers 1 Treffer
Sprache
110 Treffer
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In: Electronic Materials Letters, Jg. 8 (2012-06-01), S. 331-334Online unknownZugriff:
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In: Thin Solid Films, Jg. 427 (2003-03-01), S. 117-122Online unknownZugriff:
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In: Defect and Diffusion Forum, Jg. 307 (2010-12-01), S. 63-73Online unknownZugriff:
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In: Defect and Diffusion Forum, 2010-10-01, S. 71-84Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 10 (2010-03-01), S. 108-115Online unknownZugriff:
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In: Semiconductor Science and Technology, Jg. 21 (2006-01-26), S. 291-294Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 50 (2003-12-01), S. 2425-2433Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 49 (2002-06-01), S. 981-985Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009), S. 88-90Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 22 (2001-05-01), S. 236-238Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 39 (1992-06-01), S. 1469-1476Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 38 (1991-03-01), S. 584-591Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 38 (1991), S. 121-127Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 20 (1999-07-01), S. 335-337Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 17 (1996-12-01), S. 566-568Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 16 (1995-06-01), S. 245-247Online unknownZugriff:
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In: 1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers, 2002-12-09Online unknownZugriff:
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In: Proceedings of the 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 (IEEE Cat. No.01CH37216), 2002-11-13Online unknownZugriff:
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A new dopant activation technique for poly-Si TFTs with a self-aligned gate-overlapped LDD structureIn: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138), 2002-11-11Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 12 (1991-11-01), S. 596-598Online unknownZugriff: