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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- condensed matter: electronic structure, electrical, magnetic, and optical properties 51 Treffer
- etat condense: structure electronique, proprietes electriques, magnetiques et optiques 51 Treffer
- condensed matter: structure, mechanical and thermal properties 49 Treffer
- etat condense: structure, proprietes mecaniques et thermiques 49 Treffer
- mechanical polishing 33 Treffer
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45 weitere Werte:
- polissage mecanique 33 Treffer
- chemical polishing 31 Treffer
- polissage chimique 31 Treffer
- chemical mechanical polishing 23 Treffer
- compose mineral 22 Treffer
- inorganic compounds 20 Treffer
- materials science 19 Treffer
- science des materiaux 19 Treffer
- surface treatments 19 Treffer
- traitements de surface 19 Treffer
- atomic force microscopy 16 Treffer
- metal transition 16 Treffer
- microscopie force atomique 16 Treffer
- planarisation 16 Treffer
- planarization 16 Treffer
- polishing 16 Treffer
- copper 14 Treffer
- cuivre 14 Treffer
- transition elements 14 Treffer
- cu 12 Treffer
- silicon oxides 12 Treffer
- polissage mecanochimique 11 Treffer
- cmp 10 Treffer
- oxyde de silicium 10 Treffer
- sio2 10 Treffer
- o si 9 Treffer
- roughness 9 Treffer
- rugosite 9 Treffer
- applied sciences 8 Treffer
- sciences appliquees 8 Treffer
- spectre photoelectron rx 7 Treffer
- x-ray photoelectron spectra 7 Treffer
- chemical mechanical polishing (cmp) 6 Treffer
- corrosion 6 Treffer
- metals. metallurgy 6 Treffer
- metaux. metallurgie 6 Treffer
- microscopie electronique transmission 6 Treffer
- modelisation 6 Treffer
- modelling 6 Treffer
- silicium 6 Treffer
- silicon 6 Treffer
- structure surface 6 Treffer
- surface structure 6 Treffer
- transmission electron microscopy 6 Treffer
- composite materials 5 Treffer
Verlag
Publikation
- secondary ion mass spectrometry sims xiii: proceedings of the thirteenth international conference on secondary ion mass spectrometry and related topics nara-ken new public hall, nara, japan, november 11-16, 2001 2 Treffer
- icsfs-12: 12th international conference on solid films and surfaces, hamamatsu, japan, 21-25 june 2004 1 Treffer
- iscsi-4: proceedings of the fourth international symposium on the control of semiconductor interfaces, karuizawa, japan, october 21-25, 2002 1 Treffer
- proceedings of the 4th international conference on noncontact atomic force microscopy 1 Treffer
- proceedings of the e-mrs 2005 spring meeting symposium p: current trends in optical and x-ray metrology of advanced materials for nanoscale devices, strasbourg, france, may 31-june 3, 2005 1 Treffer
- 2 weitere Werte:
Sprache
66 Treffer
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In: Applied surface science, Jg. 316 (2014), S. 643-648academicJournalZugriff:
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In: ISCSI-4: Proceedings of the Fourth International Symposium on the Control of Semiconductor Interfaces, Karuizawa, Japan, October 21-25, 2002, Jg. 216 (2003), Heft 1-4, S. 46-53KonferenzZugriff:
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In: Applied surface science, Jg. 265 (2013), S. 764-770academicJournalZugriff:
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In: Applied surface science, Jg. 258 (2012), Heft 20, S. 8298-8306academicJournalZugriff:
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In: Secondary Ion Mass Spectrometry SIMS XIII: Proceedings of the Thirteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics Nara-Ken New Public Hall, Jg. 203-04 (2003), S. 473-477KonferenzZugriff:
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In: Applied surface science, Jg. 257 (2011), Heft 20, S. 8679-8685academicJournalZugriff:
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In: Applied surface science, Jg. 257 (2011), Heft 7, S. 2905-2911academicJournalZugriff:
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In: Applied surface science, Jg. 255 (2009), Heft 23, S. 9469-9473academicJournalZugriff:
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In: Applied surface science, Jg. 253 (2007), Heft 21, S. 8754-8761academicJournalZugriff:
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In: Applied surface science, Jg. 236 (2004), Heft 1-4, S. 120-130academicJournalZugriff:
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In: Applied surface science, Jg. 252 (2006), Heft 22, S. 7760-7765academicJournalZugriff:
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In: Applied surface science, Jg. 320 (2014), S. 531-537academicJournalZugriff:
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In: Applied surface science, Jg. 317 (2014), S. 332-337academicJournalZugriff:
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In: Secondary Ion Mass Spectrometry SIMS XIII: Proceedings of the Thirteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics Nara-Ken New Public Hall, Jg. 203-04 (2003), S. 470-472KonferenzZugriff:
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In: Applied surface science, Jg. 228 (2004), Heft 1-4, S. 410-417academicJournalZugriff:
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In: Applied surface science, Jg. 254 (2008), Heft 21, S. 6793-6798academicJournalZugriff:
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In: Applied surface science, Jg. 293 (2014), S. 287-292academicJournalZugriff:
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In: Applied surface science, Jg. 258 (2012), Heft 12, S. 5185-5190academicJournalZugriff:
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In: Applied surface science, Jg. 257 (2011), Heft 14, S. 6163-6170academicJournalZugriff:
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In: Applied surface science, Jg. 257 (2011), Heft 20, S. 8518-8524academicJournalZugriff: