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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- circuits electriques, optiques et optoelectroniques 37 Treffer
- electric, optical and optoelectronic circuits 37 Treffer
- circuit properties 33 Treffer
- proprietes des circuits 33 Treffer
- circuits electroniques 32 Treffer
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45 weitere Werte:
- electronic circuits 32 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 27 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 27 Treffer
- transistors 25 Treffer
- evaluacion prestacion 23 Treffer
- evaluation performance 23 Treffer
- performance evaluation 23 Treffer
- circuit integre 17 Treffer
- circuito integrado 17 Treffer
- integrated circuit 17 Treffer
- circuit integre radiofrequence 13 Treffer
- electronique faible puissance 13 Treffer
- low-power electronics 13 Treffer
- radiofrequency integrated circuits 13 Treffer
- electronica potencia 12 Treffer
- electronique puissance 12 Treffer
- power electronics 12 Treffer
- amplificateurs 11 Treffer
- amplifiers 11 Treffer
- optimisation 11 Treffer
- optimizacion 11 Treffer
- optimization 11 Treffer
- delay time 10 Treffer
- temps retard 10 Treffer
- tiempo retardo 10 Treffer
- transistor 10 Treffer
- alimentacion electrica 9 Treffer
- alimentation electrique 9 Treffer
- circuit design 9 Treffer
- circuits numeriques 9 Treffer
- commutation 9 Treffer
- conception circuit 9 Treffer
- conmutacion 9 Treffer
- digital circuits 9 Treffer
- diseno circuito 9 Treffer
- disipacion energia 9 Treffer
- dissipation energie 9 Treffer
- energy dissipation 9 Treffer
- implementacion 9 Treffer
- implementation 9 Treffer
- inverter 9 Treffer
- ondulador 9 Treffer
- onduleur 9 Treffer
- power supply 9 Treffer
- switching 9 Treffer
Publikation
- microelectronics journal 22 Treffer
- microelectronics and reliability 18 Treffer
- integration (amsterdam) 8 Treffer
- solid-state electronics 8 Treffer
- microelectronic engineering 3 Treffer
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7 weitere Werte:
- organic electronics (print) 2 Treffer
- 14th workshop on dielectrics in microelectronics (wodim 2006) 1 Treffer
- amf/rf[ams/rf] cmos circuit design for wireless transceivers 1 Treffer
- micro/nano devices and systems 2013: an open thematic journal issue 1 Treffer
- negative-bias-temperature instability (nbti) in mos devices special sectio n 1 Treffer
- special issue devoted to the 2nd international memory workshop (imw 2010) 1 Treffer
- special issue with papers selected from the ultimate integration on silicon conference, ulis 2008 1 Treffer
Sprache
61 Treffer
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In: Microelectronics and reliability, Jg. 54 (2014), Heft 1, S. 90-99academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 4, S. 510-531academicJournalZugriff:
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-state electronics, Jg. 91 (2014), S. 81-86academicJournalZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 155-158academicJournalZugriff:
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In: Solid-state electronics, Jg. 98 (2014), S. 26-31academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 3, S. 349-355academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 4, S. 592-599academicJournalZugriff:
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In: Solid-state electronics, Jg. 81 (2013), S. 151-156academicJournalZugriff:
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In: AMF/RF[AMS/RF] CMOS Circuit Design for Wireless Transceivers, Jg. 42 (2009), Heft 1, S. 83-88academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 51 (2011), Heft 12, S. 2357-2365academicJournalZugriff:
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In: Microelectronic engineering, Jg. 88 (2011), Heft 6, S. 888-901academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 51 (2011), Heft 5, S. 871-878academicJournalZugriff:
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In: Solid-state electronics, Jg. 61 (2011), Heft 1, S. 38-45academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 44 (2011), Heft 2, S. 136-143academicJournalZugriff:
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In: Microelectronics journal, Jg. 41 (2010), Heft 12, S. 897-905academicJournalZugriff:
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In: Microelectronics journal, Jg. 41 (2010), Heft 4, S. 247-255academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 50 (2010), Heft 8, S. 1054-1061academicJournalZugriff:
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In: Microelectronics journal, Jg. 41 (2010), Heft 4, S. 231-239academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 45 (2012), Heft 1, S. 33-45academicJournalZugriff:
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In: Microelectronics journal, Jg. 40 (2009), Heft 1, S. 156-176academicJournalZugriff: