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In: IEEE journal of solid-state circuits, Jg. 41 (2006), Heft 6, S. 1455-1462Online academicJournalZugriff:
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In: IEEE transactions on very large scale integration (VLSI) systems, Jg. 10 (2002), Heft 4, S. 469-476Online academicJournalZugriff:
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In: IEEE transactions on very large scale integration (VLSI) systems, Jg. 21 (2013), Heft 8, S. 1410-1420Online academicJournalZugriff:
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In: IEEE transactions on very large scale integration (VLSI) systems, Jg. 21 (2013), Heft 2, S. 380-384Online academicJournalZugriff:
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In: IEEE transactions on very large scale integration (VLSI) systems, Jg. 11 (2003), Heft 6, S. 1153-1158Online academicJournalZugriff:
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In: IEEE transactions on very large scale integration (VLSI) systems, Jg. 11 (2003), Heft 1, S. 64-70Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 54 (2007), Heft 4, S. 715-722Online academicJournalZugriff: